RENISHAW SFM-B3 Surface Finish Probe Module Instructions
- June 4, 2024
- RENISHAW
Table of Contents
SFM-B3 Surface Finish Probe Module
Instructions
SFM-B3 Surface finish probe module
Enhanced access and inspection capability for integrated surface finish
measurement
The SFP2 consists of a probe and a range of SFM modules that have been
designed to suit the demands of specific parts and features encountered in a
precision manufacturing environment. The probe and modules can be
automatically interchanged with all other REVO® probe options, providing the
flexibility to easily select the optimum tool to inspect a wide range of
features. Each SFM module is its own mini-measuring device, incorporating
Renishaw’s proprietary scale and read head system, to transduce the motion of
the stylus tip.
Features
The B-series of modules feature a small skid which allows the stylus to be placed close to the edge of surfaces of interest. The modules can provide access into awkward to reach features.
Typical applications
Undercuts and grooves.
Specification
| Diamond tip radius (pm) | 5 |
|---|---|
| Surface finish measurement range (pm) | 6.3 to 0.10 Ra |
| Typical surface finish accuracy (of nominal Ra) * | ±(10% + 20 nm) |
| Skid / stylus arrangement | Side-by-side |
| Skid material | DLC coated stainless steel |
| Nominal stylus tip protrusion beyond skid (mm) | 0.5 |
| Skid length / radius (mm) | 2 / 12.5 |
| Skid width / radius (mm) | 2 / 12.5 |
| Skid contact force (N) | 0.2 |
| Stylus contact force (N) | 0.006 |
| SFM / SFH knuckle adjustment range | ±90° |
| Weight (g) | 13 |
| Resolution (nm) | 1 |
| Measurement speed (mm/s) | Up to 1 |
| Stylus holder compatibility | SFH-1, SFH-2 |
| Lateral scanning capability | No |
- Accuracy values are dependent upon a number of system variables. These include the machine size and configuration, scan orientation, condition of stylus tip, part fixturing system, and environmental noise.
All dimensions in mm.
renishaw
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Part no.: H-1000-2299-02-A
Issued: 10.2021