VISHAY IRF830B D Series Power MOSFET Owner’s Manual

June 13, 2024
VISHAY

VISHAY IRF830B D Series Power MOSFET

FEATURES

  • Optimal design
    • Low area specific on-resistance
    • Low input capacitance (Ciss)
    • Reduced capacitive switching losses
    • High body diode ruggedness
    • Avalanche energy rated (UIS)
  • Optimal efficiency and operation
    • Low cost
    • Simple gate drive circuitry
    • Low figure-of-merit (FOM): Ron x Qg
    • Fast switching
  • Material categorization: for definitions of compliance please see www.vishay.com/doc?99912

APPLICATIONS

  • Consumer electronics
    • Displays (LCD or plasma TV)
  • Server and telecom power supplies
    • SMPS
  • Industrial
    • Welding
    • Induction heating
    • Motor drives
  • Battery chargers

PRODUCT SUMMARY

VDS (V) at TJ max.| 550
RDS(on) max. (Ù) at 25 °C| VGS = 10 V| 1.5
Qg max. (nC)| 20
Qgs (nC)| 3
Qgd (nC)| 5
Configuration| Single
ORDERING INFORMATION

Package| TO-220AB
Lead (Pb)-free| IRF830BPbF
Lead (Pb)-free and halogen-free| IRF830BPbF-BE3
ABSOLUTE MAXIMUM RATINGS (TC = 25 °C, unless otherwise noted)

PARAMETER| SYMBOL| LIMIT| UNIT
Drain-source voltage| VDS| 500| V
Gate-source Voltage| VGS| ± 30
Gate-source voltage AC (f > 1 Hz)| 30
Continuous drain current (TJ = 150 °C)| VGS at 10 V| TC = 25 °C| ID| 5.3| A
TC = 100 °C| 3.4
Pulsed drain current a| IDM| 10
Linear derating factor| | 0.83| W/°C
Single pulse avalanche energy b| EAS| 28.8| mJ
Maximum power dissipation| PD| 104| W
Operating junction and storage temperature range| TJ, Tstg| -55 to +150| °C
Drain-source voltage slope| TJ = 125 °C| dV/dt| 24| V/ns
Reverse diode dV/dt d| 0.28
Soldering recommendations (peak temperature) c| For 10 s| | 300| °C

Notes

  • a. Repetitive rating; pulse width limited by maximum junction temperature
  • b. VDD = 50 V, starting TJ = 25 °C, L = 2.3 mH, Rg = 25 Ω, IAS = 5 A
  • c. 1.6 mm from case
  • d. ISD ≤ ID, starting TJ = 25 °C

THERMAL RESISTANCE RATINGS

THERMAL RESISTANCE RATINGS

PARAMETER| SYMBOL| TYP.| MAX.| UNIT
Maximum junction-to-ambient| RthJA| –| 62| °C/W
Maximum junction-to-case (drain)| RthJC| –| 1.2

SPECIFICATIONS

SPECIFICATIONS (TJ = 25 °C, unless otherwise noted)

PARAMETER| SYMBOL| TEST CONDITIONS| MIN.| TYP.| MAX.| UNIT
Static
Drain-source breakdown voltage| VDS| VGS = 0 V, ID = 250 μA| 500| –| –| V
VDS temperature coefficient| ÄVDS/TJ| Reference to 25 °C, ID = 250 μA| –| 0.58| –| V/°C
Gate-source threshold voltage (N)| VGS(th)| VDS = VGS, ID = 250 μA| 3| –| 5| V
Gate-source leakage| IGSS| VGS = ± 30 V| –| –| ± 100| nA
Zero gate boltage drain current| IDSS| VDS = 500 V, VGS = 0 V| –| –| 1| μA
VDS = 400 V, VGS = 0 V, TJ = 125 °C| –| –| 10
Drain-source on-state resistance| RDS(on)| VGS = 10 V| ID = 2.5 A| –| 1.2| 1.5| Ù
Forward transconductance a| gfs| VDS = 20 V, ID = 2.5 A| –| 1.8| –| S
Dynamic
Input capacitance| Ciss| VGS = 0 V, VDS = 100 V,

f = 1 MHz

| –| 325| –| pF
Output capacitance| Coss| –| 34| –
Reverse transfer capacitance| Crss| –| 6| –
Effective output capacitance, energy related b| Co(er)| VDS = 0 V to 400 V, VGS = 0 V| –| 31| –
Effective output capacitance, time related c| Co(tr)| –| 41| –
Total gate charge| Qg| VGS = 10 V| ID = 2.5 A, VDS = 400 V| –| 10| 20| nC
Gate-source charge| Qgs| –| 3| –
Gate-drain charge| Qgd| –| 5| –
Turn-on delay time| td(on)| VDD = 400 V, ID = 2.5 A Rg = 9.1 Ù, VGS = 10 V| –| 12| 24| ns
Rise time| tr| –| 11| 22
Turn-off delay time| td(off)| –| 14| 28
Fall time| tf| –| 11| 22
Gate input resistance| Rg| f = 1 MHz, open drain| 0.8| 1.7| 3.4| Ù
Drain-Source Body Diode Characteristics
Continuous source-drain diode current| IS| MOSFET symbol showing the integral reverse P – N junction diode
| –| –| 5| A
Pulsed diode forward current| ISM| –| –| 20
Diode forward voltage| VSD| TJ = 25 °C, IS = 4 A, VGS = 0 V| –| –| 1.2| V
Reverse recovery time| trr| TJ = 25 °C, IF = IS = 2.5 A, dI/dt = 100 A/μs, VR = 20 V| –| 320| –| ns
Reverse recovery charge| Qrr| –| 1.2| –| μC
Reverse recovery current| IRRM| –| 8| –| A

TYPICAL CHARACTERISTICS

(25 °C, unless otherwise noted)

Peak Diode Recovery dV/dt Test Circuit

Vishay Siliconix maintains worldwide manufacturing capability. Products may be manufactured at one of several qualified locations. Reliability data for Silicon Technology and Package Reliability represent a composite of all qualified locations. For related documents such as package/tape drawings, part marking, and reliability data, see www.vishay.com/ppg?91520.

Package Information

DIM. MILLIMETERS INCHES
MIN. MAX. MIN.
A 4.24 4.65
b 0.69 1.02
b(1) 1.14 1.78
c 0.36 0.61
D 14.33 15.85
E 9.96 10.52
e 2.41 2.67
e(1) 4.88 5.28
F 1.14 1.40
H(1) 6.10 6.71
J(1) 2.41 2.92
L 13.36 14.40
L(1) 3.33 4.04
Ø P 3.53 3.94
Q 2.54 3.00

ECN: E21-0621-Rev. D, 04-Nov-2021 DWG: 6031

Note

  • M* = 0.052 inches to 0.064 inches (dimension including protrusion), heatsink hole for HVM

Legal Disclaimer Notice

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CUSTOMERS SUPPORT

For technical questions, contact: hvm@vishay.com
THIS DOCUMENT IS SUBJECT TO CHANGE WITHOUT NOTICE. THE PRODUCTS DESCRIBED HEREIN AND THIS DOCUMENT ARE SUBJECT TO SPECIFIC DISCLAIMERS, SET FORTH AT www.vishay.com/doc?91000

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References

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