RENISHAW SFP2 Surface Finish Probe User Manual

: June 4, 2024
: RENISHAW

Table of Contents

Enhanced access and inspection capability for integrated surface finish
Key benefits
Specification
Documents / Resources

RENISHAW SFP2 Surface Finish Probe

Enhanced access and inspection capability for integrated surface finish

measurement

The SFP2 probe increases the surface finish measurement ability of the REVO® system, which offers multisensor capability providing touchtrigger, high speed tactile scanning and noncontact vision measurement on a single CMM.
Powered by 5axis measurement technology, the SFP2’s automated surface finish inspection offers significant time savings, reduced part handling and greater return on CMM investment.
The SFP2 system consists of a probe and a range of modules and is automatically interchangeable with all other probe options available for REVO, providing the flexibility to easily select the optimum tool to inspect a wide range of features, all on one CMM platform. Data from multiple sensors is automatically referenced to a common datum.
The surface finish system is managed by the same I++ DME compliant interface as the REVO system, and full user functionality is provided by Renishaw’s MODUS metrology software.

Key benefits

Unrivalled feature access

SFP2 benefits from REVO’s infinite positioning and 5axis movement, and features an integral motorised Caxis. The SFM variants offer a range of tip arrangements which, combined with the knuckle joint between module and holder, provide access to the features most difficult to reach.

Operator independent data collection

CMM programs can now include automated and operatorindependent surface finish measurement. All results, including surface finish data, are recorded and stored in a single location for easy retrieval.

Greater return on investment in CMMs

Integrated surface finish and dimensional inspection can remove the need for dedicated surface measurement equipment, reducing factory footprint, part handling and associated costs.

Specification

SFM-A1 and SFM-A2 modules

Surface finish range| 0.05 ‑ 6.3 μm Ra
Surface finish accuracy

(of nominal Ra)

| ± (5% +15 nm)
Surface forces (nominal)| Skid:| 0.2 N
Stylus tip:| 0.003 N
Encoder resolution| 1 nm
Nominal stylus tip protrusion beyond skid| 0.5 mm
Measurement speed| Up to 1 mm/s
SFM range of adjustment| ± 90° at the knuckle joint
SFP2 probe

C-axis positioning accuracy| ± 0.25°
C-axis rotation speed| Up to 90°/sec
Rotational capability| A‑axis (from REVO‑2):| +120° / ‑110°
B‑axis (from REVO‑2):| Infinite positioning
C‑axis:| ± 180˚
Mounting (probe and holder)| Magnetised coupling
System fefatures

Probe head| REVO‑2 only
Change rack| MRS2 recommended for full capability
Software compatibility| UCCsuite 5.2 onwards

MODUS 1.8 onwards

Calibration and verification artifacts

www.renishaw.com/SFP2

+44 (0) 1453 524524 |uk@renishaw.com

© 2017–2022 Renishaw plc. All rights reserved. RENISHAW® and the probe symbol are registered trade marks of Renishaw plc.
Renishaw product names, designations and the mark ‘apply innovation’ are trade marks of Renishaw plc or its subsidiaries.
Other brand, product or company names are trade marks of their respective owners.
Renishaw plc. Registered in England and Wales. Company no: 1106260. Registered office: New Mills, Wotton-under-Edge, Glos, GL12 8JR, UK.
WHILE CONSIDERABLE EFFORT WAS MADE TO VERIFY THE ACCURACY OF THIS DOCUMENT AT PUBLICATION, ALL WARRANTIES, CONDITIONS, REPRESENTATIONS AND LIABILITY, HOWSOEVER ARISING, ARE EXCLUDED TO THE EXTENT PERMITTED BY LAW.