VISHAY IRFD123 Power MOSFET Owner’s Manual

September 4, 2024
VISHAY

IRFD123


www.vishay.com

Vishay Siliconix

Power MOSFET

HVMDIP

             N-Channel MOSFET

PRODUCT SUMMARY

VDS (V)|

100

RDS(on) (Ω)|

VGS = 10 V

|

0.27

Qg (max.) (nC)|

16

Qgs (nC)|

4.4

Qgd (nC)|

7.7

Configuration|

Single

FEATURES
  • Dynamic dV/dt rating
  • Repetitive avalanche rated
  • For automatic insertion
  • End stackable
  • 175 °C operating temperature
  • Fast switching
  • Ease of paralleling
  • Material categorization: for definitions of compliance please see www.vishay.com/doc?99912
DESCRIPTION

Third generation power MOSFETs from Vishay provide the designer with the best combination of fast switching, ruggedized device design, low on-resistance and cost-effectiveness.

The 4 pin DIP package is a low cost machine-insertable case style which can be stacked in multiple combinations on standard 0.1″ pin centers. The dual drain serves as a thermal link to the mounting surface for power dissipation levels up to 1 W.

ORDERING INFORMATION

Package| HVMDIP
Lead (Pb)-free| IRFD123PbF
ABSOLUTE MAXIMUM RATINGS (TA = 25 °C, unless otherwise noted)

PARAMETER|

SYMBOL

| LIMIT|

UNIT

Drain-source voltage|

VDS

| 100 |

V

Gate-source voltage|

VGS

|

± 20

Continuous drain current|

VGS at 10 V

| TA = 25 °C| ID| 1.3|

A

TA = 100 °C

|

0.94

Pulsed drain current a|

IDM

|

10

Linear derating factor| |

0.0083

|

W/°C

Single pulse avalanche energy b|

EAS

| 100|

mJ

Repetitive avalanche current a|

IAR

| 1.3|

A

Repetitive avalanche energy a|

EAR

| 0.13|

mJ

Maximum power dissipation|

TA = 25 °C

|

PD

| 1.3|

W

Peak diode recovery dV/dt c|

dV/dt

| 5.5|

V/ns

Operating junction and storage temperature range|

TJ, Tstg

| -55 to +175|

°C

Soldering recommendations (peak temperature)|

For 10 s

| |

300d

Notes
a. Repetitive rating; pulse width limited by maximum junction temperature (see fig. 11)
b. VDD= 25 V, starting TJ = 25 °C, L = 22 mH, Rg = 25 Ω, IAS = 2.6 A (see fig. 12)
c. ISD ≤ 9.2 A, dI/dt ≤ 110 A/μs, VDD ≤ VDS, TJ ≤ 175 °C
d. 1.6 mm from case

THERMAL RESISTANCE RATINGS

PARAMETER|

SYMBOL

| TYP.| MAX.|

UNIT

Maximum Junction-to-Ambient|

RthJA

| –| 120|

°C/W

SPECIFICATIONS (TJ = 25 °C, unless otherwise noted)

PARAMETER|

SYMBOL

| TEST CONDITIONS| MIN.| TYP.| MAX.|

UNIT

Static
Drain-Source Breakdown Voltage|

VDS

| VGS = 0 V, ID = 250 μA| 100| –| –|

V

VDS Temperature Coefficient|

VDS/TJ

| Reference to 25 °C, ID = 1 mA| –| 0.13| –|

V/°C

Gate-Source Threshold Voltage|

VGS(th)

| VDS = VGS, ID = 250 μA| 2.0| –| 4.0|

V

Gate-Source Leakage|

IGSS

| VGS = ± 20 V| –| –| ± 100|

nA

Zero Gate Voltage Drain Current|

IDSS

| VDS = 100 V, VGS = 0 V| –| –| 25|

μA

VDS = 80 V, VGS = 0 V, TJ = 150 °C

| –| –|

250

Drain-Source On-State Resistance|

RDS(on)

| VGS = 10 V| ID = 0.78 Ab| –| –| 0.27|

Ω

Forward Transconductance|

gfs

| VDS = 50 V, ID = 0.78 Ab| 0.80| –| –|

S

Dynamic
Input Capacitance|

Ciss

| VGS = 0 V,
VDS = 25 V,
f = 1.0 MHz, see fig. 5| –| 360| –|

pF

Output Capacitance|

Coss

| –| 150|

Reverse Transfer Capacitance|

Crss

| –| 34|

Total Gate Charge|

Qg

| VGS = 10 V| ID = 9.2 A, VDS = 80 V, see fig. 6 and 13b| –| –| 16|

nC

Gate-Source Charge|

Qgs

| –| –|

4.4

Gate-Drain Charge|

Qgd

| –| –|

7.7

Turn-On Delay Time|

td(on)

| VDD = 50 V, ID = 9.2 A,
Rg = 18 Ω, RD = 5.2 Ω, see fig. 10b| –| 6.8| –|

ns

Rise Time|

tr

| –| 27|

Turn-Off Delay Time|

td(off)

| –| 18|

Fall Time|

tf

| –| 17|

Internal Drain Inductance|

LDS

| Between lead, 6 mm (0.25″) from package and center of die contact| –| 4.0| –|

nH

Internal Source Inductance|

LS

| –| 6.0|

Drain-Source Body Diode Characteristics
Continuous Source-Drain Diode Current|

IS

| MOSFET symbol showing the integral reverse p – n junction diode| –| –| 1.3|

A

Pulsed Diode Forward Currenta|

ISM

| –| –|

10

Body Diode Voltage|

VSD

| TJ = 25 °C, IS = 1.3 A, VGS = 0 Vb| –| –| 2.5|

V

Body Diode Reverse Recovery Time|

trr

| TJ = 25 °C, IF = 9.2 A, dI/dt = 100 A/μsb| –| 130| 260|

ns

Body Diode Reverse Recovery Charge|

Qrr

| –| 0.65| 1.3|

μC

Forward Turn-On Time|

ton

|

Intrinsic turn-on time is negligible (turn-on is dominated by LS and LD)

Notes

a. Repetitive rating; pulse width limited by maximum junction temperature (see fig. 11)
b. Pulse width ≤ 300 μs; duty cycle ≤ 2 %

TYPICAL CHARACTERISTICS (25 °C, unless otherwise noted)

Fig. 1 – Typical Output Characteristics, T A = 25 °C

Fig. 2 – Typical Output Characteristics, T A = 175 °C

Fig. 3 – Typical Transfer Characteristics

Fig. 4 – Normalized On-Resistance vs. Temperature

Fig. 5 – Typical Capacitance vs. Drain-to-Source Voltage

Fig. 6 – Typical Gate Charge vs. Gate-to-Source Voltage

Fig. 7 – Typical Source-Drain Diode Forward Voltage

Fig. 8 – Maximum Safe Operating Area

Fig. 9 – Maximum Drain Current vs. Ambient Temperature

Fig. 10a – Switching Time Test Circuit

  1. Pulse width ≤ 1 µs
    Duty factor ≤ 0.1 %

Fig. 10b – Switching Time Waveforms

Fig. 11 – Maximum Effective Transient Thermal Impedance, Junction-to- Ambient

Fig. 12a – Unclamped Inductive Test Circuit

  1. Vary tp to obtain required IAS

Fig. 12b – Unclamped Inductive Waveforms

Fig. 12c – Maximum Avalanche Energy vs. Drain Current

Fig. 13a – Basic Gate Charge Waveform

  1. Charge

Fig. 13b – Gate Charge Test Circuit

  1. Current regulator
    Same type as D.U.T.

  2. Current sampling resistors

Peak Diode Recovery dV/dt Test Circuit

  1. Circuit layout considerations
    • Low stray inductance
    • Ground plane
    • Low leakage inductance current transformer

  2. • dV/dt controlled by Rg
    • Driver same type as D.U.T.
    • ISD controlled by duty factor “D”
    • D.U.T. – device under test

Note
a. VGS = 5 V for logic level devices

Fig. 14 – For N-Channel

  1. Driver gate drive
  2. D.U.T. ISD waveform
  3. Reverse recovery current
  4. D.U.T. VDS waveform
  5. Re-applied voltage
  6. Inductor current
  7. Body diode forward drop
  8. Diode recovery dV/dt
  9. Body diode forward current

Vishay Siliconix maintains worldwide manufacturing capability. Products may be manufactured at one of several qualified locations. Reliability data for Silicon Technology and Package Reliability represent a composite of all qualified locations. For related documents such as package/tape drawings, part marking, and reliability data, see www.vishay.com/ppg?90161.


S21-0885-Rev. D, 30-Aug-2021             Document Number: 90161

For technical questions, contact: hvm@vishay.com

THIS DOCUMENT IS SUBJECT TO CHANGE WITHOUT NOTICE. THE PRODUCTS DESCRIBED HEREIN AND THIS DOCUMENT ARE SUBJECT TO SPECIFIC DISCLAIMERS, SET FORTH AT www.vishay.com/doc?91000

Package Information

HVM DIP (High voltage)

| INCHES| MILLIMETERS
---|---|---
DIM.| MIN.| MAX.| MIN.| MAX.
A| 0.310| 0.330| 7.87| 8.38
E| 0.300| 0.425| 7.62| 10.79
L| 0.270| 0.290| 6.86| 7.36
ECN: X10-0386-Rev. B, 06-Sep-10
DWG: 5974

Note

  1. Package length does not include mold flash, protrusions or gate burrs. Package width does not include interlead flash or protrusions.

Document Number: 91361 www.vishay.com
Revision: 06-Sep-10

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Revision: 01-Jan-2024                                Document Number: 91000

For technical questions, contact:

THIS DOCUMENT IS SUBJECT TO CHANGE WITHOUT NOTICE. THE PRODUCTS DESCRIBED HEREIN AND THIS DOCUMENT ARE SUBJECT TO SPECIFIC DISCLAIMERS, SET FORTH AT www.vishay.com/doc?91000

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