VISHAY IRFBE30S Power MOSFET Owner’s Manual
- June 16, 2024
- VISHAY
Table of Contents
IRFBE30S, SiHFBE30S, IRFBE30L, SiHFBE30L
Vishay Siliconix
www.vishay.com
Power MOSFET
IRFBE30S Power MOSFET
FEATURES
- Dynamic dV/dt rating
- Repetitive avalanche rated
- Fast switching
- Ease of paralleling
- Simple drive requirements
- Material categorization: for definitions of compliance please see www.vishay.com/doc?99912
Note
- Thi s datasheet provi des i nformation about parts that are RoHS-compliant and / or parts that are non RoHS-compliant. For example, parts with lead (Pb) terminations are not RoHS-compliant. Please see the information / tables in this datasheet for details
DESCRIPTION
Third generation power MOSFETs from Vishay provide the designer with the best combination of fast switching, ruggedized device design, low on-resistance and cost-effectiveness.
PRODUCT SUMMARY
VDS (V)| 800
RDS(on) (W)| VGS = 10 V| 3.0
Qg max. (nC)| 78
Qgs (nC)| 9.6
Qgd (nC)| 45
Configuration| Single
ORDERING INFORMATION
Package| D2PAK (TO-263)| D2PAK (TO-263)| I2PAK (TO-262)
Lead (Pb)-free and Halogen-free| SiHFBE30S-GE3| SiHFBE30STRL-GE3 a| SiHFBE30L-
GE3
Lead (Pb)-free| IRFBE30SPbF| IRFBE30STRLPbF a| IRFBE30LPbF
Note
a. See device orientation
ABSOLUTE MAXIMUM RATINGS (TC = 25 °C, unless otherwise noted)
PARAMETER| SYMBOL| LIMIT| UNIT
Drain-Source Voltage| VDS| 800| V
Gate-Source Voltage| VGS| ± 20
Continuous Drain Current| VGS at 10 V| TC = 25 °C| ID| 4.1| A
TC = 100 °C| 2.6
Pulsed Drain Current a| IDM| 16
Linear Derating Factor| | 1.0| W/°C
Single Pulse Avalanche Energy b| EAS| 260| mJ
Avalanche Current a| IAR| 4.1| A
Repetitive Avalanche Energy a| EAR| 13| mJ
Maximum Power Dissipation| TC = 25 °C| PD| 125| W
Peak Diode Recovery dV/dt c| dV/dt| 2.0| V/ns
Operating Junction and Storage Temperature Range| TJ, Tstg| -55 to +150| °C
Soldering Recommendations (Peak temperature) d| for 10 s| | 300
Mounting Torque| 6-32 or M3 screw| | 10| lbf · in
1.1| N · m
Notes
a. Repetitive rating; pulse width limited by maximum junction temperature (see
fig. 11)
b. VDD = 50 V, starting TJ = 25 °C, L = 29 mH, Rg = 25 Ω, IAS = 4.1 A (see
fig. 12)
c. ISD ≤ 4.1 A, dI/dt ≤ 100 A/μs, VDD ≤ 600 V, TJ ≤ 150 °C
d. 1.6 mm from case
THERMAL RESISTANCE RATINGS
PARAMETER| SYMBOL| MIN.| TYP.| MAX.| UNIT
Maximum Junction-to-Ambient| RthJA| –| –| 62| °C/W
Case-to-Sink, Flat, Greased Surface| RthCS| –| 0.50| –
Maximum Junction-to-Case (Drain)| RthJC| –| –| 1.0
Note
a. When mounted on 1″ square PCB (FR-4 or G-10 material)
SPECIFICATIONS (TJ = 25 °C, unless otherwise noted)
PARAMETER| SYMBOL| TEST CONDITIONS| MIN.| TYP.|
MAX.| UNIT
Static
Drain-Source Breakdown Voltage| VDS| VGS = 0 V, ID = 250 μA| 800| –| –| V
VDS Temperature Coefficient| DVDS/TJ| Reference to 25 °C, ID = 1 mA| –| 0.90|
–| V/°C
Gate-Source Threshold Voltage| VGS(th)| VDS = VGS, ID = 250 μA| 2.0| –| 4.0| V
Gate-Source Leakage| IGSS| VGS = ± 20 V| –| –| ± 100| nA
Zero Gate Voltage Drain Current| IDSS| VDS = 800 V, VGS = 0 V| –| –| 100| μA
VDS = 640 V, VGS = 0 V, TJ = 125 °C| –| –| 500
Drain-Source On-State Resistance| RDS(on)| VGS = 10 V| ID = 2.5 A b| –| –|
3.0| W
Forward Transconductance| gfs| VDS = 100 V, ID = 2.5 A| 2.5| –| –| S
Dynamic
Input Capacitance| Ciss| VGS = 0 V,
VDS = 25 V,
f = 1.0 MHz, see fig. 5| –| 1300| –| pF
Output Capacitance| Coss| –| 310| –
Reverse Transfer Capacitance| Crss| –| 190| –
Total Gate Charge| Qg| VGS = 10 V| ID = 4.1 A, VDS = 400 V, see fig. 6 and 13
b| –| –| 78| nC
Gate-Source Charge| Qgs| –| –| 9.6
Gate-Drain Charge| Qgd| –| –| 45
Turn-On Delay Time| td(on)| VDD = 400 V, ID = 4.1 A,
Rg = 12 W, RD = 95 W, see fig. 10 b| –| 12| –| ns
Rise Time| tr| –| 33| –
Turn-Off Delay Time| td(off)| –| 82| –
Fall Time| tf| –| 30| –
Gate Input Resistance| Rg| f = 1 MHz, open drain| 0.6| –| 1.6| W
Internal Drain Inductance| LD| Between lead, 6 mm (0.25″) from package and
center of die contact | –| 4.5| –| nH
Internal Source Inductance| LS| –| 7.5| –
Drain-Source Body Diode Characteristics
Continuous Source-Drain Diode Current| IS| MOSFET symbol showing the integral
reverse p – n junction diode| –| –| 4.1| A
Pulsed Diode Forward Current a| ISM| –| –| 16
Body Diode Voltage| VSD| TJ = 25 °C, IS = 4.1 A, VGS = 0 V b| –| –| 1.8| V
Body Diode Reverse Recovery Time| trr| TJ = 25 °C, IF = 4.1 A, dI/dt = 100
A/μs b| –| 480| 720| ns
Body Diode Reverse Recovery Charge| Qrr| –| 1.8| 2.7| nC
Forward Turn-On Time| ton| Intrinsic turn-on time is negligible (turn-on is
dominated by LS and LD)
Notes
a. Repetitive rating; pulse width limited by maximum junction temperature (see
fig. 11)
b. Pulse width ≤ 300 μs; duty cycle ≤ 2 %
TYPICAL CHARACTERISTICS
(25 °C, unless otherwise noted) Vishay Siliconix maintains worldwide manufacturing capability. Products may be manufactured at one of several qualified locations. Reliability data for Silicon Technology and Package Reliability represent a composite of all qualified locations. For related documents such as package/tape drawings, part marking, and reliability data, see www.vishay.com/ppg?91119.
TO-263AB (HIGH VOLTAGE)
| MILLIMETERS| INCHES| | | MILLIMETERS| INCHES
---|---|---|---|---|---|---
DIM.| MIN.| MAX.| MIN.| MAX.| DIM.| MIN.|
MAX.| MIN.| MAX.
A| 4.06| 4.83| 0.160| 0.190| D1| 6.86| –| 0.270| –
A1| 0.00| 0.25| 0.000| 0.010| E| 9.65| 10.67| 0.380| 0.420
b| 0.51| 0.99| 0.020| 0.039| E1| 6.22| –| 0.245| –
b1| 0.51| 0.89| 0.020| 0.035| e| 2.54 BSC| 0.100 BSC
b2| 1.14| 1.78| 0.045| 0.070| H| 14.61| 15.88| 0.575| 0.625
b3| 1.14| 1.73| 0.045| 0.068| L| 1.78| 2.79| 0.070| 0.110
c| 0.38| 0.74| 0.015| 0.029| L1| –| 1.65| –| 0.066
c1| 0.38| 0.58| 0.015| 0.023| L2| –| 1.78| –| 0.070
c2| 1.14| 1.65| 0.045| 0.065| L3| 0.25 BSC| 0.010 BSC
D| 8.38| 9.65| 0.330| 0.380| L4| 4.78| 5.28| 0.188| 0.208
ECN: S-82110-Rev. A, 15-Sep-08
DWG: 5970
Notes
- Dimensioning and tolerancing per ASME Y14.5M-1994.
- Dimensions are shown in millimeters (inches).
- Dimension D and E do not include mold flash. Mold flash shall not exceed 0.127 mm (0.005″) per side. These dimensions are measured at the outmost extremes of the plastic body at datum A.
- Thermal PAD contour optional within dimension E, L1, D1 and E1.
- Dimension b1 and c1 apply to base metal only.
- Datum A and B to be determined at datum plane H.
- Outline conforms to JEDEC outline to TO-263AB.
Document Number: 91364
www.vishay.com
Revision: 15-Sep-08
I2PAK (TO-262) (HIGH VOLTAGE)
| MILLIMETERS| INCHES| | | MILLIMETERS| INCHES
---|---|---|---|---|---|---
DIM.| MIN.| MAX.| MIN.| MAX.| DIM.| MIN.|
MAX.| MIN.| MAX.
A| 4.06| 4.83| 0.160| 0.190| D| 8.38| 9.65| 0.330| 0.380
A1| 2.03| 3.02| 0.080| 0.119| D1| 6.86| –| 0.270| –
b| 0.51| 0.99| 0.020| 0.039| E| 9.65| 10.67| 0.380| 0.420
b1| 0.51| 0.89| 0.020| 0.035| E1| 6.22| –| 0.245| –
b2| 1.14| 1.78| 0.045| 0.070| e| 2.54 BSC| 0.100 BSC
b3| 1.14| 1.73| 0.045| 0.068| L| 13.46| 14.10| 0.530| 0.555
c| 0.38| 0.74| 0.015| 0.029| L1| –| 1.65| –| 0.065
c1| 0.38| 0.58| 0.015| 0.023| L2| 3.56| 3.71| 0.140| 0.146
c2| 1.14| 1.65| 0.045| 0.065|
ECN: S-82442-Rev. A, 27-Oct-08
DWG: 5977
Notes
- Dimensioning and tolerancing per ASME Y14.5M-1994.
- Dimension D and E do not include mold flash. Mold flash shall not exceed 0.127 mm per side. These dimensions are measured at the outmost extremes of the plastic body.
- Thermal pad contour optional within dimension E, L1, D1, and E1.
- Dimension b1 and c1 apply to base metal only.
Document Number: 91367
www.vishay.com
Revision: 27-Oct-08
RECOMMENDED MINIMUM PADS FOR D2PAK: 3-Lead Document Number: 73397
11-Apr-05
www.vishay.com
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Revision: 01-Jan-2023
Document Number: 91000
Downloaded from Arrow.com.
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References
- applications.no
- Vishay Intertechnology: Passives & Discrete Semiconductors
- IRFBE30S, SiHFBE30S, IRFBE30L, SiHFBE30L MOSFETs | Vishay
- IRFBE30S, SiHFBE30S, IRFBE30L, SiHFBE30L MOSFETs | Vishay
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