flexlogix GF 12LP EFLX 4K Rad-Hard by Design Silicon Proven User Manual
- June 3, 2024
- flexlogix
Table of Contents
flexlogix GF 12LP EFLX 4K Rad-Hard by Design Silicon Proven
Instructions
EFPGA in GF 12LP/12LP+
EFLX®4K Rad-Hard by Design – Silicon Proven
Using Rad-Hard By Design standard cells and design guidelines the silicon-
proven EFLX eFPGA is now available, to US Companies, in a Rad-Hard by Design
version.
The EFLX®4K Logic IP core is an embeddable FPGA IP core containing 2,520 Look-
Up-Tables (Each LUT can be used as 6-input, or dual-5-input, with 2
independent outputs with 2 by-passable flip flops) in Reconfigurable Building
Blocks (RBBs) and 21 Kbit RAM, an improved XFLX™ interconnect network,
multiple clocks & scan: fully reconfigurable in-field at any time.
Each EFLX core is a standalone embedded FPGA. Cores can be arrayed up to at
least 8×8 to create arrays >500K LUT4s. Logic and DSP cores can be mixed. And
RAM can be integrated as well.
Name | EFLX®4K Core Gen 2 |
---|---|
Technology | GlobalFoundries 12LP/LP+ |
Metal Stack | Optimized for 13 Metal Stack |
Nominal Supply Voltages (Vj) | 0.6, 0.7, 0.8, 0.9 |
Junction Temperature (
°C )| −40 to 125
Leakage Power| 9mW (NN, 0.8Vj, 25C Tj)
Area (mm 2)| 1.57
Clock inputs| 1 to 8
Input and Output Pins| 632 input & 632 output, each
with an optional flip flop
Look-up Tables
(6-input LUT with two independent outputs)
| Logic/Mem Core| DSP Core
(on demand)
2,520
(~4.0K LUT4)
| 1,860
(~3.0K LUT4)
Total Flip Flops (ex DSP)| 6,304| 5,024
Distributed Memory (Kb)| 21 Kbits| 1K bits
22-bit DSP MACs| 0| 40
EFLX Array Sizes Possible| 1×1 to >8×8
Design-for-Test Support| Yes, 98+% fault coverage
LUT Utilization| Typically ~90%
Our improved, Gen 2 XFLX™ programmable interconnect has been optimized for
higher performance, especially for large arrays.
EFLX features full connectivity inside the core, and provides ArrayLinx™
interconnects at the boundary to concatenate multiple cores: array sizes are
possible from 4,000 LUT4s to >500K LUT4s, with a roadmap to >1M LUT4s.
Gen 2 DFT improvements achieve 99% coverage of all faults & a new
configuration load mode for test reduces test times about 100 times faster
than Gen 1 to lower test costs.The EFLX 4K Core has
632 input pins and 632 output pins placed as follows: 64 West, 64 East, 252
North, and 252 South. The I/O pins provide user access to the EFLX core. Each
pin has a by-passable flip flop. When multiple cores are concatenated into
EFLX arrays, the
pins along the abutting edges are disabled (or are used for controlling
embedded RAM blocks).Besides input/output pins,
there are clock, configuration, and test/DFT pins. Each Core has an internal
power grid which can be connected to the customer’s digital SoC power grid.
The Core also has configuration inputs on the West side and configuration
inputs on the South side to load the bitstream. An AXI or JTAG interface is
available for configuration. A clock mesh provides multiple connect points.
The configuration bits can be read back anytime to enable checking for soft
errors to improve reliability for high-reliability applications. A new test
mode enables test times about 100x faster for lower test cost.
This product is a partially Radiation Hardened. In addition to special Rad-
Hard by Design standard cells for storage elements design techniques were
applied to clock and reset circuits to mitigate the impact of Single Event
Upsets. Special Rad-Hard by Design configuration storage elements could be
used for configuration bitcells or Synopsys Premier can be used to further
reduce susceptibility to Single Event Upsets by triplicating critical portions
of the RTL with voting logic, if desired.
Deliverables and EDA Design Views
Front-end Design view (with NDA)| Back-end Design Views (with
License)
Encrypted Verilog Netlist| Encrypted Verilog Netlist with Timing Annotation &
SDF
LIB| GDS-II
Footprint LEF| CDL/Spice netlist
Detailed datasheet & DSP User’s Guide| Integration guidelines & assistance
Silicon validation report available| Test Vectors for DFT fault coverage of
96+%
EFLX Compiler evaluation version| EFLX Compiler bitstream generation version
August 2021. Copyright 2014-2021 Flex Logix® Technologies, Inc.
EFLX®, Flex Logix®, XFLX, ArrayLinx are Trademarks of Flex Logix Technologies
References
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