ONSEMI NVHL080N120SC1 Silicon Carbide SiC MOSFET User Guide

June 15, 2024
onsemi

ONSEMI NVHL080N120SC1 Silicon Carbide SiC MOSFET

Features

  • Typ. RDS(on) = 80 mΩ
  • Ultra Low Gate Charge (typ. QG(tot) = 56 nC)
  • Low Effective Output Capacitance (typ. Coss = 80 pF)
  • 100% UIL Tested
  • AEC−Q101 Qualified and PPAP Capable
  • This Device is Halide Free and RoHS Compliant with exemption 7a, Pb−Free 2LI (on second-level interconnection)

Typical Applications

  • Automotive On Board Charger
  • Automotive DC−DC converter for EV/HEV

MAXIMUM RATINGS

(TJ = 25°C unless otherwise noted)

Parameter Symbol Value Unit
Drain−to−Source Voltage VDSS 1200 V
Gate−to−Source Voltage VGS −15/+25 V
Recommended Opera- tion Values of Gate−to− Source Voltage TC < 175°C VGSop
−5/+20 V
Continuous Drain Current R8JC Steady State TC = 25°C ID
Power Dissipation R8JC PD 178 W
Continuous Drain Current R8JC Steady State TC = 100°C ID
Power Dissipation R8JC PD 89 W
Pulsed Drain Current (Note 2) TA = 25°C IDM 132
Single Pulse Surge Drain Current Capability TA = 25°C, tp = 10 µs, RG = 4.7
Q IDSC 132 A
Operating Junction and Storage Temperature Range TJ, Tstg − 55 to

+175

| °C
Source Current (Body Diode)| IS| 18| A
Single Pulse Drain−to−Source Avalanche Energy (IL(pk) = 18.5 A, L = 1 mH) (Note 3)| EAS| 171| mJ


Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality should not be assumed, damage may occur and reliability may be affected.

THERMAL RESISTANCE MAXIMUM RATINGS

Parameter Symbol Value Unit
Junction−to−Case (Note 1) R8JC 0.84 °C/W
Junction−to−Ambient (Note 1) R8JA 40 °C/W
  1. The entire application environment impacts the thermal resistance values shown, they are not constants and are only valid for the particular conditions noted.
  2. Repetitive rating, limited by max junction temperature.
  3. EAS of 171 mJ is based on starting TJ = 25°C; L = 1 mH, IAS = 18.5 A, VDD = 120 V, VGS = 18 V.
    V (BR)DSS| R DS(on) MAX| I D MAX
    ---|---|---
    1200 V| 110 mQ @ 20 V| 31 A

N−CHANNEL MOSFET

MARKING DIAGRAM

ORDERING INFORMATION

Device Package Shipping
NVHL080N120SC1 TO247−3L 30 Units / Tube

CHARACTERISTICS

ELECTRICAL CHARACTERISTICS

Parameter| Symbol| Test Conditions| Min| Typ| Max| Unit
---|---|---|---|---|---|---

OFF CHARACTERISTICS

Drain−to−Source Breakdown Voltage| V(BR)DSS| VGS =0 V, ID = 1 mA| 1200| −| −| V
---|---|---|---|---|---|---
Drain−to−Source Breakdown Voltage Temperature Coefficient| V(BR)DSS/TJ| ID = 1 mA, referenced to 25 C| −| 700| −| mV/ C
Zero Gate Voltage Drain Current| IDSS| VGS =0 V, VDS = 1200 V, TJ = 25 C| −| −| 100| µA
VGS =0 V, VDS = 1200 V, TJ = 175 C| −| −| 1| mA
Gate−to−Source Leakage Current| IGSS| VGS = +25/−15 V, VDS =0V| −| −| ±1| µA

ON CHARACTERISTICS

Gate Threshold Voltage VGS(th) VGS = VDS, ID = 5 mA 1.8 2.7 4.3 V
Recommended Gate Voltage VGOP −5 +20 V
Drain−to−Source On Resistance RDS(on) VGS = 20 V, ID = 20 A, TJ = 25 C
80 110 mQ
VGS = 20 V, ID = 20 A, TJ = 150 C 114
Forward Transconductance gFS VDS = 20 V, ID = 20A 13 S

CHARGES, CAPACITANCES & GATE RESISTANCE

Input Capacitance CISS VGS = 0 V, f = 1 MHz, VDS = 800 V 1112 pF
Output Capacitance COSS 80
Reverse Transfer Capacitance CRSS 6.5
Total Gate Charge QG(tot) VGS = −5/20 V, VDS = 600 V, ID = 20A 56 nC
Gate−to−Source Charge QGS 11
Gate−to−Drain Charge QGD 12
Gate Resistance RG f = 1 MHz 1.7 Q

SWITCHING CHARACTERISTICS

Turn-On Delay Time| td(on)| VGS = −5/20 V, VDS = 800 V, ID = 20 A, RG = 4.7 Q,

Inductive Load

| −| 13| −| ns
---|---|---|---|---|---|---
Rise Time| tr| −| 20| −|
Turn−Off Delay Time| td(off)| −| 22| −|
Fall Time| tf| −| 10| −|
Turn-On Switching Loss| EON| −| 258| −| µJ
Turn-Off Switching Loss| EOFF| −| 52| −|
Total Switching Loss| ETOT| −| 311| −|

DRAIN−SOURCE DIODE CHARACTERISTICS

Continuous Drain−to−Source Diode Forward Current| ISD| VGS = −5 V, TJ = 25 C| −| −| 18| A
---|---|---|---|---|---|---
Pulsed Drain−to−Source Diode Forward Current (Note 2)| ISDM| VGS = −5 V, TJ = 25 C| −| −| 132| A
Forward Diode Voltage| VSD| VGS = −5 V, ISD = 10 A, TJ = 25 C| −| 4| −| V
Reverse Recovery Time| tRR| VGS = −5/20 V, ISD = 20 A,

dIS/dt = 1000 A/µs

| −| 16| −| ns
Reverse Recovery Charge| QRR| −| 62| −| nC
Reverse Recovery Energy| EREC| −| 5| −| µJ
Peak Reverse Recovery Current| IRRM| −| 8| −| A

Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product performance may not be indicated by the Electrical Characteristics if operated under different conditions.

TYPICAL CHARACTERISTICS (TJ = 25°C unless otherwise noted)ONSEMI-
NVHL080N120SC1-Silicon-Carbide-SiC-MOSFET- \(4\) ONSEMI-NVHL080N120SC1-Silicon-Carbide-SiC-MOSFET-
\(5\) ONSEMI-NVHL080N120SC1-Silicon-Carbide-
SiC-MOSFET- \(6\) ONSEMI-NVHL080N120SC1
-Silicon-Carbide-SiC-MOSFET- \(7\) ONSEMI-NVHL080N120SC1-Silicon-Carbide-SiC-MOSFET-
\(8\)

PACKAGE DIMENSIONS

ONSEMI-NVHL080N120SC1-Silicon-Carbide-SiC-MOSFET-
\(9\) ONSEMI-NVHL080N120SC1-Silicon-Carbide-
SiC-MOSFET- \(10\)

DOCUMENT NUMBER: 98AON93302G
DESCRIPTION: TO−247−3LD
Electronic versions are uncontrolled except when accessed directly from the Document Repository. Printed versions are uncontrolled except when stamped “CONTROLLED COPY” in red.

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