HIOKI IN-CIRCUIT TESTER FA1220-22 High Speed
And
High Performance
Measurement
Engine
 Owner’s Manual

June 16, 2024
HIOKI

HIOKI-logo

HIOKI IN-CIRCUIT TESTER FA1220-22 High Speed
And
High Performance

Measurement
Engine

HIOKI-IN-CIRCUIT-TESTER-FA1220-22-High-Speed-
And
-High-Performance
-Measurement
-Engine-product-image.PNG

Product Information

Specifications

  • Product Name: IN-CIRCUIT TESTER FA1220-22
  • Origin: Japan
  • Manufactured in: India
  • Measurement Engine Technology: Highspeed & High performance
  • Component Testing Capability: Extensive
  • Test Pins: 512 scanner pins standard; expandable to 1,024 pins
  • Resistance Measurement Capability: Ultra-low resistance

Features

  • Extensive component testing capability
  • Polarity check to detect electrolytic capacitors mounted backwards
  • Milliohm-range resistance testing using 4-terminal measurement
  • Active-state testing of semiconductors
  • Measurement of drain-source voltage and current for MOS-FET and J-FET gates
  • Pass/fail judgment based on off-current and on-resistance
  • Judgment result stamps with up to 16 stamps
  • E4271 STAMP DRIVE UNIT with 4-chamber manifold & stamp drive solenoid valve

Dimensions and Weight

  • Dimensions: [Insert Dimensions]
  • Weight: [Insert Weight]
  • Paint Color: PANTONE Cool Gray 1C

Accessories
[Insert List of Accessories]

Product Usage Instructions

Component Testing
The FA1220-22 is equipped with extensive component testing capability. To perform component testing, follow these steps:

  1. [Insert Step 1]
  2. [Insert Step 2]
  3. [Insert Step 3]

Polarity Check
The FA1220-22 can detect electrolytic capacitors that have been mounted backwards. To perform a polarity check, follow these steps:

  1. [Insert Step 1]
  2. [Insert Step 2]
  3. [Insert Step 3]

Resistance Testing
The FA1220-22 can perform milliohm-range resistance testing using 4-terminal measurement. To perform resistance testing, follow these steps:

  1. [Insert Step 1]
  2. [Insert Step 2]
  3. [Insert Step 3]

Active-State Testing of Semiconductors
The FA1220-22 can measure drain-source voltage and current for MOS-FET and J-FET gates. To perform active-state testing of semiconductors, follow these steps:

  1. [Insert Step 1]
  2. [Insert Step 2]
  3. [Insert Step 3]

Judgment Result Stamps
The FA1220-22 can generate pass/fail judgments and stamp the result on the test fixtures. To use judgment result stamps, follow these steps:

  1. [Insert Step 1]
  2. [Insert Step 2]
  3. [Insert Step 3]

E4271 STAMP DRIVE UNIT
The FA1220-22 can accommodate up to four E4271 units, each of which can accommodate up to three E4272 units. To use the E4271 STAMP DRIVE UNIT, follow these steps:

  1. [Insert Step 1]
  2. [Insert Step 2]
  3. [Insert Step 3]

FAQ

  • Q: How many test pins does the FA1220-22 have?
    A: The FA1220-22 comes with 512 scanner pins as standard, but it can be expanded to 1,024 pins.

  • Q: What is the maximum number of active pins for each test type?
    A: The maximum number of active pins depends on the total number of scanner board pins installed in the product.

  • Q: What is the rated supply voltage for the FA1220-22?
    A: The rated supply voltage is 220 to 240VAC, 50Hz.

  • Q: What is the maximum power consumption of the FA1220-22?
    A: The maximum power consumption is 1kVA.

  • Q: What is the pressure range for the compressed air?
    A: The primary side (supply) pressure range is 0.5MPa to 1.0MPa (dry air).

  • Q: What is the warranty period for the product?
    A: The product comes with a 3-year warranty.

  • Q: What is the operating system of the FA1220-22?
    A: The FA1220-22 uses Windows 10 Pro 64-bit, English.

IN-CIRCUIT TESTER FA1220-22
NEW ARRIVAL
MAKE IN INDIA
High-speed & High-performance Measurement engine Technology From Japan

For Indian Market Hioki’s IN-CIRCUIT TESTER Manufacturing in India

Key Features

  • Extensive component testing capability
  • Component testing with less test pins
  • 512 scanner pins standard; expandable to 1,024 pins
  • Ultra-low resistance measurement capability

JAPANESE TECHNOLOGY

  • Pricing, delivery and service, suitable for the Indian market
  • For More Details Contact 98710 99074 /  info@hioki.co.in

Features

Standard model

  • Extensive component testing capability
    The FA1220-22 ships standard with extensive testing capability, including a polarity check to detect electrolytic capacitors that have been mounted backwards and milliohm-range resistance testing using 4-terminal measurement .HIOKI-IN-CIRCUIT-TESTER-FA1220-22-High-Speed-
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  • Component testing less measurement pins
    When it’s difficult to set probe contact with a component’s pads, the FA1220-22 can generate judgments based on the composite impedance of multiple components. Macro testing allows the system to acquire measured values from a known-good reference board for use as reference values.HIOKI-IN-CIRCUIT-
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\(2\)

    • Use with boards that lack sufficient space for probing.
    • Judgments are based on impedance measurements that group together multiple components.
  • Active-state testing of semiconductors
    The FA1220-22 can measure drain-source voltage and current while applying on/off voltages to MOS-FET and J-FET gates. In this way, it can generate pass/fail judgments for FET operation under active conditions.HIOKI-IN-
CIRCUIT-TESTER-FA1220-22-High-Speed-
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-High-Performance
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    • Pass/fail judgment based on off-current and on-resistance
    • Pass/fail judgment based on off current and measured current (IDSS)
  • Output of analytical data
    Standard functionality allows measurement data to be output to a datafile. Additionally, an optional printer unit can be used to print test results on the production floor.HIOKI-IN-CIRCUIT-TESTER-FA1220-22-High-Speed-
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  • Example electronic data file outputHIOKI-IN-CIRCUIT-TESTER-FA1220-22-High-Speed-
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  • Automatic loading of board-specific test programs
    The FA1220-22 can load test program automatically by scanning 20 codes on boards. The proper program can be automatically loaded from a multi-model program library containing various production variants and used to configure the system automatically.HIOKI-IN-CIRCUIT-TESTER-FA1220-22-High-Speed-
And
-High-Performance
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-Engine-01 \(3\) Requires separate 2D code reader.

  • STAMP DRIVE UNIT E4271, ADDITIONAL STAMP DRIVE UNIT E4272
    Judgment result stamps
    The system can operate up to 16 stamps, which are installed on the test fixtures. Up to four E4271 units can be added to the FA1220-22. Each E4271 unit can accommodate up to three E4272 units.HIOKI-IN-CIRCUIT-TESTER-
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\(4\)

Specifications

Testable board sizeHIOKI-IN-CIRCUIT-TESTER-FA1220-22-High-Speed-
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Test program structure

Number of test points| Standard         512 pins (scanner boards optional)

Max.                1024 pins (expandable in blocks of 128 pins)*

---|---
Group data| 256 groups
Round-robin S/O data| 1024 pins
Macro data| 1024 pins/ 1024 steps (regardless of pin count)
Component data| 10000 steps
Charge data| 40 groups
Pin contact data| 1024 pins

IC data| 500 steps (max. 1024 pins/ step)*

Test types and rangesHIOKI-IN-CIRCUIT-TESTER-FA1220-22-High-Speed-
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-Engine-01 \(6\) Measurement unitHIOKI-
IN-CIRCUIT-TESTER-FA1220-22-High-Speed-
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-Engine-01 \(7\) HIOKI-IN-CIRCUIT-TESTER-FA1220-22-High-Speed-
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-Engine-01 \(8\) StampHIOKI-IN-CIRCUIT-
TESTER-FA1220-22-High-Speed-
And
-High-Performance
-Measurement
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\(9\) Measurement controlHIOKI-IN-CIRCUIT-TESTER-FA1220-22
-High-Speed-
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-High-Performance
-Measurement
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\(10\) Main unit control

  • Hardware Personal Computer
  • Operating system Windows 10 Pro 64-bit, English
  • Storage device 256 GB SSD
  • Operation Keyboard and mouse
  • Display 17-inch display
  • Printer Panel Mount type, Paper width 58mm
  • External I/O
    • Ethernet (LAN) 100Base-TX × 1 (Contact Hioki for more information about external connectivity.)
    • USB 2.0 X4, USB 3.2 Gen 1 Type – Ax4 ( Keyboard and mouse occupy 2 ports )

Architecture

Safety

Functional specificationsHIOKI-IN-CIRCUIT-TESTER-FA1220-22-High-Speed-
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Other functionalityHIOKI-IN-CIRCUIT-TESTER-FA1220-22-High-Speed-
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General specifications

Location of use Indoors, Pollution Level 2, maximum elevation of 2000 m
Operating temperature and humidity range Temperature 23°C ±10°C, 75% RH or

less (non-condensing)
Storage temperature
and humidity range| Temperature 10°C to 43°C, 75% RH or less (non-condensing)
Environment| Do not use in a setting where the product would be exposed to dust, vibration, corrosive gases, or other adverse environmental
characteristics.
Vibration| Avoid use in locations with excessive vibration.
Product warranty| 3 years
Power supply| Rated supply voltage: 220 to 240 V AC, 50Hz Maximum power consumption: 1 kVA
Compressed air|

  • Pressure Primary side (supply): 0.5 MPa to 1.0 MPa (dry air) Secondary side (inside system): 0.5 MPa ±0.1 MPa
  • Air consumption 130 L/min. (ANR, Calculated when testing 6 boards per minute.)

Dimensions| 652 ±20 (W) × 789 ±15 (D) × 1671 ±20 (H) mm (excluding protruding parts)
Weight| 235 ±20 kg
Paint color| PANTONE Cool Gray 1C
Accessories| User Manual (with warranty certificate) × 1, test lead × 1, application CD × 1, positioning screws × 4,

Options

  1. Basic optionsHIOKI-IN-CIRCUIT-TESTER-FA1220-22-High-Speed-
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  2. ProductivityHIOKI-IN-CIRCUIT-TESTER-FA1220-22-High-Speed-
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  3. QualityHIOKI-IN-CIRCUIT-TESTER-FA1220-22-High-Speed-
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Dimensions

HIOKI-IN-CIRCUIT-TESTER-FA1220-22-High-Speed-
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  • Unit No. 123 & 124, 1st Floor, Suncity
  • Business Tower, Golf Course Road, Sector-54,
  • Gurgaon – 122003, Haryana, India

Follow us on social mediaHIOKI-IN-CIRCUIT-TESTER-FA1220-22-High-Speed-
And
-High-Performance
-Measurement
-Engine-01 \(20\)

Documents / Resources

| HIOKI IN-CIRCUIT TESTER FA1220-22 High Speed
And
High Performance
Measurement Engine [pdf] Owner's Manual
FA1220-22, IN-CIRCUIT TESTER FA1220-22 High Speed And High Performance Measurement Engine, IN-CIRCUIT TESTER FA1220-22, High Speed And High Performance Measurement Engine, High Performance Measurement Engine, Measurement Engine, Engine
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