NXP UM12023 Battery Cell Controller IC User Manual
- June 17, 2024
- NXP
Table of Contents
UM12023
RD33774PDSTEVB featuring the MC33774ATP battery cell controller IC
Rev. 1 — 7 February 2024
User manual
Document information
Information | Content |
---|---|
Keywords | RD33774PDSTEVB, MC33774ATP, battery-cell controller, battery |
emulator, battery management systems
Abstract| This user manual describes how to use the RD33774PDSTEVB evaluation
board.
Introduction
This user manual describes the RD33774PDSTEVB. The RD33774PDSTEVB features one
MC33774ATP battery-cell controller integrated circuit (IC).
The NXP analog product development board provides a platform for evaluating
NXP products.
These development boards support a range of analog, mixed-signal, and power
solutions. These boards incorporate monolithic ICs and system-in-package
devices that use high-volume technology. NXP products offer long battery life,
a small form factor, reduced component counts, lower cost, and improved
performance in powering state-of-the-art systems.
Important notice
IMPORTANT NOTICE
For engineering development or evaluation purposes only
NXP provides the product under the following conditions:
This evaluation kit is for use of ENGINEERING DEVELOPMENT OR EVALUATION
PURPOSES ONLY. It is provided as a sample IC pre-soldered to a printed-circuit
board to make it easier to access inputs, outputs and supply terminals. This
evaluation board may be used with any development system or other source of
I/O signals by connecting it to the host MCU computer board via off-theshelf
cables. This evaluation board is not a Reference Design and is not intended to
represent a final design recommendation for any particular application. Final
device in an application heavily depends on proper printed-circuit board
layout and heat sinking design as well as attention to supply filtering,
transient suppression, and I/O signal quality.
The product provided may not be complete in terms of required design,
marketing, and or manufacturing related protective considerations, including
product safety measures typically found in the end device incorporating the
product. Due to the open construction of the product, it is the responsibility
of the user to take all appropriate precautions for electric discharge. In
order to minimize risks associated with the customers’ applications, adequate
design and operating safeguards must be provided by the customer to minimize
inherent or procedural hazards. For any safety concerns, contact NXP sales and
technical support services.
Getting ready
2.1 Finding kit resources and information on the NXP website
NXP Semiconductors provides online resources for this evaluation board and its
supported device(s) on http://www.nxp.com. The information page for the
RD33774PDSTEVB evaluation board is at http://www.nxp.com/RD33774PDSTEVB. The
information page provides overview information, documentation, software and
tools, parametrics, ordering information and a Getting Started tab. The
Getting Started tab provides quick-reference information applicable to using
the RD33774PDSTEVB evaluation board, including the downloadable assets
referenced in this document.
2.2 Kit contents
- Assembled and tested evaluation board/module in antistatic bag
- One 32-pin battery cell cable
- One two-pin TPL cable
2.3 Required equipment
To use this kit, the following equipment is required:
- A 4-cell to 18-cell battery pack or a battery pack emulator, such as BATT-18EMULATOR
- FRDMDUALK3664EVB (EVB for MC33664A) with the S32K3X4EVB-T172 (S32K3X4 EVB) to interface with a PC; for the evaluation setup, a graphical user interface, EvalGUI 7, is available in Secure Files on http://www.nxp.com
Getting to know the hardware
3.1 Kit overview
The RD33774PDSTEVB serves as a hardware evaluation tool in support of NXP’s
MC33774ATP device. The MC33774ATP is a battery-cell controller that monitors
up to 18 lithium-ion battery cells. RD33774PDSTEVB is designed for use in
automotive and industrial applications. The device performs analog-to-digital
conversion on the differential cell voltages and currents. It is also capable
of battery-charge coulomb counting and battery temperature measurements. The
RD33774PDSTEVB can be used for rapid prototyping of MC33774ATP-based
applications that involve voltage and temperature sensing.
The information is digitally transmitted to a microcontroller for processing.
The evaluation board can be used with a physical layer transformer transceiver
driver (MC33664) to convert MCU SPI data bits to pulse bit information for the
MC33774ATP and vice versa.
3.2 Board features
The main features of the RD33774PDSTEVB are:
- Daisy-chain device connection
- LED indicator for operation mode
- Cell-balancing resistors (22 Ω per individual cell)
- Cell-sense input with RC filter
- GPIO: Digital I/O, wake-up inputs, convert trigger inputs, ratiometric analog inputs, analog inputs with absolute measurements
- EEPROM (connected to the IC with I² C interface) to store user-defined calibration parameters
3.3 Block diagram 3.4 MC33774ATP features and benefits
The MC33774ATP is a battery-cell controller IC designed to monitor battery
characteristics, such as voltage, current, and temperature. The MC33774ATP
contains the circuit blocks necessary to perform battery-cell voltage
measurement, cell temperature measurement, and integrated cell balancing. The
MC33774ATP supports the following functions:
-
AEC-Q100 grade 1 qualified: -40 °C to 125 °C ambient temperature range
-
ISO 26262 ASIL D support for cell-voltage and cell-temperature measurements from the host microcontroller unit (MCU) to the cell
-
Cell-voltage measurement
– 4 cells to 18 cells per device
– Supports busbar voltage measurement with -3 V to 5 V input voltage
– 16-bit resolution and ±0.8 mV typical measurement accuracy with ultra-low long-term drift
– 136 µs synchronicity of cell-voltage measurements
– Integrated configurable digital filter -
External temperature and auxiliary voltage measurements
– One analog input for absolute measurement, 5 V input range
– Eight analog inputs configurable as absolute or ratiometric, 5 V input range
– 16-bit resolution and ±5 mV typical measurement accuracy
– Integrated configurable digital filter
Internal measurement
– Two redundant internal temperature sensors
– Supply voltages
– External transistor current -
Cell-voltage balancing
– 18 internal balancing field effect transistors (FET), up to 360 mA peak with 0.5 Ω R per channel (typ)
– Support for simultaneous passive balancing of all channels with automatic odd/even sequence
– Global balancing timeout timer
– Timer-controlled balancing with individual timers with 10 s resolution and up to 45 hours duration
– Voltage-controlled balancing with global and individual undervoltage thresholds
– Temperature-controlled balancing; if balancing resistors are in overtemperature, balancing is interrupted
– Configurable pulse width modulation (PWM) duty cycle balancing
– Automatic pausing of balancing during measurement with configurable filter settling time
– Configurable delay of the start of balancing after transition to sleep
– Automatic discharge of the battery pack (emergency discharge)
– Constant current cell balancing to compensate the balancing current variation because of cell voltage variation -
I²C-bus master interface to control external devices, for example, EEPROMs and security ICs
-
Configurable alarm output
-
Cyclic wake-up to monitor the pack and the balancing function during sleep
-
Capability to wake up the host MCU via daisy chain in case of a fault event
-
Host interface supporting SPI or isolated daisy-chain communication (TPL3)
– 2 Mbit/s data rate for TPL interface
– 4 Mbit/s data rate for SPI interface -
TPL3 daisy-chain communication supports
– Two-wire daisy chain with capacitive or inductive isolation
– Protocol supporting up to six daisy chains and 62 nodes per chain -
Unique device ID with dynamic adressing
-
Operation modes
– Active mode (12 mA typ)
– Sleep mode (60 µA typ)
– Deep Sleep mode (15 µA typ)
3.5 Board description
The RD33774PDSTEVB allows the user to exercise all the functions of the
MC33774ATP battery controller cell. Table 1. Board
description
Number | Name | Description |
---|---|---|
1 | Cell balancing resistors | 3 x 33 ohms in parallel on each Cx pin: 200 mA of |
cell-balancing current @4.5 V
2| Cell terminal low-pass filters| LPF: 10 kΩ resistor/0.047 µF capacitor to
GND
3| GPIO low-pass filters| For NTC connections and temperature measurement
4| MC33774ATP (U2)| 18-cell battery-cell controller IC
5| NV24C64DWVLT3G (U1)| High-speed 64 Kb I2C EEPROM
6| NSS1C201MZ4T1G (Q1)| NPN supply bipolar transistor
7, 8| TC102M or capacitive coupling| Default BOM: High-voltage single-channel
transformers
9| JAE-MX34032NF2 (J1)| 32-pin connector for cell connections and NTC
connections
10| MOLEX-43650-0213 (J2)| TPL connector to higher node
11| MOLEX-43650-0213 (J3)| TPL connector to lower node
12| LED| VAUX status
3.5.1 Connectors
3.5.1.1 Battery pack connector J1
The cells and NTC connections are available on J1. See Figure 3
Cell0 is connected between C0M(cell0M) and C1M(cell0P); Cell1 is connected
between C1M(cell1M) and C2M(cell1P), and so on … Cell17 is connected between
C17M (cell17M) and C17P (cell17P)
C17P-PWR and GND (pin21) are used to supply the RD33774PDSTEVB and are
separated from C17P and C0M respectively to avoid any voltage drop because of
the EVB current consumption.
Optional external 10 kΩ NTCs can be connected between each NTCx terminal and
one GND terminal.Board connector reference:
MX34032NF2 (32 pins/right-angle version) – Manufacturer : JAE
Corresponding mate connector reference: MX34032SF1
Crimp reference for the mate connector: M34S75C4F1 (applicable cable 0.22 mm²
to 0.35 mm²)
3.5.1.2 TPL connectors
Isolated connections to upper and lower nodes can be done through J2 and J3,
respectively. As the TPL communications are bidirectional, the connections can
be reversed.Board connector reference:
Micro-fit 3.0 43650-0213 (two pins/right angle version) – Manufacturer: Molex
Corresponding mate connector reference: 0436450200
Crimp reference for the mate connector: 0436450201
Twisted cable: 64920108 – Manufacturer: Kromberg & Schubert
3.5.1.2.1 TPL configuration
The RD33774PDSTEVB can be configured for capacitive TPL communications instead
of the default BOM with inductive TPL communication (transformer). See Table 2
for configuration instructions.
Table 2. Configuration
Name | Value | Inductive isolation | Capacitive isolation |
---|---|---|---|
T2 | 1:1 transformer | Place | Remove |
C83_1, C84_1, C83_3, C84_3 | 22 nF | Remove | Place |
R102_1, R103_1, R102_3, R103_3, L1, L2, L3, L4 | 0 ohms | Remove | Place |
3.6 Test points
Test points are provided to access various signals on the board. Main test
points are detailed in Table 3.
Table 3. Test points
Label | Signal name | Description |
---|---|---|
TP1 | C17P-VPWR | Battery stack HV+ |
TP2 | VBAT | MC33774ATP VBAT supply |
TP3 – TP6 | RXTX… | MC33774ATP TPL lines |
TP51, 44, 38, 31, 23, 18, 10, 8 | NTCx | NTC1 to 8 |
TP53, 45, 39, 32, 24, 19, 11, 7 | GPIO | MC33774 GPIO0 to GPIO7 pins |
TP61 | ALARM_OUT | MC33774 AINA_ALARM_OUT pin |
TP57 | VDDA | MC33774 VDDA pin |
TP58 | VAUX | MC33774 VAUX pin |
TP66 | DRIVE_VDDC | MC33774 DRIVE_VDDC pin |
TP67 | IMON_VDDC | MC33774 IMON_VDCC pin |
TP68 | VDDC, VDDIO | MC33774 VDDC pin |
TP86, 87, 88, 89 | GND | Battery stack HV- |
3.7 GPIO configurations
The MC33774ATP has nine GPIO pins (GPIO0 to GPIO7 and AINA) available for
temperature measurements (excepted AINA), absolute analog measurements, and
other functions.
The RD33774PDSTEVB makes available the GPIO measurements and functions as
described in Table 4.
Table 4. GPIO connections
Connection | Board label | Description – BCC connection |
---|---|---|
J1-20 | NTC1 | GPIO0/AIN0 pin through low-pass filter for NTC acquisition – to |
be connected to an external 10 kΩ NTC (that is, NCP15XV103J03RC)
J1-19| NTC2| GPIO1/AIN1 pin through low-pass filter for NTC acquisition – to
be connected to an external 10 kΩ NTC (that is, NCP15XV103J03RC)
J1-18| NTC7| GPIO6/AIN6 pin through low-pass filter for NTC acquisition – to
be connected to an external 10 kΩ NTC (that is, NCP15XV103J03RC)
J1-17| NTC8| GPIO7/AIN7 pin through low-pass filter for NTC acquisition – to
be connected to an external 10 kΩ NTC (that is, NCP15XV103J03RC)
Onboard NTC NCP15XV103J03RC – TP38| NTC3| GPIO2/AIN2 pin through low-pass
filter for NTC acquisition
Not connected – TP31| NTC4| GPIO3/AIN3 pin through low-pass filter for NTC
acquisition
Onboard I2Ceeprom – SCL| GPIO4| GPIO4 pin
Onboard I2Ceeprom – SDA| GPIO5| GPIO5 pin
Not connected – TP61| AINA| AINA pin
Configuring the hardware
The RD33774PDSTEVB kit is designed for use with the FRDMDUALK3664EVB in high-
voltage isolated applications that provide an SPI-to-high-speed isolated
communication interface. The FRDMDUALK3664EVB includes two MC33664 isolated-
network high-speed transceivers allowing loopback connection. MCU SPI data
bits are directly converted to pulse bit information. 4.1 Battery emulator connection
The RD33774PDSTEVB supports the use of a battery-cell emulator, such as the
BATT-18EMULATOR board.
The BATT-18EMULATOR is an 18-cell battery-emulator board that provides a way
to change the voltage across any of the 18 cells and four voltage outputs to
emulate four external NTCs. The emulator board can be connected to the
RD33774PDSTEVB J1 connector using the provided cell connection cable.
Up to three RD33774PDSTEVB can be connected to one BATT-18EMULATOR. See Figure
6 4.2 TPL
communication connection
In a high-voltage isolated application with a daisy-chain configuration, up to
62 RD33774PDSTEVB boards may be connected.
The TPL connections use the connectors J2 and J3.
Revision history
Revision history
Document ID | Date | Description |
---|---|---|
UM12023 v.1 | 07 February 2024 | Initial version |
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Date of release: 7 February 2024
Document identifier: UM12023
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