HIOK RM3542 Resistance Hitester Instruction Manual

HIOK RM3542 Resistance Hitester

Specifications

• Model: RM3542
• Version: RM3542-01
• Type: Resistance HiTESTER
• Edition: Oct. 2018 Revised edition 6 RM3542A981-06 18-10H

Product Information

The RM3542 Resistance HiTESTER is a versatile device designed for measuring resistance with high precision. It features various measurement settings and functions to cater to different testing needs.

Measurement Flow

The measurement flow involves verifying package contents, following safety information, and taking necessary operating precautions before conducting measurements.

Product Usage Instructions

Chapter 1: Overview

1. Product Overview and Features: Familiarize yourself with the functions and features of the Resistance HiTESTER.
2. Names and Functions of Parts: Understand the different components and their functions.
3. Screen Organization: Learn how information is displayed on the screen.

Chapter 2: Measurement Preparations

1. Connecting the Power Cord: Plug in the power cord to supply power to the device.
2. Connecting Measurement Cables and Test Fixtures: Connect the necessary cables and fixtures for measurement.
3. Turning the Power On and Off: Power on/off the Resistance HiTESTER as needed.

Chapter 3: Measurement Settings (Basic Measurements)

1. Pre-Operation Inspection: Perform a pre-operation check before starting measurements.
2. Measurement Object Types: Select the type of object being measured.
3. Setting the Measurement Speed: Adjust the measurement speed based on requirements.

FAQs

• Q: How do I enable the Comparator Function?
  • A: To enable the Comparator Function, navigate to the settings menu and select the option for Comparator Function. Follow the on-screen prompts to set upper/lower thresholds as needed.
• Q: What is the Key-Lock Function?
  • A: The Key-Lock Function allows you to disable specific key operations to prevent accidental inputs. You can re-enable key operations using the Key-Lock Cancel option in the system settings.

“`

iii
Contents
6 7 8 9 10 11 12

Appendix Index

iv
Contents

Task-Oriented Reference

1
Task-Oriented Reference

To minimize measurement error

Setting the measurement speed (p. 29) Setting the measurement speed integration time option (p. 44) Zero-adjustment (p. 32)

To judge measurement results

Judge measured values (comparator function) (p. 34)
Compare the measurement settings of two instruments (Settings Monitor function) (p. 53)

To correct faulty measurements
To automatically store measured values

Confirm faulty measurement (p. 38)
Improve probe contact (Contact Improver function) (p. 47)
Test for short-circuited probe (probe short-circuit detection function) (p. 51) Compare the measurement settings of two instruments (Settings Monitor function) (p. 53)
Store as soon as measurement is stable (Auto Memory function) (p. 71)

To print measurement results

Printing (p. 79)

To measure by PLC connection (PLC: Programmable Logic Controller)

External control (p. 85) Communications (RS-232C/GP-IB interface) (p. 97)

To connect to a computer

Communications (RS-232C/GP-IB interface) (p. 97)

To automatically send measurement data to a computer (RS-232C interface only)
To check operation

Export measurement values automatically (when finished measuring) (p. 77)
Setting Measurement Start Conditions (Trigger Source) (p. 30) Internal trigger (INT) Calibration (p. A11)

2
Measurement Flow

Measurement Flow

Be sure to read the “Operating Precautions” (p. 7) before use.
Installing, Connecting and Turning On

Install (p. 7) Connect (p. 21)

Connecting the Power Cord (p. 22) GP-IB RS-232C
EXT. I/O SET MONITOR

Computer communications (p. 97)
Printing (p. 79)
External control (p. 85)

Turn the power on (p. 25)

Compare the settings of two instruments (p. 53) Connect the measurement cables (p. 23)

Settings

Set measurement conditions (as needed)
Confirm the screen configuration (p. 17)
Confirm the initial setup (p. 68)
· Basic Settings (p. 27) · Configure settings for your
specific conditions (p. 41) · System-related settings
(p. 59)

When changing settings
Change basic settings such as measurement speed
Change to detailed settings (measurement conditions and system-related)

Set decision criteria (p. 34)

Calculation, Printing, Communication, and External Control Settings

Statistical calculations (p. 74)
Computer communications (p. 97)
When Finished

Data transmission (p. 77)

Printing (p. 79)

External control (p. 85)

Instrument interface settings must be configured before printing or using communications or remote control.

Turn the power off (p. 25)

3

Introduction

Introduction
Thank you for purchasing the HIOKI Model RM3542/ RM3542-01 Resistance HiTester. To obtain maximum performance from the instrument, please read this manual first, and keep it handy for future reference.
Model RM3542-01 is the same as the RM3542, but with GP-IB included.
Trademarks
· Windows and Visual Basic are registered trademark of Microsoft Corporation in the United States and/or other countries.
· TEFLON is a registered trademark or a trademark of The Chemours Company FC, LLC.

Verifying Package Contents
Inspection
When you receive the instrument, inspect it carefully to ensure that no damage occurred during shipping. In particular, check the accessories, panel switches, and connectors. If damage is evident, or if it fails to operate according to the specifications, contact your dealer or Hioki representative.

Content confirmation

Confirm that these contents are provided.

Model RM3542 or

Instruction Manual (This document)………… 1

RM3542-01 (with GP-IB included) ……………1

Operation Guide…………………………………… 1

Power Cord (2-line + ground)(p. 22) EXT. I/O Male Connector (p. 96)

4
Verifying Package Contents
Options
Contact your dealer or Hioki representative for details.

Measurement Probes and Fixtures (connect to measurement jacks)
Model 9140 4-terminal Probe
Alligator-clip-type measurement probes. These general-purpose dual-electrode clips fit a wide range of conductor thicknesses.

Interface Cables
Model 9637 RS-232C Cable (9-pin to 9-pin/ crossover cable)
Model 9638 RS-232C Cable (9-pin to 25-pin/ crossover cable)
Model 9151-02 GP-IB Connector Cable (2m)

Model 9262 Test Fixture
This fixture is for measuring lead components. (less than 10 m residual resistance after zero adjustment)

Model 9263 SMD Test Fixture
This fixture is for measuring chip components. (less than 10 m residual resistance after zero adjustment)

Safety Information

5
Safety Information

This instrument is designed to comply with IEC 61010 Safety Standards, and has been thoroughly tested for safety prior to shipment. However, mishandling during use could result in injury or death, as well as damage to the instrument. Using the instrument in a way not described in this manual may negate the provided safety features. Be certain that you understand the instructions and precautions in the manual before use. We disclaim any responsibility for accidents or injuries not resulting directly from instrument defects.
This manual contains information and warnings essential for safe operation of the instrument and for maintaining it in safe operating condition. Before using it, be sure to carefully read the following safety precautions.
Safety Symbols
In the manual, the symbol indicates particularly important information that the user should read before using the instrument. The symbol printed on the instrument indicates that the user should refer to a corresponding topic in the manual (marked with the symbol) before using the relevant function. Indicates AC (Alternating Current).
The following symbols in this manual indicate the relative importance of cautions and warnings. Indicates that incorrect operation presents a significant hazard that could result in serious injury or death to the user. Indicates that incorrect operation presents a possibility of injury to the user or damage to the instrument.
Indicates advisory items related to performance or correct operation of the instrument.
Symbols for Various Standards
This symbol indicates that the product conforms to regulations set out by the EU Directive.
WEEE marking: This symbol indicates that the electrical and electronic appliance is put on the EU market after August 13, 2005, and producers of the Member States are required to display it on the appliance under Article 11.2 of Directive 2002/96/EC (WEEE).

6
Safety Information

Other Symbols

Indicates the prohibited action.

(p. )

Indicates the location of reference information.

Indicates that descriptive information is provided below.

[ ]

Square brackets indicate instrument display labels (such as setting item names).

SET

Bold characters within the text indicate operating key labels.

(Bold characters)

Unless otherwise specified, “Windows” represents Windows 95, 98, Me, Widows NT4.0, Windows 2000, Windows XP, or Windows Vista.

Click: Press and quickly release the left button of the mouse. Double click: Quickly click the left button of the mouse twice.

Accuracy
We define measurement tolerances in terms of f.s. (full scale), rdg. (reading) and dgt. (digit) values, with the following meanings.

f.s.

(maximum display value)

The maximum displayable value. This is usually the name of the currently selected range.

rdg.

(reading or displayed value)

The value currently being measured and indicated on the measuring instrument.

dgt.

(resolution)

The smallest displayable unit on a digital measuring instrument, i.e., the input value that causes the

digital display to show a “1” as the least-significant digit.

7
Operating Precautions

Operating Precautions
Follow these precautions to ensure safe operation and to obtain the full benefits of the various functions.

Preliminary Checks
· Before using the instrument for the first time, verify that it operates normally to ensure that no damage occurred during storage or shipping. If you find any damage, contact your dealer or Hioki representative.
· Before using the instrument make sure that the insulation on the power cord is undamaged and that no bare conductors are improperly exposed. Using the instrument in such conditions could cause an electric shock, so contact your dealer or Hioki representative for repair.
· Before using the instrument, make sure that the insulation on the measurement cables is undamaged and that no bare metal is improperly exposed. If there is any damage, measured values may be unstable and measurement errors may occur.

Instrument Installation

Storage temperature and humidity: -10°C to 50°C at 80% RH or less (non- condensating) Operating temperature and humidity: 0 to 40°C at 80% RH or less (non-condensating)

Avoid the following locations that could cause an accident or damage to the instrument.

Exposed to direct sunlight Exposed to high temperature

In the presence of corrosive or explosive gases

Exposed to liquids Exposed to high humidity or condensation

Exposed to strong electromagnetic fields Near electromagnetic radiators

Exposed to high levels of particulate dust

Near induction heating systems (e.g., high-frequency induction heating systems and IH cooking utensils)

Subject to vibration

Installation Precautions

· The instrument should be operated only with the bottom downwards. · Do not place the instrument on an unstable or slanted surface.

50 mm or more 50 mm or more

10 mm or more

The instrument can be used with the stand (p. 16). It can also be rack- mounted. (p. A8).

Rear

Unplugging the power cord kills power to the instrument. Be sure to provide enough unobstructed space to unplug the power cord immediately in an emergency.

8
Operating Precautions
Handling the Instrument
· Do not allow the instrument to get wet, and do not take measurements with wet hands. This may cause an electric shock.
· Do not attempt to modify, disassemble or repair the instrument; as fire, electric shock and injury could result.
To avoid damage to the instrument, protect it from physical shock when transporting and handling. Be especially careful to avoid physical shock from dropping.
This instrument may cause interference if used in residential areas. Such use must be avoided unless the user takes special measures to reduce electromagnetic emissions to prevent interference to the reception of radio and television broadcasts.
Handling the Cords and Probes
· Avoid stepping on or pinching cables, which could damage the cable insulation. · To avoid breaking the cables, do not bend or pull them. · To avoid damaging the power cord, grasp the plug, not the cord, when unplugging it from
the power outlet. · When disconnecting the BNC connector, be sure to release the lock before pulling off the
connector. Forcibly pulling the connector without releasing the lock, or pulling on the cable, can damage the connector (p. 23).
· Use only the specified connection cables. Using a non-specified cable may result in incorrect measurements due to poor connection or other reasons.
· Before using a test fixture, read the instructions provided with it.
Before Turning Power On
Before turning the instrument on, make sure the supply voltage matches that indicated on its power connector. Connection to an improper supply voltage may damage the instrument and present an electrical hazard.

Before Connecting EXT. I/O

9
Operating Precautions

To avoid electric shock or damage to the equipment, always observe the following precautions when connecting to the EXT. I/O connector. · Always turn off the power to the instrument and to any devices to be connected
before making connections. · Be careful to avoid exceeding the ratings of external terminals (p. 91). · During operation, a wire becoming dislocated and contacting another conductive
object can be serious hazard. Make sure that connections are secure and use screws to secure the external connectors. · Properly insulate any devices and mechanisms to be connected to the EXT. I/O connector. · The ISO_5V pin of the EXT. I/O connector is a 5V power output. Do not apply external power to this pin. · The ISO_12V pin of the EXT. I/O connector is a 12V power output. Do not apply externalpower to this pin.
Before Connecting to the RS-232C Connector or SET MONITOR Connector

· Use a common ground for both the instrument and connected device. Using different ground circuits will result in a potential difference between the instrument’s ground and the connected device. If the communications cable is connected while such a potential difference exists, it may result in equipment malfunction or failure.
· Before connecting or disconnecting any the communications cable, always turn off the instrument and the connected device. Failure to do so could result in equipment malfunction or damage.
· After connecting the communications cable, tighten the screws on the connector securely. Failure to secure the connector could result in equipment malfunction or damage.

10
Operating Precautions
Before Measuring
· Do not apply any voltage to the measurement jacks. Doing so could damage the instrument.
· Never attempt to measure at a point where voltage is present. In particular, do not measure a transformer or motor immediately after a temperature increase test or withstand-voltage test, as the instrument could be damaged by induced voltage or residual charge.
· Battery internal resistance cannot be measured with this instrument. It will sustain damage. To measure battery internal resistance, we recommend the HIOKI 3554, 3555, BT3562, BT3563, and 3561 Battery HiTesters.
· To obtain the guaranteed measurement accuracy, allow at least 30 minutes warm-up. · The instrument internally retains all settings (but not measured values), such as measure-
ment range and comparator settings. However, measurement settings made through the RS-232C or GP-IB interface are not memorized. · In the 100 and higher ranges (LOW POWER set to OFF), thermal emf can cause measurement errors. · The DC resistance of a power transformer cannot be measured. When measuring objects with a large L, such as choke coils and other inductors, measured values may be unstable. In such cases, contact your dealer or Hioki representative. · Carefully insulate all HCUR, HPOT, LPOT, and LCUR wiring. Proper 4-terminal measurements cannot be performed and an error will occur if core and shield wires touch.

Overview

11
1.1 Product Overview and Features
Chapter 1 1

1.1 Product Overview and Features

The Hioki RM3542 Resistance HiTester employs the 4-terminal method to quickly and accurately measure the DC resistance of components such as resistors and ferrite beads. It includes advanced contact-check, comparator, and data output functions. The intuitive user interface and high noise immunity are ideal for use with taping machines and separators.

Resistance Measurement
The factory defaults (initial settings) are optimized for chip-component resistance measurements. The RM3542 can also measure devices that are otherwise difficult to measure with high current, such as ferrite-bead and small multilayer inductors (low-power resistance measurement, p. 28).
Optional Hioki probes and fixtures are available to connect to the measurement jacks (BNC jacks, p. 4). Alternatively, commercially available cables such as 1.5D-2V coax can be used (p. 24).

Judge Measured Values Measured values are compared with a pre-specified reference value or thresholds, and the result is output externally and indicated by the COMP indicators (comparator function, p. 34).
Upper limit
Lower limit

Save and Output Measured Values
Measured values can be stored in internal memory (p. 69) Statistical calculations can be performed on the stored data, which can be transferred to a computer in batch form (however, stored data cannot be confirmed internally).

Send Measurement Data and Calculation Results to a Printer
Use a commercially available printer with a serial interface to print measured values and calculation results (p. 79).

Connect a PLC or I/O Board
To control from a PLC, connect to the EXT. I/O connector. In addition to comparator results, various measurement anomaly signals can be output (p. 85).

Compare Two Instrument’s Setting Conditions
When measuring with two interconnected instruments, settings are compared, and an alarm is output and measurement is inhibited if the settings differ (Settings Monitor function, p. 53).

Interface Communications
Connect the instrument to a controller via the RS-232C or GP-IB interface to control measurement data acquisition (p. 97).

12
1.1 Product Overview and Features

Features
Ultra Fast and Accurate Measurements Increase Productivity The factory default settings are optimized for chipcomponent resistance measurements. Enhanced contact-to-measurement and contact-check-to-decision times are only 1 ms. The offset-voltage compensation (OVC) function minimizes the effects of thermal emf when using low-power resistance measurement and the 100 m to 10 ranges (p. 57). Measurement results are judged pass/fail with 10 ppm resolution, ideal for high-speed Class B resistor testing.

High-Speed Data Output and Ample Memory
The Data Output function transfers measured data at 5 ms/sample, even via RS- 232C. Up to 30,000 measurements can be stored, and all data can be exported at the end of measuring each reel. This function is ideal for system setup, debugging and process management.

Multiple Interfaces
EXT. I/O is isolated from the measurement and control circuits to provide noise immunity (p. 85). All data can be acquired in real time using the built- in 38.4-kbps high-speed RS-232C interface. Connect the commercially available printer with a serial interface to print measured values and statistical calculation results (p. 79). The GP-IB interface is available for Model RM3542-01 (specified when ordering, p. 97).

Low-Power Function (p. 28) For ranges from 1000 m to 1000 , low-power resistance measurement is provided to minimize measurement current. Safely measure devices that are otherwise difficult to measure with high current, such as ferrite-bead and multilayer inductors.

Clearly Visible Display and Intuitive Operation
High-contrast LCD provides clear visibility, helping avoid setting mistakes. The optimum range is selected automatically when comparator thresholds are entered.

Auto Memory Function Convenient for Sampling Tests (p. 71)
The auto memory function is convenient for sampling tests after screen- printing. Measured values are automatically acquired as soon as they stabilize, and statistical calculations proceed until the specified quantity is obtained, upon which an alert notification (alarm) occurs. Selecting [PRINT] (screen display) prints measured values and statistical calculation results (p. 82).

Fixtures for Component Measurements (p. 4)
The BNC-type measurement jacks exhibit good noise immunity. Ready availability and easy assembly ensure smooth system setup. Various test fixtures are available for Hioki LCR HiTesters.

13
1.1 Product Overview and Features

Features

1

Reliable Contact Checking (p. 46)
Contact checking (that was previously performed before and after measuring) is now performed during measurement, so probe bounce and contact resistance fluctuations can be detected. Contact checking time can be shortened, improving tact times.

Contact Condition

Probe Bounce

Model RM3542

Contact Check

Measuring

Previously

Minimize Human Error and Risk ­ the Settings Monitor Function (p. 53)
If the settings of two instruments are different, triggering is inhibited and an alarm notification is generated to avoid setting mistakes due to human error.

Reject Faulty Data ­ Voltage Level Monitor Function (p. 49)
When the contact resistance of the HCUR and LCUR leads fluctuates, the measurement current changes momentarily. Such momentary changes are not detectable by typical contact checking. The Voltage Level Monitor function detects a contact error if the detection voltage changes significantly, which can increase the reliability of measured values.

Poor Contact

Good Contact

Good Contact

Contact Condition

Detection Voltage
Error

Excessive detection voltage fluctuation error

ERROR

Contact Improver Function (p. 47)
The Contact Improver function improves bad contacts between probes and test samples. Contacts errors are reduced by penetrating oxidation and impurities between probes and samples. Reducing contact errors can increase productivity and quality. The intensity of the contact improver function can be adjusted according to probe type.

Contact Improvement

Contact Condition

Contact Improver

Function

ON

Contact Check

Measurement Status

ON
Checking Measuring

POT CUR

Reliable Four-Terminal Measurement ­ Probe Short-Circuit Detection Function (p. 51) Four-terminal measurements are inhibited when a conductive foreign object is present between the POT and CUR probe tips. Short-circuit probe anomalies are detected by checking the resistance between these tips when not measuring.
DUT electrode
DUT
Foreign object
Measurement Circuit Strongly Immune to Contact Resistance Fluctuations The effects of contact resistance fluctuations are reduced even when scattering occurs near the end of probe life. Such effects are minimized by the fast response of the measurement circuit.
Strong Electrical Noise Immunity The specified measurement accuracy is achieved even with ±1.5 kV mixed pulse noise. The floating measurement section design is highly impervious to electrical noise, minimizing the effect on measured values even when turning large-induction motors on and off. The free- range power supply input (90 to 264 V) is practically unaffected by voltage fluctuations, so stable measurements are possible even in under poor power conditions.

14
1.1 Product Overview and Features
Block Diagram
I

F

G

C

H

D E

A

B

E D

· Constant current (determined by the measurement range) is applied between the HCUR and LCUR terminals while voltage is measured between the HPOT and LPOT terminals. The resistance value is obtained by dividing the measured voltage (B) by the constant current flow (A).
· The effects of large offset voltage such as from thermal emf are reduced by current flowing in the positive and negative directions (A).
· The constant current source (A) and voltmeter (B) circuit designs are largely unaffected by contact resistance.
· Faulty measurement values caused by unstable or chattering contact conditions can be eliminated by monitoring (C) the detection voltage (B) waveform (Voltage Level Monitor function).
· Stable measurements are ensured by providing sufficient integration time (the default setting is 0.3 ms). (The integration time can be reduced to 0.1 ms to support even higher speed (B).)
· Before measuring, the Contact Improver circuit (D) optimizes contact when the probes touch the DUT.
· By also performing contact checking (E), short circuits between CUR and POT terminals caused by a clogged probe tip can be detected (probe short-circuit detection function).
· When measurement starts, the contact check circuit (E) and constant current monitor (F) are activated to monitor for fault conditions while measuring. The dual-CPU (C and G) design provides ultra-high-speed measurements and fast system response.
· Immunity from electrical noise is provided by isolation between the Measurement and Control blocks (H).
· The auto-ranging 100-to-240 V switching power supply (I) can provide stable measurements even in poor power quality environments.

15
1.2 Names and Functions of Parts

1.2 Names and Functions of Parts

1

Front Panel

Power On/Off
POWER Button Turns the instrument on and off (p. 25). · Unlit: power off
(when no power supplied) · Red light: power off
(while power is supplied) · Green light: power on

Viewing Measured Values and Settings
Display Screen Monochrome graphical LCD There are three general screen types: Measurement, Basic Settings and Detailed Settings.
Screen Configurations (p. 17)

Setting
JudginFg 1mteoasFu4reÉdLvÅa[lues (p. 34)
(Compar(aFtÉorLfÅun[c: tëioçnè)Ã) Set a reâfeÊreñnþcâeEëv§aÇlu…e ïaén¶dÇrSaÇngÍÇeÈfoçÄr judging measureñm/ÇesnëtsIë,swÇhµiÇch<Çc²aÅnB be confirmed by the COMP indicators.
Select this to judge measured values relative to a reference value and tolerance (%). The REF% setting display appears.

Press to judge measured values relative to upper/lower thresholds. The ABS setting display appears.

Audible Alarm (beeper)

Viewing Comparator
Results
COMP indicator LEDs Indicate the decision result of the measured value (p. 34). Hi Measured value is
above upper limit IN Pass (meets crite-
ria) Lo Measured value is
below lower limit

Connecting Probes
Measurement Terminals Connect measurement cables or a fixture (p. 23). · HCUR jack: Current source terminal · HPOT jack: Detected voltage high
terminal · LPOT jack: Detected voltage low ter-
minal · LCUR jack: Measurement current
detected terminal · GUARD jack: Shield (measurement
ground) terminal

Entering numerical values
Enter a numerical value. (we call these the “tenkeys”)
Switches the sign of a numerical value.
Selects the unit of measure.
Sets the tolerance values.
Deletes the value in the selected field.
Accepts the displayed comparator threshold values.
Aborts comparator setting and returns to the previous display.
Selecting the setting contents
(“the F keys”) F1 to F4 keys Selects the corresponding item on the right side of the display.
Cursor keys Move among the displayed setting items. The cursor location is indicated by reverse characters.

16
1.2 Names and Functions of Parts
Rear Panel Connecting the Power Cord
Connect the supplied power cord (p. 22).

Manufacturer’s Serial Number
Shows the serial number. Do not remove this label, as it is required for product support.

External Control
EXT. I/O Connector Connect to a PLC or I/O board to control measurement start, and to acquire comparator results (p. 85).
Compare Two Instruments’ Settings
SET MONITOR Connector
Connect another RM3542 here to compare instrument settings (p. 53).

RS-232C Communications Printer Output
RS-232C Connector The RS-232C interface can be used to connect to a PLC or computer (p. 97). It is also used by the commercially available printer with a serial interface (p. 79).
GP-IB Communications
GP-IB Connector (RM3542-01 only) The GP-IB interface can be used to connect to a computer (p. 97).

Bottom Panel

This instrument can be rack mounted. See: “Appendix 4 Rack Mounting” (p. A8)
Parts removed from this instrument should be stored in a safe place to enable future reuse.

When using the stand Extend the stand until it clicks into place. Make sure to extend both legs of the stand.
Collapsing the stand Fold in the stand until it clicks into place.

Stand

Do not apply heavy downward pressure with the stand extended. The stand could be damaged.

17
1.3 Screen Organization

1.3 Screen Organization

1

The instrument has three general display screen types: Measurement, Basic Settings and Detailed Settings. Refer to “11.3 Error Displays and Remedies” (p. 181) for error displays.
The screen examples in this guide appear reversed (black on white) for best visibility on the printed page. However, the instrument screens can actually be displayed only as white characters on black background.

Measurement Screen (p. 18)

Basic Settings Screen (p. 18)

Return to Previous Screen

Detailed Settings Screens (p. 19) Measurement Settings Screens [MEAS SETTINGS] Data Settings Screens [DATA SETTINGS] System Screens [SYSTEM]

Return to Previous Screen

Indicates a Continued Screen

18
1.3 Screen Organization

Measurement Screen

This screen normally appears while measuring. View currently measured values and measurement conditions. Some parts of the display depend on the comparator mode and other settings.
To display the Basic Settings screen

Settings Menu (corresponding to F keys)

Displayed contents depend on the current function set-

tings.

Measured Value Criteria Setting Values (p. 34)

Parentheses ( ) indicate the corresponding F-key

Displayed contents depend on the MENU (F1)

Displays the Basic Settings screen

selected comparator mode. (Ex.: REF% mode)
Measurement Conditions

PRINT (F2)

Print (p. 81) Appears only when the interface is set for the printer

Shows current setting contents. Displayed contents de-

pend on the current settings.

STAT (F3)

Statistical calculation results (p. 74) Appears only when statistical calcu-

INT/ EXT

Trigger source type (p. 30)

lation is enabled

Measurement range (p. 31)

NUMBER (F4) Set Auto-Memory number (quantity)

FAST/ MED/ SLOW Measurement speed (p. 29)

0ADJ/

Appears only when zero-adjust is

OFF (not shown) enabled (p. 32)

(p. 71)
Displays the number of stored data items and the number of passed and failed products at the lower left.

OVC/ OFF (not shown)
LP/ OFF (not shown)

(OVC: Offset Voltage Compensation) Appears only when OVC is enabled (p. 57)
Appears only when the Low-Power Resistance function is enabled (p. 28)

UNDO (F3) ALLCLR (F4)

Deletes the previously stored measurement and calculation result (only one can be deleted) (p. 76) Appears only when calculation results are displayed
Clears all memory and calculation

NUM RMT

Appears only when tenkey input is enabled
Remote control (p. 104)

(p. 76) Appears only when calculation results are displayed

M.LOCK

Disables all operations except LOCAL (F1)

Enables local controll (p. 104)

comparator settings (p. 59)

UNLOCK (F1) Cancels the key-lock state (hold 1s)

F.LOCK

Disables all operations including

(p. 60)

comparator settings (p. 59)

Basic Settings Screen

Make basic measurement condition settings on this

screen. Measurement speed and range can be changed

Return to previous screen while viewing measured values. (Trigger source: INT)

Select measurement condition settings Move with cursor keys.

TRG

Measurement condition setting selections

RANGE SPEED 0ADJ COMP LOCK

Change trigger source (measurement start control method) (p. 30) When EXT triggering is enabled, [MANU] appears beside the F4 key (press to trigger measurement manually).
Change range (p. 31)
Change measurement speed (p. 29)
Turn zero-adjust on/off (p. 32)
Turn comparator on/off (p. 34)
Enable/disable key lock (p. 59)

MISC

To display the Detailed Settings screen

To display the [MEAS SETTINGS] screen To display the [DATA SETTINGS] screen To display the [SYSTEM] screen

Detailed Settings Screens Measurement Settings Screen [MEAS SETTINGS] Data Settings Screen (Save, Analysis, and Output) [DATA SETTINGS] System Screen [SYSTEM]

19
1.3 Screen Organization

1
Shows detailed settings for measurements. Adjust the measurement speed, stability and measurement fault detection functions.

DELAY1

Adjust the delay from probing to trigger input (p. 42)

DELAY2

Adjust measurement object electrical response (p. 42)

INT (FAST/ MED/ Make fine adjustment to integration time

SLOW)

(p. 44)

CONT CHECK

Contact check threshold setting (p. 46)

CONT IMP

Contact Improver function setting (p. 47)

VOLT MONITOR Voltage level monitor function setting (p. 49)

CURRENT MODE Current mode setting (p. 50)

These are settings for memory and statistical calculation functions.

AUTO MEMORY Turn Auto-Memory on/off (p. 71)

STATISTICS

Statistical calculation on/off (p. 74)

DATA OUT

Automatically output measured values (communications) (p. 77)

Set instrument system-related settings on this screen.

SET MONITOR

Turn two-instrument setting comparison on/off (p. 53)

PROBE CHECK

Turn probe short-circuit detection on/off (p. 51)

RETRY

Retry function setting (p. 56)

TRIG EDGE

(External I/O) Set trigger rising/falling edge (p. 94)

EOM

(External I/O) Set EOM (end-of-measurement) signal (p. 93)

INTERFACE

Communications interface settings (p. 101)

LOW POWER

Low-power resistance component measurement on/off (p. 28)

JUDGE BEEP

Comparator beeper settings (p. 62)

KEY BEEP

Key beeper on/off (p. 61)

CLOCK (Y-M-D) Set internal clock (p. 64)

LINE FREQ

Set power source frequency (p. 63)

CONTRAST

Adjust screen contrast (p. 65)

BACKLIGHT

Adjust screen backlight (p. 66)

RESET

Initialize (p. 67)

ADJUST

Instrument Adjustment (p. A13)

20
1.3 Screen Organization

21

Measurement Preparations

Chapter 2 2

Be sure to read the “Operating Precautions” (p.7) before installing and connecting this instrument. Refer to “Appendix 4 Rack Mounting” (p. A8) for rack mounting.

5

2

Front Panel
3
1 Install this instrument (p. 7)
2
Connect the power cord (p. 22)
3 Connect measurement cables (p. 23)

Rear Pane
4
4 Connect the external interface (as needed)
· Using the printer (p. 79) · Using the RS-232C or GP-IB interface
(p. 97) · Connecting to a PLC or I/O board
(p. 85) · Automatically comparing the settings
of two instruments (Settings Monitor function) (p. 53)
5 Turn the power on (p. 25)

6 Make instrument settings (p. 27)

Connect to the test sample
When finished measuring, turn the power off (p. 25).

22
2.1 Connecting the Power Cord
2.1 Connecting the Power Cord
· Before turning the instrument on, make sure the supply voltage matches that indicated on its power connector. Connection to an improper supply voltage may damage the instrument and present an electrical hazard.
· To avoid electrical accidents and to maintain the safety specifications of this instrument, connect the power cord only to a 3-contact (two-conductor + ground) outlet.
· Before using the instrument, make sure that the insulation on the power cord is undamaged and that no bare conductors are improperly exposed. Any damage could cause electric shock, so contact your dealer or Hioki representative.
To avoid damaging the power cord, grasp the plug, not the cord, when unplugging it from the power outlet.

Power inlet Rear Panel

1 Confirm that the mains supply voltage matches the
instrument, and connect the power cord to the power inlet on the instrument.
2 Plug the power cord into the mains outlet.
The POWER button on the front panel lights red. In event of a power outage, operation resumes with the same settings when power is restored (breaker reset, etc.).

23
2.2 Connecting Measurement Cables and Test Fixtures
2.2 Connecting Measurement Cables and Test Fixtures
2 Connect your measurement cables, optional Hioki probes or test fixture to the measurement jacks.
Refer to “Options” (p.4) for details. See the instructions provided with the fixture for operating details.
· Do not apply a voltage to the measurement terminals. Doing so may damage the unit. · When disconnecting the BNC connector, be sure to release the lock before pulling off the
connector. Forcibly pulling the connector without releasing the lock, or pulling on the cable, can damage the connector.
· We recommend using optional Hioki fixtures.
· Use the GUARD jack only for Faraday shield, and avoid more than 10 mA current flow. This jack is not for guarding network resistance measurements.

Connection Methods

Example of defeated guard measurement

Connecting measurement cables

Black plugs

BNC Jack Guide Pins (on the instrument)

Red plugs

1

BNC plug slots
2
Lock

Connecting a fixture

Connect the red plugs to the
HCUR and HPOT jacks, and the black plugs to the LCUR and LPOT jacks.

Align the slots in the BNC plug with the guide pins on the jack on the instrument, then push and twist the plug clockwise until it locks. Disconnecting BNC connectors Push the BNC plug, twist it counterclockwise, and pull it out.

Connect directly to the measurement jacks with the label side up, and affix with the levers on the left and right.

Making your own probes and extenders (p. 24)

24
2.2 Connecting Measurement Cables and Test Fixtures

Making Your Own Measurement Cables

Recommended Measurement Cable Specifications

Conductor resistance

500 m/m or less

Capacitance

150 pF/m or less

Cable dielectric material

Polyethylene (PE), TEFLON (TFE), polyethylene foam (PEF) Insulation resistance at least 10 G

Connector insulating material TEFLON (TFE), polybutylene terephtalate (PBT) Insulation resistance at least 10 G

Length

2 m or less

Example: JIS standard 3C-2V, 1.5D-2V MIL standard RG-58A/U

Wiring Diagram

Before Wiring
· Twist together the HPOT and LPOT wires, and the HCUR and LCUR wires. If not twisted together, measured values may be unstable and errors occur when measuring with low-power resistance, or low resistance values.
· Refer to the block diagram (p. 14) for internal circuit details. · Probes and measurement objects should be shielded at BNC or GUARD jack potential.
Extending Measurement Cables
Observe the following when extending measurement cables:
· Measurement cable length should not exceed 2 m (with conductor resistance 500 m/m or less). Long cables are more susceptible to noise, and measured values may be unstable.
· Extensions should maintain the four-terminal structure. If converted to a two-terminal circuit in the wiring, correct measurement may not be possible due to the effects of wiring and contact resistance.
· Cables and measurement objects should be shielded. · After extending measurement cables, confirm operation and accuracy (“Measurement Specifica-
tions” (p.176)). · If cutting the ends off of optional measurement cables, make sure that the shield does not touch
the center conductor of the HCUR, HPOT, LPOT and LCUR cables. Correct measurement is not possible with a shorted cable.

25
2.3 Turning the Power On and Off
2.3 Turning the Power On and Off
Turning Power On
2

Press the POWER button (it lights green).
After Power-On A self-test (instrument diagnostic routine) is performed. During the self-test, the following information is displayed while the hardware is verified.
Self-test The following information is displayed during self-testing: · Manufacturer and model name · Firmware versions (main, and measurement) · Communication setting · Line frequency setting

No Errors

Error

Normal display (measurement screen)

Indicates an error (p. 181).

When the power is turned on, the same setting as when the power was last turned off appears (backup function). When powered up for the first time, the default settings appear.
See: “Default Settings” (p.68)

Before Starting Measurement To obtain precise measurements, provide about 30 minutes warm-up after turning power on. Measurement settings are recalled from when the power was previously turned off (settings backup). However, measurement settings made through the RS-232C or GP-IB interface are not
retained, although they can be stored using the :SYSTem:BACKup command (p. 135).
Turning Power Off
Press the POWER button (it lights red when the instrument is off). Disconnect the power cord from the outlet to extinguish the POWER button light. When power is turned on again, operation resumes with the same settings as when last turned off.
If a power outage (e.g., breaker trip) occurs when the instrument is on, it will automatically turn on again when power is restored (without pressing the POWER button).

26
2.3 Turning the Power On and Off

27
3.1 Pre-Operation Inspection

Measurement Settings

(Basic Measurements)
Chapter 3
3
See “Measurement Flow” (p. 2) for an outline of the measurement process from preparation to endof-measurement.
3.1 Pre-Operation Inspection

Before using the instrument for the first time, verify that it operates normally to ensure that no damage occurred during storage or shipping. If you find any damage, contact your dealer or Hioki representative.

1 Peripheral Device Inspection
Is the power cord insulation torn, or is Metal Exposed any metal exposed?
No Metal Exposed

Do not use the instrument if damage is found, as electric shock or short- circuit accidents could result. Contact your dealer or Hioki representative.

Metal Exposed Is the insulation on a measurement cable torn, or is any metal exposed?
No Metal Exposed

If there is any damage, measured values may be unstable and measurement errors may occur. Replace the cable with an undamaged one.

2 Instrument Inspection
Yes Is damage to the instrument evident?

If damage is evident, request repairs.

No
When turning power on No
Does the self-test screen appear (model no., version no.)? (p. 25)

Yes
Does the Measurement screen appear after self-test?

An error indication occurs (ERR)

Yes Inspection complete

The power cord may be damaged, or the instrument may be damaged internally. Request repairs.
The instrument may be damaged internally. Request repairs. See: “11.1 Troubleshooting” (p. 179)
“11.3 Error Displays and Remedies” (p. 181)

Please read the “Operating Precautions” (p. 7) before use.

28
3.2 Measurement Object Types

3.2 Measurement Object Types

The instrument provides two measurement methods: resistance measurement, and low-power resistance measurement. Select the appropriate measurement method for the type of component to be measured. For general-purpose resistor measurements, use the factory defaults. The power applied to the DUT = Resistance Value × (Measurement Current)2.
See: “(6) DUT Becomes Warm” (p. A6)

(Example)If the resistance to be measured is 100

(Measurement Current)

10 mA

100 × 0.012 = 10 mW

1 mA

100 × 0.0012 = 100 µW

(Measurement Method) Normal Resistance Measurement, 100 Range Low-Power Resistance Measurement, 100 Range

General-purpose resistors

Normal Resistance Measurement
Measurement range: 0.0000 m (100 m range) to 120.0000 M (10 ranges)

Hard-to-measure components such as ferrite bead or layered inductors, or other elements sensitive to measurement current

Low-Power Resistance Measurement
Measurement range: 0.000 m (1000m range) to 1200.000 (4 ranges)
LP LP appears at the top of the screen.

The 1000 and higher ranges (with LOW POWER: OFF) are not usable for inductor measurements.
1 Open the Basic Settings screen.
The Basic Settings screen appears.

2 Open the System screen.
1 Selection
3 Select the low-power mode, as needed. 1 Selection
4 Return to the Measurement screen. The confirmation screen appears.

2 The System screen appears. [SYSTEM] 2
Normal resistance measurement (default) Low-power resistance measurement
Return to the setting screen. Save setting and return to previous screen. Discard setting and return to previous screen.

29
3.3 Setting the Measurement Speed

3.3 Setting the Measurement Speed

The measurement speed can be set to FAST, MED (medium), or SLOW. A slower measurement speed provides greater measurement precision, and a faster measurement speed results in greater susceptibility to environmental noise. Ensure that measurement cables and the sample are sufficiently shielded.

1 Open the Basic Settings screen.

3
The Basic Settings screen appears.

2 Select the measurement speed.
1 Selection
3 Return to the Measurement screen.

2
See table below
(default)

Press the up/down cursor keys to change the setting.

Relationship Between Measurement Range and Speed
(factory defaults)

Measurement Range

LOW POWER: OFF FAST MED SLOW

LOW POWER: ON FAST MED SLOW

100m

3.8 ms 13 ms

43 ms 36 ms

–

–

–

1000m

2.0 ms

6.4 ms

41 ms 35 ms

2.5 ms 12 ms

42 ms 35 ms

10 100

1.6 ms 0.9 ms

6.0 ms 3.6 ms

41 ms 34 ms
21 ms 17 ms

2.5 ms 1.7 ms

12 ms 6.1 ms

42 ms 35 ms
41 ms 34 ms

1000

0.9 ms

3.6 ms

21 ms 17 ms

7.2 ms 12 ms

47 ms 40 ms

10k

1.0 ms

3.6 ms

21 ms 17 ms

–

–

–

100k

1.3 ms

3.8 ms

21 ms 18 ms

–

–

–

1000k

2.5 ms

6.0 ms

21 ms 18 ms

–

–

–

10M

5.3 ms

23 ms 20 ms

23 ms 20 ms

–

–

–

100M

26 ms 22 ms

46 ms 39 ms

86 ms 72 ms

–

–

–

Integration time can be optionally set for each range (p. 44).
Upper value: for 50-Hz power line frequency
Lower value: for 60-Hz power line frequency
Tolerance: ±10%±0.2 ms

30
3.4 Setting Measurement Start Conditions (Trigger Source)

3.4 Setting Measurement Start Conditions (Trigger Source)

Measurements can be started in two ways.

To measure automatically

Measure with internal (INT) triggering
Trigger signals are automatically generated internally for continuous measurement.

To measure at specific times To retain measured values

Measure with external (EXT) triggering
Measurements are triggered by an external signal. Manual measurement triggering is also available. · Apply a trigger signal at the EXT. I/O connector (p. 85)
· Send the TRG command by communications interface (p. 126)
· Press F4 [MANU] (only appears when EXT is selected)

· When internal triggering is enabled, the EXT. I/O TRIG signal and the “TRG” command are ignored
(except for memory storage and statistical calculations). · To measure samples such as inductors that require time to settle, adjust delay time DELAY2. Start with
a long delay, and gradually shorten it while watching for the measured value to settle. See: “4.2 Setting Pre-Measurement Delay” (p. 42)
· When external triggering is enabled, the Auto-Memory function is disabled by force.

1 Open the Basic Settings screen.

The Basic Settings screen appears.

2 Select internal (INT) or external (EXT) triggering. 2

1 Selection

Internal trigger
External trigger (default)

Press F3 [EXT] to display the F4 [MANU] indicator. Press to trigger a measurement manually.

3 Return to the Measurement screen.

Press the up/down cursor keys to change the setting.

Continuous measurement (:INITIATE:CONTINUOUS ON) is the normal trigger state when operating from
the front panel. Selecting the internal (INT) trigger source activates continuous triggering (“free-run”). When external (EXT) triggering is selected, each external trigger event initiates one measurement. Continuous mea-
surement can be disabled by sending the :INITIATE:CONTINUOUS OFF command via RS-232C or GP-
IB. When continuous measurement is disabled, trigger acceptance is controlled only by the host (computer or PLC).
See: for trigger command: “Triggering” (p. 138), “9.8 Data Exporting Methods” (p. 148)

31
3.5 Selecting the Measurement Range

3.5 Selecting the Measurement Range

The measurement range can be set as follows. When making comparator settings with the panel keys, the measurement range is selected automatically according to the settings (reference/tolerance or upper/lower thresholds, see the following table). When the comparator settings are made by remote control commands, the measurement range is unaffected.

Changing the Range Measurement error is larger when measuring values nearer the bottom of a measurement range.

3

The 1000 and higher ranges (with LOW POWER: OFF) are not usable for inductor measurements.

Auto-Ranging (when making comparator settings)

Low Power OFF (p. 28)

Low Power ON (p. 28)

Reference (REF%) and

Selected

Upper/Lower Threshold (ABS) Ranges Range

Reference (REF%) and Upper/Lower Threshold (ABS) Ranges

0 to 100.09 m 100.1 to 1000.9 m 1.001 to 10.009 10.01 to 100.09 100.1 to 1000.9 1.001 to 10.009 k 10.01 to 100.09 k 100.1 to 1000.9 k 1.001 to 10.009 M 10.01 to 120.00 M

100 m 1000 m 10 100 1000 10 k 100 k 1000 k 10 M 100 M

– 0 to 1000.9 m 1.001 to 10.009 10.01 to 100.09 100.1 to 1200.0

Selected Range
– 1000 m 10 100 1000

Manual Range Selection
1 Open the Basic Settings screen.

The Basic Settings screen appears.

2 Select the range.
1 Selection

2

Increments the

range

Press the up/down

Decrements the cursor keys to

range

change the setting.

3

Selectable ranges depend on the low-power resistance setting (p. 28). · When low-power resistance measurement is disabled (OFF)
100m, 1000m, 10, 100, 1000, 10k, 100k, 1000k, 10M, 100M(default) · When low- power resistance measurement is enabled (ON)
1000m, 10, 100, 1000
Return to the Measurement screen.

32
3.6 Zero Adjustment
3.6 Zero Adjustment
When four-terminal measurement (Kelvin connection) is impractical such as when measuring very small samples, the additional inherent resistance of the two- terminal wiring should be canceled out. The zero-adjustment function can cancel out up to 10 additional resistance.
Before Zero Adjustment
· The guaranteed accuracy of the instrument applies to four-terminal connections without zero adjustment. When using four-terminal connections, do not execute zero adjustment. Executing zero adjustment with incorrect wiring may amplify measurement error. However, zero adjustment may be needed even with fourterminal measurements if they are affected by a large offset voltage, such as due to thermal emf (LOW POWER OFF, in 100 to 100 M ranges).
· Execute zero adjustment when the ambient temperature has changed, or when a probe is replaced.
Execute zero adjustment after the warm-up period following power on.
1 Open the Basic Settings screen.
The Basic Settings screen appears.

2 Select the internal (INT) trigger mode.
1 Selection
3 Short the probes together.

2
Internal trigger

Press the up/down cursor keys to change the setting.

4 Confirm that the measured value does not exceed 10 . If no measured value is displayed, increment the measurement range (p. 31).

5 Select whether to enable or disable zero adjustment. 2

1 Selection

Disable zero adjustment (cancel) Execute zero adjustment

After confirming that the measured value does not exceed 10 , execute zero adjustment.
6 Return to the Measurement screen.

Zero Adjustment Faults
If zero adjustment fails, the following error message appears.

33
3.6 Zero Adjustment

Before attempting zero adjustment again, confirm the following: · With the 10 range selected, confirm that the displayed value does not exceed 10 .

3

· Confirm that the probe connections are correct.

34
3.7 Judging Measured Values (Comparator Function)

3.7 Judging Measured Values (Comparator Function)
Comparator results are available as external output (at the EXT. I/O connector) when the comparator reference/tolerance or upper/lower threshold values have been set.
See: “Chapter 8 External Control” (p. 85)
Comparator results are also indicated by the COMP Hi/IN/Lo panel lamps, and by audible beeper (disabled by default).
See: “Setting the Comparator Decision (“JUDGE”) Beeper” (p. 62)
The comparator decision mode can be set as one of the following:

Measured value is above upper limit
Pass (meets criteria)
Measured value is below lower limit

Decide whether a measured value is within specified tolerance limits relative to a specified reference value (p. 35)
Decide whether a measured value is between specified upper and lower threshold values (absolute values) (p. 37)

Select the REF% (relative values) decision mode

example
12.000 k ….. reference value +0.080%…….. positive tolerance -0.080%……… negative tolerance

Positive

Hi

tolerance [%] Reference value [] Negative

IN IN

tolerance [%]

Lo

Select the ABS (absolute values) decision mode

example
100.00 m …. upper threshold 80.00 m …… lower threshold

Upper

Hi

threshold [] Lower

IN

threshold []

Lo

Before Using the Comparator Function
· When the measured value is out of the selected measurement range, comparator decision indicators appear as follows. In the event of a measurement fault, no decision is made. See:”3.8 Confirming Faulty Measurements” (p. 38)

Out-of-Range Display +OvrRng -OvrRng

Comparator Decision Indicator Hi Lo

· If power is turned off during comparator setting, changes to settings are lost as they revert to their previous values. To accept the settings, press the ENTER key.
· When setting comparator criteria, the appropriate range is selected automatically. Refer to “Auto-Ranging (when making comparator settings)” (p. 31) for range settings.

35
3.7 Judging Measured Values (Comparator Function)

Enabling and Disabling the Comparator Function

The comparator function is enabled by default. When the function is disabled, comparator settings are ignored.

1 Open the Basic Settings screen.

The Basic Settings screen appears.

3

2 Enable or disable the comparator function.
1 Selection
3 Return to the Measurement screen.

2

Disable the function Enable the function

Press the up/down cursor keys to change the setting.

(When the function is disabled) Comparator decisions are indicated only when the function is enabled.

Decide According to Reference Value and Tolerance (REF% Mode)

Relative Value = (tolerance)

Measured Value – 1
Reference Value

X 100 [%]

Setting range: -9.999% to +9.999% (When 10% or less) -99.99% to +99.99% (When more than 10%)

Example: Set a reference value of 10.5 with ±4.5% decision tolerance.

To abort the setting process, press screen.

. Settings are abandoned and the display returns to the previous

1 Open the relative tolerance setting screen.

Reference value Positive tolerance (upper decision threshold) Negative tolerance (lower decision threshold)

36
3.7 Judging Measured Values (Comparator Function)

2 Set the reference value. Pressing an inoperative key during setting sounds a low-pitch beep (when the key beeper is enabled).

1
Selection

To Reset Numerical Values Deletes entered digits. This key is enabled only when entering numerical values.

(Example: 10.5)

2

1_

10_

10._

To change the value after selecting the

units, use the cursor

keys to select

the item to change, then enter the new val-

10.5_

10.50 ue with the tenkeys.

Press the units key to accept the setting and move the cursor to the positive tolerance.

3 Set the positive tolerance.
1

Selection

(Example: 4.5%)

2

+4_

+4._

+4.5_

+4.500%

To Reset Numerical Values Deletes entered digits. This key is enabled only when entering numerical values.

To change the value after selecting the

units, use the cursor

keys to select

the item to change, then enter the new val-

ue with the tenkeys.

To Set a Negative Value Press this key to change the sign, as needed.

Press the % key to accept the setting and move the cursor to the negative tolerance value. The negative tolerance is initially set to the same amplitude as the positive tolerance (change as needed).
4 Set the negative tolerance in the same way (as needed).

Selection
5 Accept the settings and return to the Measurement screen.

· Internal calculations are performed on floating-point values, and decisions round up any fraction of the least-significant digit.
· Displayed values of the reference and tolerances are rounded according to the selected range. Internal calculations use unrounded data, so decisions are based on the entered (setting) values.
· An error message appears if you press ENTER with the positive tolerance set lower than the negative tolerance.
See: “11.3 Error Displays and Remedies” (p. 181) (ERR:001)

37
3.7 Judging Measured Values (Comparator Function)

Decide According to Upper/Lower Thresholds (ABS Mode)

Setting example: Upper threshold 150 m, lower threshold 50 m

To abort the setting process, press previous screen.

. Settings are abandoned and the display returns to the

1 Open the absolute value threshold setting screen.
3
Upper threshold Lower threshold

2

Set the positive tolerance.

Pressing an inoperative key during setting sounds a low-pitch beep (when the key beeper is enabled). No error message is displayed.

1
Selection

To Reset Numerical Values Deletes entered digits. This key is enabled only when entering numerical values.

(Example: 150 m)
2

1_

15_

150_

150.0m

To change the value after selecting the

units, use the cursor

keys to select

the item to change, then enter the new val-

ue with the tenkeys.

3

Press the units key to accept the setting and move the cursor to the lower threshold value.
Set the negative tolerance in the same way.
1

Selection
2

(Example: 50 m)

5_

50_

50.0m

Press the units key to accept the setting and move the cursor to the upper threshold.
4 Accept the settings and return to the Measurement screen.

· Internal calculations are performed on floating-point values, and decisions round up any fraction of the least-significant digit.
· Displayed values of the reference and tolerances are rounded according to the selected range. Internal calculations use unrounded data, so decisions are based on the entered (setting) values.
· An error message appears if you press ENTER with the positive tolerance set lower than the negative tolerance.
See: “11.3 Error Displays and Remedies” (p. 181) (ERR:001)

38
3.8 Confirming Faulty Measurements

3.8 Confirming Faulty Measurements

When a measurement is not performed correctly, a measurement fault indicator appears and a measurement fault signal is output at the ERR pin of the EXT. I/O connector (except for out-of-range detection). The instrument detects measurement faults by the following four methods.

Out-of-Range

See: “Out-of-Range Detection Function” (p. 39)

Display
+OvrRng -OvrRng

Appears when the measured value is outside of the measurement or display range. Check for a broken sample component. The comparator result is Hi when +OvrRng is displayed, and Lo when -OvrRng is displayed. No external measurement fault signal (ERR) is output.

Contact Check Fault

See: “4.4 Checking for Poor or Improper Contact (Contact Check Function)” (p. 46)

Display
C.E. Hi C.E. Lo

The resistance between the HPOT and HCUR probe contacts, and between the LPOT and LCUR probe contacts, are measured and compared with specified contact fault values. An error message appears when the measured value reaches or exceeds the specified contact fault values. If this error persists, probe wear or cable failure may be the cause. If the error is not cleared by shorting the tips of a known-good measurement cable, the instrument requires repair.

Voltage Level Monitor Fault

See: “4.6 Detecting Measurement Voltage Faults (Voltage Level Monitor Function)” (p. 49)

Display
C.E. Volt

This method monitors the stability of the voltage between HPOT and LPOT probe contacts. An error message appears when voltage instability is detected due to chattering of the probe con-
tacts.

If this error persists, the probes may be degraded due to wear.

C.E. Volt may also be displayed when external noise is strong.

Current Monitor Fault

See: “Current Monitor Function” (p. 39)

This method monitors the regulated measurement current for normal flow through the DUT.
An error is detected mainly when a measurement fault occurs due to an open- circuit DUT or between the HCUR and LCUR probe’s poor contacts. The error display depends on the contact check and voltage level monitor states (see the table below).

– – – – – – –

This display appears after changing measurement settings and before the next measurement is performed.

Display Examples: Display Measurement State and Appearance with Open-Circuit Probe

Display Measurement State

Current Monitor Results Normal (PASS)

Fault (FAIL)

Contact Check Results
Voltage Level Monitor Results

Normal (PASS)

Display: Measured Value

Display: +OvrRng/ -OvrRng

COMP indicator: According to the COMP indicator: Hi/ Lo

measured value

(when connection to the measure-

ment object is broken)

Fault (FAIL)

Display: C.E. Hi/ C.E. Lo/ C.E. Volt Display: C.E. Hi/ C.E. Lo/ C.E. Volt

COMP indicator: No decision

COMP indicator: No decision

EXT. I/O: ERR signal output

EXT. I/O: ERR signal output

The measurement fault display differs according to detection order and settings.

39
3.8 Confirming Faulty Measurements

Measurement Fault Detection Order

Measurement Fault Detection
Probe Short Circuit
No Hi Wiring Contact Error
No Lo Wiring Contact Error
No Voltage Level Monitor Error
No Constant-Current Error
No Below Lower Limit
No Above Upper Limit
No No Measurement Data

Display
ERR: 021 Yes
C.E. Hi Yes
C.E. Lo Yes

EXT. I/O signal PRB_SHORT output, ERR output
ERR output, CE_HI output
ERR output, CE_LO output

C.E. Volt ERR output Yes

+OvrRng HI output Yes

-OvrRng LO output Yes

+OvrRng HI output Yes

– – – – – – – –

Measurement fault detection proceeds in the order shown at the left, ending with display of the first detected error.
Corresponding measurement
3 fault signals are also output at
the EXT. I/O connector.

Out-of-Range Detection Function
Examples of Out-of-Range Faults

Out-of-Range Detection

Measurement Example

The measured value is outside of the measurement range.

Attempting to measure 13 k with the 10 k range selected

The relative tolerance (%) display of the measured value exceeds the dis- Measuring 500 (+2400%) with a reference value of 20
play range (999.999%).

The zero-adjusted value is outside of In the 1 range with 0.5 zero-adjustment in effect, measuring 0.1 provides

the display range.

a zero-adjusted value of -0.4 , which is outside of the display range.

While measuring, input voltage exceed the A/D converter input range.

Measuring a large resistance value in an electrically noisy environment

Current Monitor Function
The instrument supplies constant measurement current through the DUT via the HCUR and LCUR probes. A current monitor fault occurs if constant current cannot be attained. If the contact check and voltage level monitor results are normal, the out-of-range and comparator result displays indicate “Hi”.
Example of Current Monitor Fault · Broken DUT (open work) · HCUR or LCUR probe contact fault · HCUR or LCUR cable break

40
3.8 Confirming Faulty Measurements

41
4.1 Making Range-Specific Measurement Settings

Customizing Measurement

Settings

Chapter 4

(set as needed)

Change measurement settings as appropriate for your application.

Refer to “Detailed Settings Screens” (p. 19) for the available settings.

4

4.1 Making Range-Specific Measurement Settings

These settings can be made for each range (except for the DELAY1 setting).

1 Open the Basic Settings screen.

The Basic Settings screen appears.

2 Open the Measurement Settings Screen.
1 Selection
3 Select the range to use.
1 Selection
2
4 Set the items as needed.

2
The Measurement Settings Screen appears. [MEAS SETTINGS]

42
4.2 Setting Pre-Measurement Delay

4.2 Setting Pre-Measurement Delay

This setting specifies the delay between trigger signal input and the start of measurement. Adjust this setting to delay measurement until the measured value has time to stabilize, so that even if the sample is connected after triggering, measurement starts only after the specified delay. The delay can be set by two methods, as follows.

Adjust this setting to allow for probe contact mechanical stabilization.

Set DELAY1
The DELAY1 setting is common to all ranges. The default setting is 0 ms (corresponding to trigger signal input at the same time as probe contacts become stable). Setting DELAY1 affects measurements in all ranges.

Adjust this setting to allow for stabilization of the measurement sample.

Set DELAY2
Set DELAY2 to the time needed for stabilization after measurement current is applied, such as may be required for inductive components. The setting affects only the selected range. The default setting is 0 ms (corresponding to resistance measurement of non-inductive components).

DELAY1 and DELAY2 Timing Chart

Probe Contact Condition
Start TRIG

Stable Contact

Measurement Current
Acquisition of Measured Value

Internal Delay*

Acquisition

End of Measurement Signal EOM

• Internal delay is provided to suit purely resistive (non-reactive) DUTs, and is different for each measurement range.

43
4.2 Setting Pre-Measurement Delay
Determining the Delay Time
Set the delay so that inductance does not affect measurements. To fine tune the delay, begin with a longer delay than necessary, then gradually shorten it while watching the measured value.
1 Open the Basic Settings screen.
The Basic Settings screen appears.

2 Open the Measurement Settings Screen.
1 Selection

4
2
The Measurement Settings Screen appears. [MEAS SETTINGS]

3 Set DELAY1 or DELAY2.
1 Selection 2

Tenkeys
DELAY1 is common to all ranges, while DELAY2 can be set for each range independently (p. 41).
Setting range: 0.0 ms (default) to 100.0 ms

3

4 Return to the Measurement screen.
The confirmation screen appears.

Return to the setting screen.
Save setting and return to previous screen.
Discard setting and return to previous screen.

44
4.3 Setting the Measurement Integration Time Option

4.3 Setting the Measurement Integration Time Option

The integration time can be optionally set for each range by selecting FAST, MED, or SLOW measurement speed. Integration time can be set in ms or PLC* units.

• PLC = Power Line Cycle, where one PLC is the period of the power line waveform. At 50 Hz, one PLC = 1/50th of a second, and at 60 Hz, one PLC = 1/60th of a second.
  PLC setting units are useful where measurements may be affected by power line noise (high- or low-resistance measure-
  ments)

Default Settings

Range
100m 1000m 10 100 1000 10k 100k 1000k 10M 100M

LOW POWER: OFF (p. 28) *1

Integration Time [INT]

FAST

MED SLOW

OVC

0.5 ms

5.0 ms

1PLC

ON *2

0.3 ms

2.5 ms

1PLC

ON *2

0.3 ms

2.5 ms

1PLC

ON *2

0.3 ms

3.0 ms

1PLC

OFF

0.3 ms

3.0 ms

1PLC

OFF

0.3 ms

3.0 ms

1PLC

OFF

0.5 ms

3.0 ms

1PLC

OFF

1.5 ms

5.0 ms

1PLC

OFF

2.5 ms

1PLC

1PLC

OFF

1PLC

2PLC

4PLC

OFF

LOW POWER: ON (p. 28) *1

Integration Time [INT]

FAST

MED

SLOW

OVC

–

–

–

–

0.5 ms 0.5 ms 0.3 ms 0.3 ms
–

5.0 ms 5.0 ms 2.5 ms 2.5 ms
–

1PLC 1PLC 1PLC 1PLC
–

ON 2 ON 2 ON 2 ON 2
–

–

–

–

–

–

–

–

–

–

–

–

–

–

–

–

–

1. Low Power = Low-Power Resistance Measurement (p. 28) 2. Two measurements are made within the above integration times.

1 Open the Basic Settings screen.

The Basic Settings screen appears.

2 Open the Measurement Settings Screen.
1 Selection

2
The Measurement Settings Screen appears. [MEAS SETTINGS] (The settings for the current measurement range are displayed.)

45
4.3 Setting the Measurement Integration Time Option

3 Select the integration setting units.
1
Selection
4 Select the integration time.

2
Set in units of time Set in units of power line cycles
The setting is specific to the selected range (p. 41)

1
Selection
2 3

4
Setting range: · When setting in ms units: 0.1ms to 100.0ms · When setting power-line-cycle units: 1 to 6PLC (60 Hz),
1 to 5PLC (50 Hz)

5 Return to the Measurement screen.
The confirmation screen appears.

Return to the setting screen.
Save setting and return to previous screen.
Discard setting and return to previous screen.

· The instruments accuracy specifications are applicable only with the default integration times. Investigate your measurement requirements carefully before changing the integration time.
· When the effects of power line noise can be ignored, the integration time can be set longer than the default to reduce scattering of measured values. On the other hand, if the integration time is too short, scattering increases. For high-or low-resistance and low-power resistance measurements that are easily affected by power line noise, we suggest setting according to the power line period (PLC units).

46
4.4 Checking for Poor or Improper Contact (Contact Check Function)
4.4 Checking for Poor or Improper Contact (Contact Check Function)
This function detects poor contact between the probes and DUT, and broken measurement cables. The instrument continually monitors the resistance between the HCUR and HPOT probes and the LCUR and LPOT probes from the start of integration (including response time) and while measuring. When the resistance is outside of the specified value, a contact check fault occurs and the C.E. Hi or C.E. Lo error message appears. No comparator decision is applied to the measured value. When these error messages appear, check the probe contacts, and check for broken measurement cables. If the error is not cleared by shorting the tips of a known-good measurement cable, the instrument requires repair.
· During low-resistance measurement, poor contact of the HCUR or LCUR probe may be detected as an out-ofrange measurement.
· When contact checking is disabled, measured values may be displayed even when a probe is not contacting the DUT.
1 Open the Basic Settings screen.
The Basic Settings screen appears.

2 Open the Measurement Settings Screen.
1 Selection

2
The Measurement Settings Screen appears. [MEAS SETTINGS]

3 Enable the Contact Check function.
1

2
Disables the function (go to step 5) Enables the function (default)

Selection

The setting is specific to the selected range (p. 41)

4

Select the contact check fault threshold resistance.

1

2

Selection

50, 100, 150, 200 (default), 300, 400, 500 A contact fault occurs when a measured value exceeds the threshold setting.

5 Return to the Measurement screen.
The confirmation screen appears.

Return to the setting screen.
Save setting and return to previous screen.
Discard setting and return to previous screen.

47
4.5 Improving Probe Contact (Contact Improver Function)

4.5 Improving Probe Contact (Contact Improver Function)

Probe contacts can be improved by applying current from the POT to the CUR probes before measuring.

The Contact Improver function applies voltage to the sample. Be careful when measuring samples with characteristics that may be affected.

The current used for the Contact Improver functions can be selected as follows.

17 mA, 25 mA, 35 mA (default), 50 mA

Higher current provides more effective contact improvement, but at the cost of faster probe deterioration. Contact Improver current can be set to be disabled (OFF), enabled (ON), or PULSE.

4

The PULSE setting applies the contact improvement current for about 100 µs immediately before measure-

ment. The PULSE setting is usefull to decrease Joule heating if the DUT is susceptible to its current.

DUT current * DUT voltage

100 m-range to 100 k-range 1 M to 100 M-range

2mA max. 20 V max.

60 mA max. 15 V max.

*1 Steady state value. A rush current of approximately 100 mA flows for 100µs, when a probe came in contact with DUT.

*: It takes several microseconds for the DUT current to reach the steady-state value. Until the steady-state value is reached, a transient current that is approximately equal to the contact improvement current setting (default setting: 35 mA) will flow.

Timing Chart

Probe Contact

(Contact Improver Function) Condition

Stable Contact

• Internal delay is different for each range.

Start TRIG

OFF setting

Measurement

Contact Improver current: Off

Internal DELAY 1 DELAY 2 delay *

Measuring

ON setting

Probe Contact Condition
Start TRIG

Measurement Contact Improver current: On

Stable Contact

Internal DELAY 1 DELAY 2 delay *

Measuring

PULSE setting

Probe Contact Condition
Start TRIG
Measurement

Contact Improver current: Pulse

Stable Contact

DELAY 1

Approx.
100 µs

Internal DELAY 2 delay *

Measuring

48
4.5 Improving Probe Contact (Contact Improver Function)
For ranges between 1000 k and 100 M, the [PULSE] setting is enabled by default. Before measuring in the ranges from 1000 k to 100 M with the Contact Improver function set to [ON], verify that measurements are not biased.
1 Open the Basic Settings screen.
The Basic Settings screen appears.

2 Open the Measurement Settings Screen.
1 Selection

2
The Measurement Settings Screen appears. [MEAS SETTINGS]

3 Set the Contact Improver current timing to disabled (OFF), enabled (ON), or PULSE.

1 Selection

2

Disable probe contact improvement

(go to step 4).

Enable probe contact improvement.

Apply contact improvement current for about 100 µs immediately before mea-
surement.

The setting is specific to the selected range(p. 41)

(When selecting ON or PULSE) Set the current limit value.
1
Selection

2
17mA, 25mA, 35mA (default), 50mA

4 Return to the Measurement screen.
The confirmation screen appears.

Return to the setting screen.
Save setting and return to previous screen.
Discard setting and return to previous screen.

49
4.6 Detecting Measurement Voltage Faults (Voltage Level Monitor Function)
4.6 Detecting Measurement Voltage Faults (Voltage Level Monitor Function)
When a measurement voltage fault occurs due to probe chattering, the C.E. Volt error message appears on the measurement screen and an ERR signal is output. The C.E. Volt error may also appear when external noise is strong.
Check the following if errors occur frequently: · Check for probe deterioration. · Provide additional noise suppression. “Appendix 3 Unstable Measurement Values” (p. A3) · Set the voltage level monitor to Loose, or OFF (disable).
4
1 Open the Basic Settings screen.
The Basic Settings screen appears.

2 Open the Measurement Settings Screen.
1 Selection

2
The Measurement Settings Screen appears. [MEAS SETTINGS]

3 Enable or disable the function.
1

2
Disables the function (go to step 5) Enables the function (default)

Selection

The setting is specific to the selected range (p. 41)

4 (When enabled (ON selected))
Select the voltage level monitor threshold.
1
Selection

2

Loose Normal Severe

*. Default setting: Loose is the default for the 100 M
range, and Normal for all
other ranges.

5 Return to the Measurement screen.
The confirmation screen appears.

Return to the setting screen.
Save setting and return to previous screen.
Discard setting and return to previous screen.

50
4.7 Applying Current Only When Measuring (Current Mode Setting)
4.7 Applying Current Only When Measuring (Current Mode Setting)
When the Contact Improver function is set to Pulse or disabled (CONT IMP: PULSE or OFF) and measurement current is set for pulse output, open-circuit voltage when not measuring does not exceed 20 mV.
See: “4.5 Improving Probe Contact (Contact Improver Function)” (p. 47)
When the Contact Improver function is enabled (CONT IMP: PULSE or ON setting), the current mode setting is ignored even if set to continuous (CURRENT MODE: CONT setting). The Contact Improver function forces pulse operation with measurement current applied only during measurement.
1 Open the Basic Settings screen.
The Basic Settings screen appears.

2 Open the Measurement Settings Screen.
1 Selection

2
The Measurement Settings Screen appears. [MEAS SETTINGS]

3 Select whether to apply current when not measuring.

2

Measurement current is applied while

1

awaiting trigger. Measurement current is applied only

while measuring (default).

Selection

The setting is specific to the selected range (p. 41)

To apply measurement current continuously (CONT setting) even when waiting for a trigger, confirm that the Contact Improver function is disabled (CONT IMP: OFF, (p. 47)).

4 Return to the Measurement screen.
The confirmation screen appears.

Return to the setting screen.
Save setting and return to previous screen.
Discard setting and return to previous screen.

51
4.8 Test for Short-Circuited Probe (Probe Short-Circuit Detection Function)

4.8 Test for Short-Circuited Probe (Probe Short-Circuit Detection Function)

Four-terminal measurements are not possible when a conductive foreign object is present between the POT and CUR probe tips. To detect short-circuited probes, this function measures the resistance between the CUR and POT terminals after a specific time (initially 5 ms) following the end of measurement. Probe short-circuit detection is disabled by default.

DUT Electrode DUT

POT CUR

When a probe short-circuit is detected, an error message appears on Foreign Object the measurement screen, and the PRB_SHORT and ERR signals are

4

output. (ERR:021 Probe short error)

Short-circuit detection can also be controlled by asserting the active-low PRB_CHECK EXT. I/O signal. Asserting the PRB_CHECK signal while measuring causes short-circuit detection to be performed after the end of measurement (p. 85).

About Probe Short-Circuit Detection
· If probes are connected to the DUT during probe short-circuit detection, the short circuit is detected. Ensure that the probes have sufficient time to separate from the measurement object.
· Probe short-circuit detection occurs within about 1 ms. · The threshold for probe short-circuit detection is fixed at 500 , so if the resistance between CUR and POT
probes is larger, detection is not possible.
Timing Chart (Probe Short-Circuit Detection)

Transport

Measurement stage

Contact

DUT1 contact

Transport

Transport

DUT2 contact

Probe short-circuit

Start TRIG
Measurement
End of Measurement EOM
Comparator Hi, IN, Lo
Probe short-circuit PRB_SHORT

DUT1 measurement

Short-Circuit Detection

DUT2 measurement

Detection timing setting Available

No Decision

Short-Circuit

· Even while the probe short-circuit detection function is set to be disabled, short-circuit detection is performed when the EXT. I/O PRB_CHECK signal is asserted.
· When the internal trigger [TRG: INT] source is selected, short-circuit detection is not performed after the end of measurement. However, short- circuit detection can still be executed by asserting the PRB_CHECK signal.

52
4.8 Test for Short-Circuited Probe (Probe Short-Circuit Detection Function)

Probe Short-Circuit Detection Enable/Disable
1 Open the Basic Settings screen.

The Basic Settings screen appears.

2 Open the System screen.
1 Selection
3 Enable or disable the function.
1
Selection

2
The System screen appears. [SYSTEM] 2
Disables the function (default) (go to step 5) Enables the function

4 (When enabled (ON selected))
Set the probe detection timing.
1
Selection

Short-circuit detection is delayed for the specified time following the end of measurement.

2

Setting range: 1 to 100 ms, 5 ms (default)

3

5 Return to the Measurement screen.
The confirmation screen appears.

Return to the setting screen.
Save setting and return to previous screen.
Discard setting and return to previous screen.

53
4.9 Comparing the Measurement Settings of Two Instruments (Settings Monitor Function)

4.9 Comparing the Measurement Settings of Two Instruments (Settings Monitor Function)

This function automatically compares the settings of two

instruments to determine whether they are the same.

2nd Stage

Only those measurement settings affecting the comparator and speed are compared. When the settings differ, an alarm notification appears and subsequent TRIG sig-

Automatic Comparison

1st Stage

nal input is prevented from starting measurement.

4

When the settings of two instruments match, TRIG input is accepted and measurement starts. However, if the range defined by the upper and lower thresholds of the second stage is broader than that of the first stage, measurement still starts despite the different threshold settings.

E DCBA
Transport Direction

1 Connect the two instruments’ SET MONITOR connectors together using a Hioki 9637 RS-232C cable.

2 Open the Basic Settings screen.

The SET MONITOR connectors are identical to RS-232C connectors. Be careful to avoid connecting the wrong connectors.
The Basic Settings screen appears.

3 Open the System screen.
1 Selection
4 Enable the function on both instruments.
1
Selection

2 The System screen appears. [SYSTEM] 2
Disables the function (default) Enables the function

54
4.9 Comparing the Measurement Settings of Two Instruments (Settings Monitor Function)

5 Select the instrument to serve as the 1st stage, and set its tolerance range.

1

2

Selection

Selects this instrument as the 1st stage Selects this instrument as the 2nd stage

Example: If the 1st stage is set to measure 12 ±0.800%, and the 2nd is to measure 12 ±1.000%, enter the difference in toler-
ance of 0.300%.

3

Enter the difference in tolerance (%) to be allowed at the 2nd stage from the tol-

erance range set for the 1st stage.

4

Setting range: 0.000 to 9.999%

6 Set the instrument to serve as the 2nd stage (another RM3542).

1

2

Selection

Selects this instrument as the 1st stage Selects this instrument as the 2nd stage

7 Return to the Measurement screen.
The confirmation screen appears.

Return to the setting screen.
Save setting and return to previous screen.
Discard setting and return to previous screen.

Tolerance Range Setting Conditions

Permissible tolerance is calculated using floating-point values, so the setting must be at least 0.001% larger than the difference between 2nd and 1st stage ranges. Set the upper and lower comparator thresholds according to the following conditions: 1st stage upper threshold < 2nd stage upper threshold 1st stage lower threshold > 2nd stage lower threshold

REF% setting 1st stage

2nd stage

ABS setting 1st stage

2nd stage

(upper limit) UPP [%] REF [] LOW [%] (lower limit)

Tolerance range [%]

(upper limit) UPP [] LOW [] (lower limit)

Tolerance range [%]

Tolerance range [%] > 2nd upper limit [%] – 1st upper limit [%]

Tolerance range[%]

2nd upper limit – 1st upper limit x 100
1st upper limit

Tolerance

1st lower limit – 2nd lower limit

range[%] >

1st lower limit

x 100

55
4.9 Comparing the Measurement Settings of Two Instruments (Settings Monitor Function)

Practical Example
SET MONITOR: ON 1st 0.300% (on the System screen)
1st Stage

SET MONITOR: ON 2nd (on the System screen)
2nd Stage

TRIG Input Accepted

1st Stage

When changing the reference value 2nd Stage

4
TRIG Input Inhibited

1st Stage

The error message appears when the settings do not match.
2nd Stage

Change the reference value to match the 1st stage
TRIG Input Accepted

When an error is displayed ERR:003 Setting monitor error. (COMP)
ERR:004 Setting monitor error. (SPEED)

Comparator settings do not match. Please check. Measurement speed settings do not match. Please check.

56
4.10 Retrying Measurement After a Fault (Retry Function)

4.10 Retrying Measurement After a Fault (Retry Function)

The Retry function causes measurement to be

automatically retried when a measurement fault

occurs due to probe chatter.

Probe Contact Condition

During Retry, all measurement operations including Con-

tact Improvement and DELAY2 (but excluding DELAY1) Start

are restarted.

TRIG

If a measurement fault persists after the specified contin- Contact

uous retry interval (e.g., if the DUT is not connected), Improver

retrying is aborted and the EOM signal is output. When Measurement Retry is enabled, the maximum time to end-of-measure- Current

ment occurs when recovering from a measurement fault Contact Check immediately before the retry interval expires, which

approaches the sum of the retry interval setting plus nor- End of Measurement

mal measurement time. Decreasing test throughput may EOM

indicate probe maintenance is required.

1 Open the Basic Settings screen.

Chatter Retry

The Basic Settings screen appears.

2 Open the System screen.
1 Selection
3 Select whether to enable or disable Retry.
1
Selection
4 (When enabled (ON selected)) Set the continuous retry interval.

2
The System screen appears. [SYSTEM] 2
Retry disabled (go to step 5) Retry enabled (default)

1

Selection

2

Setting range: 1 to 50 ms (default: 50 ms)

3

5 Return to the Measurement screen. The confirmation screen appears.

Return to the setting screen.
Save setting and return to previous screen.
Discard setting and return to previous screen.

57
4.11 Maintaining Measurement Precision (Self-Calibration)
4.11 Maintaining Measurement Precision (Self-Calibration)
To maintain measurement precision, the instrument self-calibrates every ten minutes to compensate for internal circuit offset voltage and gain drift. This function cannot be disabled. During self-calibration, the subsequent measurement is delayed for about 6PLC + 10 ms (PLC = Power Line Cycles) for internal circuit compensation.
Self-Calibration Timing Within 130 ms at 50 Hz, or 110 ms at 60 Hz
4 · When the timing of self-calibration overlaps with a measurement, self- calibration is postponed until the end of measurement. · When a trigger signal is applied during self-calibration, the start of the triggered measurement is postponed
until self-calibration is finished. · Self-calibration executes automatically after changing comparator or measurement speed settings. · During self- calibration, measurement current and the Contact Improver current are inhibited.
4.12 Compensating for Thermal EMF Offset (Offset Voltage Compensation – OVC)
This function automatically compensates for offset voltage resulting from thermal emf or internal instrument bias. (OVC: Offset Voltage Compensation)
See: “Appendix 2 Effect of Thermal emf” (p. A2)
The following value is known to be a true resistance value from RP (>0), the value measured with current flowing in the positive direction, and RN (<0), the value measured with current flowing in the negative direction.
R—–P—–­—–R—-N–2
Offset voltage compensation is automatically enabled in the following conditions, and cannot be modified or disabled: · When a range from 100 m to 10 is selected. · When low-power resistance measurement is enabled (LOW POWER: ON).
When the test object is inductive, some delay (DELAY2) is required (p. 42) to allow adequate current flow before starting measurement.

58
4.12 Compensating for Thermal EMF Offset (Offset Voltage Compensation – OVC)

59
5.1 Disabling and Enabling Key Operations

System Settings

5.1 Disabling and Enabling Key Operations

Disabling Key Operations (Key-Lock Function)

Activate the key-lock function to disable the instrument’s front panel key operations. Three key-lock levels are available to suit specific purposes.

Only comparator settings are enabled.

Disabling All Except Comparator Settings
5 Key operations other than comparator settings (REF%, ABS, units and tenkeys)
and F1 [UNLOCK] keys are disabled. To disable key operations: select [MENU] [M.LOCK] is displayed when returning to the measurement screen.

Key operations to change settings are disabled (although keylock can be canceled).

Disabling All Key Operations Including Comparator Settings
All key operations except F1 [UNLOCK] are disabled. To disable key operations: select [FULL] [F.LOCK] is displayed when returning to the measurement screen.

All key operations are disabled.

Disabling All Panel Keys
Asserting (Low) the EXT. I/O KEY_LOCK signal disables all panel keys, including F1 [UNLOCK] and F1 [LOCAL] (disables remote control) (p. 85). To disable the key-lock function and re-enable the keys, de-assert (High) the KEY_LOCK signal.

1 Open the Basic Settings screen.

The Basic Settings screen appears.

2 Enable or disable key operations.
1 Selection
3 Return to the Measurement screen.

2
Key operations enabled (default) Disable all except key-lock cancel Disable all except key-lock cancel and comparator setting change
[UNLOCK] is displayed only when key-lock is enabled by front panel key operations.

60
5.1 Disabling and Enabling Key Operations
Re-Enabling Key Operations (Key-Lock Cancel)
Key-lock can be canceled only when [UNLOCK] is displayed. Press and hold F1 [UNLOCK] for one second.
If key operations are disabled by the KEY_LOCK signal, de-assert (High) the signal to unlock the keys.

61
5.2 Setting the Comparator Decision and Key Beepers
5.2 Setting the Comparator Decision and Key Beepers

Enabling or Disabling the Key Beeper

The key beeper sound can be enabled and disabled. The key beeper is enabled (ON) by default.
1 Open the Basic Settings screen.

The Basic Settings screen appears.

5
2 Open the System screen.

1 Selection

2
The System screen appears. [SYSTEM]

3 Select whether to enable or disable the key beeper.

2

Disables the beeper

1

Enables the beeper (default)

Selection

4 Return to the Measurement screen.
The confirmation screen appears.

Return to the setting screen.
Save setting and return to previous screen.
Discard setting and return to previous screen.

62
5.2 Setting the Comparator Decision and Key Beepers
Setting the Comparator Decision (“JUDGE”) Beeper
The comparator decision beeper can be enabled and disabled. The decision beeper is disabled (OFF) by default.
1 Open the Basic Settings screen.
The Basic Settings screen appears.

2 Open the System screen.

1 Selection

2
The System screen appears. [SYSTEM]

3 Select whether to enable or disable the decision beeper.

2

Disables the beeper (default)

1

Enables the beeper

Selection
4 (When enabled (ON selected))
Select the decision beep conditions.
1
Selection
5 Return to the Measurement screen.
The confirmation screen appears.

2 IN (beep when within range)
HI/LO (beep when out of range) LOW (beep when below lower threshold) HIGH (beep when above upper threshold)
Return to the setting screen. Save setting and return to previous screen. Discard setting and return to previous screen.

63
5.3 Power Line Frequency Manual Setting
5.3 Power Line Frequency Manual Setting
For proper electrical noise suppression, the instrument needs to be set to match the power line frequency. With the default setting (AUTO), the instrument attempts to automatically detect the line frequency, but manual setting is also available. Unless the line frequency is set correctly, measured values may be unstable. An error message appears if line noise is high enough to prevent correct frequency detection (ERR:041(p. 181)). In that case, set the instrument’s line frequency manually.

When the AUTO setting is selected, the line frequency is automatically set to 50 or 60 Hz when the instrument is turned on or reset.

However, automatic detection is not available when the line frequency changes after turning power on or

resetting.

If the actual line frequency deviates from 50 or 60 Hz, select the closest frequency. Examples:

5

If the actual line frequency is 50.8 Hz, select the 50 Hz setting.

If the actual line frequency is 59.3 Hz, select the 60 Hz setting.

1 Open the Basic Settings screen.

The Basic Settings screen appears.

2 Open the System screen.

1 Selection
3 Select the line frequency being used.
1
Selection
4 Return to the Measurement screen.
The confirmation screen appears.

2
The System screen appears. [SYSTEM] 2 Automatically detect local line frequency (default) When the line frequency is 50 Hz When the line frequency is 60 Hz
Return to the setting screen. Save setting and return to previous screen. Discard setting and return to previous screen.

64
5.4 Setting the Clock
5.4 Setting the Clock
To record and print the correct time when using statistical calculations (p. 74), the clock needs to be set correctly. The time of printing is also output when printing statistical calculation results.
1 Open the Basic Settings screen.
The Basic Settings screen appears.

2 Open the System screen.
1 Selection
3 Set the date and time.

2
The System screen appears. [SYSTEM]

1

Selection
2

Enter the last two digits of the year, and the month, day, hour, minutes and seconds in that order (the cursor moves automatically). Enter two digits for all values (e.g., 09).

4 Return to the Measurement screen.

Clock settings cannot be canceled.

65
5.5 Adjusting Screen Contrast
5.5 Adjusting Screen Contrast
The screen may become hard to see when ambient temperature changes. In this case, adjust the contrast.
1 Open the Basic Settings screen.
The Basic Settings screen appears.

2 Open the System screen.

1 Selection
3 Adjust the contrast.
1

2

5

The System screen appears.

[SYSTEM]

2
0 to 100%, 5% step (default: 50%)

Selection
4 Return to the Measurement screen.
The confirmation screen appears.

Return to the setting screen.
Save setting and return to previous screen.
Discard setting and return to previous screen.

66
5.6 Adjusting the Backlight
5.6 Adjusting the Backlight
Adjust backlight brightness to suit ambient illumination.
· When external (EXT) triggering is selected, backlight brightness is automatically reduced after non-operation for one minute.
· Be aware that the display may be hard to see when brightness is set too low (near 0%).
1 Open the Basic Settings screen.
The Basic Settings screen appears.

2 Open the System screen.

1 Selection
3 Adjust the backlight.
1

2
The System screen appears. [SYSTEM] 2
0 to 100%, 5% step, (default: 80%)

Selection
4 Return to the Measurement screen.
The confirmation screen appears.

Return to the setting screen.
Save setting and return to previous screen.
Discard setting and return to previous screen.

67
5.7 Initializing (Reset)

5.7 Initializing (Reset)

The instrument can be reset by three methods.
· System reset from the System screen: Returns all settings (except the clock) to factory defaults. · Turn the instrument on while simultaneously holding the REF% and ABS keys: Returns all settings (except
the clock) to factory defaults. · Reset by remote control command: returns all settings (except communication and clock settings) to their
factory defaults.
RST command (non-backup, (p. 123)) :SYSTem:RESet command (p. 137)
This procedure describes system reset from the System screen.

1 Open the Basic Settings screen.

The Basic Settings screen appears.

5

2 Open the System screen.

1 Selection
3 Select RESET.
1

2
The System screen appears. [SYSTEM] 2
Returns all settings to their factory defaults

Selection
4 Select whether to cancel or proceed to execute system reset.
Cancel the operation

Execute The Measurement screen is displayed when system reset finishes.

68
5.7 Initializing (Reset)

Default Settings

Display
MENU MISC MEAS
DATA
SYSTEM

TRG
RANGE
SPEED 0ADJ COMP LOCK MISC

Setting value

Default Settings

INT/ EXT/ MANU / [Low Power: Off] 100m/ 1000m/ 10/ 100/ 1000/ 10k/ 100k/ 1000k/ 10M/ 100M [Low Power: On] 1000m/ 10/ 100/ 1000 SLOW/ MED/ FAST

EXT 100 M FAST

OFF/ ON

OFF

OFF/ ON

ON

OFF/ FULL / MENU

OFF

MEAS/ DATA/ SYSTEM

Setting Description Trigger source selection (p. 30)
Range selection (p. 31)
Measurement speed (p. 29) Zero adjustment (p. 32) Comparator function(p. 34) Key-Lock function (p. 59) (Miscellaneous settings)

DELAY1 DELAY2 INT (FAST) INT (MED) INT (SLOW)
CONT CHECK

0 to 100 ms (all ranges) 0 to 100 ms
0.1 ms to 100 ms 1PLC to 6PLC (60 Hz) 1PLC to 5PLC (50 Hz)
OFF/ ON 50 / 100 / 150 / 200 / 300 / 400 / 500

CONT IMP

OFF/ ON/ PULSE 17 mA/ 25 mA/ 35 mA/ 50 mA

VOLT

OFF/ ON

MONITOR

LOOSE/ NORMAL/ SEVERE

CURRENT MODE

CONT/ PULSE

AUTO MEMO-

RY

OFF/ ON

STATISTICS OFF/ ON

DATA OUT

OFF/ ON

SET MONITOR

OFF/ ON, 1st/ 2nd, 0.000% to 9.999%

PROBE CHECK

OFF/ ON, 0 to 100 ms

RETRY

OFF/ ON, 1 to 50 ms

TRIG EDGE OFF EDGE/ ON EDGE

EOM

PULSE/ HOLD 1 to 100 ms

INTERFACE GP-IB/ RS232C/ PRINT

LOW POWER OFF/ ON

JUDGE BEEP
KEY BEEP CLOCK LINE FREQ CONTRAST BACK LIGHT RESET ADJUST

OFF/ ON IN/ HI/LO/ LOW/ HIGH OFF/ ON
AUTO/ 50 Hz/ 60 Hz 0 to 100 0 to 100 –

0 ms 0 ms

Probe delay setting (p. 42) DUT response setting (p. 42)

Depends on measurement range Integration time (p. 44)

ON, 200

Contact-check (p. 46)

ON, 35 mA (range from 100 m to

100 k) PULSE, 35 mA (range from1000

Contact Improvement (p. 47)

k to 100 M)

ON, NORMAL (LOOSE when 100 Range)

Voltage level monitor (p. 49)

PULSE

Current mode setting (p. 50)

OFF
OFF OFF OFF, 1st, 0.000%

Auto-Memory function (p. 71)
Statistical calculation function (p. 74) Data output function (p. 77)
Settings Monitor function (p. 53)

OFF, 5 ms
ON, 50 ms ON EDGE PULSE, 5 ms RS232C, 9600bps GP-IB, ADR01, LF OFF
OFF, HI/LO ON
AUTO 50 80 –

Probe short-circuit detection (p. 51)
Retry function (p. 56) Start Logic Setting (p. 94) End-of-measurement pulse width (p. 93)
Interface setting (p. 101)
Low-Power Resistance Measurement (p. 28)
Comparator decision beeper (p. 61)
Key beeper (p. 59) Clock setting (p. 64) Line frequency (detection) (p. 63) Screen contrast adjustment (p. 65) Screen backlight adjustment (p. 66) Reset (p. 67) Calibration (p. A13)

69

Storing and Exporting Data

Chapter 6

Measured values can be stored or automatically exported, according to application. Stored data can be output to a printer, RS-232C or GP-IB. Also, statistical calculations can be applied to internally stored data.

Stored measurements are lost when the instrument is turned off. Therefore, be sure to print out or export important data to a PC.

Store measured values at specific times.
This is convenient for batch exporting data to a controller while switching reels.

Data Memory Function (p. 70)
Store up to 30,000 measured values using the EXT. I/O TRIG signal or by pressing F4 [MANU] on the Basic Settings screen.
6

Store data after measured value has stabilized.
This is convenient for sample inspection after printing (vapor deposition) resistors on a board.

Auto-Memory Function (p. 71)
Measured values are automatically stored as they become stable. When the specified number of data points (up to 99) is acquired, the beeper sounds and auto-storing halts.

Automatically output (export) measurements at the end of measurement.

Data Output Function (p. 77)
Minimizes transfer time by eliminating the need for transmit requests from the remote controller. (RS-232C interface only)

70
6.1 Storing Data at Specific Times (Data Memory Function)
6.1 Storing Data at Specific Times (Data Memory Function)
Measured values are stored in the instrument’s internal memory according to the following timings. (up to 30,000 points)
· Every time a measurement is performed by external (EXT) triggering · When a trigger is applied during internally (INT) triggered measurement
The following three storage methods are available: · Store upon receiving an EXT. I/O TRIG signal (p. 85)
· Store upon receiving a TRG command (p. 126)
· Store by pressing the F4 [MANU] key on the [MENU] ­ [TRG] setting screen.

· This function can only be enabled by remote control. The data memory function should be enabled by remote control beforehand. This setting is not available from the front panel.
· Stored memory data cannot be viewed on the instrument’s screen. Use remote control commands to export stored data.
Data Memory Function Operating Procedure
1 Enable data memory mode.
Send this remote command to enable the data memory function:
:MEMory:MODE MEMory (p. 142)
2 Store measured values.
Execute external trigger measurement, or apply a trigger during internally triggered measurement.
3 Export the stored data.
Send this remote command to export the measured values stored in the instrument:
:MEMory:DATA? (p. 143)
4 Clear measurement data from instrument memory.
Send this remote command to erase the data from instrument memory:
:MEMory:CLEar (p. 142)

Stored data is automatically erased at the following times:

· when the memory function setting (including auto-mem- · when printing the statistical calculations (p. 82)

ory) is changed (p. 142)

· when the DUT is changed (p. 28)

· when the range is changed (p. 31)

· upon system reset (p. 67)

· when changing comparator settings (p. 34)

71
6.2 Store as soon as Measurement is Stable (Auto-Memory Function)

6.2 Store as soon as Measurement is Stable (Auto-Memory Function)
This function automatically stores the value measured each time the probes contact the sample with internal triggering. When the specified number of values has been acquired, auto-storage operation stops. Statistical calculations are applied to the stored data, with results output to the screen or printer (RS232C).
See: “6.3 Performing Statistical Calculations on Measured Values” (p. 74) “Chapter 7 Printing” (p. 79)

Data storage and printing can be automatically controlled by the Auto-Memory function.

Prepare the printer (p. 79).
Enable Auto-Memory and set the number of values to store.

Set decision criteria Measure (p. 34).

Printing (p. 82)

Beeper notifies when the specified number of values is stored.
6
The Auto-Memory function is disabled by default. Enable the Auto-Memory function before setting the number of values to store.
Enabling the Auto-Memory function affects other functions as follows: · Statistical calculation is forced on. · The voltage level monitor function is forced off (although the setting itself is not set to OFF, the function is
actually disabled). · The trigger source setting is forced to internal (INT).

When the trigger source is set to external (EXT), the Auto-Memory function is disabled by force.

Deleting Stored Data Stored data is automatically erased at the following times:

· when the memory function setting (including auto-mem- · when printing the statistical calculations (p. 82)

ory) is changed (p. 142)

· when the DUT is changed (p. 28)

· when the range is changed (p. 31)

· upon system reset (p. 67)

· when changing comparator settings (p. 34)

· upon setting the auto-memory number of values to store

· when the power is turned off

(p. 73)

72
6.2 Store as soon as Measurement is Stable (Auto-Memory Function)

Enabling the Auto-Memory Function
1 Open the Basic Settings screen.

The Basic Settings screen appears.

2 Open the Data Memory Settings screen.
1 Selection
3 Enable the function.
1
Selection

2
The Data Settings screen appears. [DATA SETTINGS] 2
Disable the function (default) Enable the function

4

Return to the Measurement screen.
The confirmation screen appears.
When the function is enabled

Return to the setting screen.
Save setting and return to previous screen.
Discard setting and return to previous screen.

73
6.2 Store as soon as Measurement is Stable (Auto-Memory Function)
Setting the Number of Values to Store
1 Open the Auto-Memory Settings screen.

Total Count Pass Count (IN) Fail Count (Hi/Lo)
2 Enter the number of values to store.

Displays the Auto-Memory setting screen

Setting range: 1 to 99

To Reset Numerical Values
Deletes entered digits. This key is enabled only when entering numerical values.

To abort the setting process, press

. Settings are abandoned and the display returns to the pre-

vious screen.

6

3 Accept the settings and return to the Measurement screen.

(Example: 20 values set to be stored)

Acquiring Measured Values Automatically
1 Momentarily disconnect (open-circuit) the probes. 2 Connect the probes to the DUT.

When the measurement is stable, the value is automatically stored and the count is incremented. When the count reaches the specified number of values, a long beep sounds, and subsequent measurements are not stored. The (one) last acquired value can be deleted (Undo function (p. 76)).

74
6.3 Performing Statistical Calculations on Measured Values

6.3 Performing Statistical Calculations on Measured Values

Statistical calculations can be performed on up to 30,000 measured values, with results displayed. Printing is also available (p. 82).

Calculation types: average, maximum and minimum values, population standard deviation, sample standard deviation, process compatibility indices

Maximum value Minimum value
Average

Xmax = MAX (x1, ….., xn) Xmin = MIN (x1, ….., xn)
x = x n

Population standard deviation

Standard deviation of sample

Process capability index (dispersion) *

Cp =

Hi – Lo 6 n-1

Process capability index (bias)*

In these formulas, n represents the number of valid data samples.
Hi and Lo are the upper and lower thresholds of the comparator.
*. The process capability indices represent the quality achievement capability created by a process, which is the breadth of the dispersion and bias of the process’ quality. Generally, depending on the values of Cp and CpK, process capability is evaluated as follows: Cp, CpK>1.33 ……… Process capability is ideal 1.33Cp, CpK>1.00 Process capability is adequate 1.00Cp, CpK ……… Process capability is inadequate

· When only one valid data sample exists, standard deviation of sample and process capability indices are not displayed.
· When n-1 = 0, Cp and CpK are 99.99. · The upper limit of Cp and CpK is 99.99. If Cp or CpK exceeds 99.99, the value 99.99 is displayed · Negative values of CpK are handled as CpK = 0. · If statistical calculation is turned off and then back on without first clearing calculation results, calculation
resumes from the point when it was turned off. · Measurement speed is restricted when statistical calculation is enabled. · When Auto-Memory is enabled (ON), statistical calculation is enabled (ON) by force. · When statistical calculation is disabled (OFF), Auto-Memory is disabled (OFF) by force.

Deleting Statistical Calculation Results Stored data is automatically erased at the following times:

· when the memory function setting (including data-mem- · when printing the statistical calculations (p. 82)

ory) is changed (p. 142)

· when the DUT is changed (p. 28)

· when the range is changed (p. 31)

· upon system reset (p. 67)

· when changing comparator settings (p. 34)

· upon setting the auto-memory number of values to store

(p. 73)

75
6.3 Performing Statistical Calculations on Measured Values

Using Statistical Calculations

When statistical calculation is enabled and an EXT. I/O trigger signal is applied, operation is as follows depending on the trigger source setting:
· With external (EXT) triggering: One measurement is performed and subjected to statistical calculation. · With internal (INT) triggering: The next measured value after the trigger signal is subjected to statistical cal-
culation.

Operation is the same in the following cases:
(Key Operations)
· when pressing the F4 [MANU] key on the [MENU] [TRG] selection screen
· when pressing the F2 [PRINT] key on the Measurement screen (with internal triggering and Auto-Memory disabled. Appears only when the interface is set for the printer.)
· when acquiring measured values by the Auto-Memory function (p. 71)

(Remote Control)
· when a TRG remote control command is received
· when an EXT. I/O print signal is applied on the Measurement screen (with internal triggering and Auto-Memory disabled)

1 Open the Basic Settings screen.

The Basic Settings screen appears.

6

2 Open the Data Memory Settings screen.
1 Selection

2
The Data Settings screen appears. [DATA SETTINGS]

3 Enable or disable statistical calculation.
1
Selection
4 Return to the Measurement screen.
The confirmation screen appears.

2
Disable statistical calculation (default) Enable statistical calculation
Return to the setting screen. Save setting and return to previous screen. Discard setting and return to previous screen.

When statistical calculation is enabled, F3 [STAT] appears on the Measurement screen. Confirm calculation results (p. 76)

76
6.3 Performing Statistical Calculations on Measured Values
Confirming, Printing, and Erasing Calculation Results
Statistical calculation results are displayed on the screen. Printing is also available with the commercially available printer with a serial interface. Calculation results are automatically erased after printing. Before printing, select the [PRINT] interface setting.
See: “7.2 Instrument Settings” (p. 81)
The number of valid samples can be confirmed on the Calculation Results screen. · When the number of valid samples is zero, no calculation results are displayed. · When only one valid data sample exists, no standard deviation or process capability indices are displayed.
1 Display the Calculation Results screen.
Displays the Calculation Results screen (if statistical calculation is enabled).

Num Ave Max Min

Total data count Mean Maximum Minimum

Val Sn Sn1 Cp Cpk

Number of valid measured values (error-free data) Population standard deviation Standard deviation of sample Process capability index (dispersion) Process capability index (bias)

2 To print
To print, select the printer as the interface setting on the System screen (p. 81)

Output to the printer. “Example Printouts” (p. 83)
Statistical calculation results and stored data are erased when printing finishes.
To erase

Erases the last measurement and calculation result (executes only once). Erases all measured values and statistical calculation results.
After selecting, a confirmation screen appears.

77
6.4 Auto-Exporting Measured Values (at End of Measurement) (Data Output Function)
6.4 Auto-Exporting Measured Values (at End of Measurement) (Data Output Function)
At the end of measurement, the measured value is exported to a computer via RS-232C.
See: “Chapter 9 Communications (RS-232C/ GP-IB Interface)” (p. 97)

· Set the interface to [RS232C] beforehand. This function is not applicable to the GP-IB Interface.
See:”9.4 Configuring the Communications Protocol” (p. 101) · When internal (INT) triggering is selected, data is exported only when a TRIG signal is applied.
· Executing a :READ? query command exports duplicate measured values.
· For other queries, be careful to avoid overlapping query response timing with auto-exporting measured values.
· The data format for measured values can be selected as ASCII (default) or BINARY. Transfer time is minimized when BINARY is selected.
See:”:SYSTem:FORMat <ASCii/ BINary>” (p. 137)

1 Open the Basic Settings screen.

6
The Basic Settings screen appears.

2 Open the Data Memory Settings screen.
1 Selection

2
The Data Settings screen appears. [DATA SETTINGS]

3 Enable or disable auto-exporting (DATA OUT)
2 1
Selection

Disable auto-exporting (default) Enable auto-exporting

4 Return to the Measurement screen.
The confirmation screen appears.

Return to the setting screen.
Save setting and return to previous screen.
Discard setting and return to previous screen.

78
6.4 Auto-Exporting Measured Values (at End of Measurement) (Data Output Function)

Printing

79
7.1 Connecting the Printer
Chapter 7

Connecting the printer to the instrument

Make instrument settings (p. 81)

Make printer settings

Printing (p. 82) · Measurement values and
comparator decisions · Statistical calculation
results

7.1 Connecting the Printer
Before connecting the printer
Because electric shock and instrument damage hazards are present, always follow the steps below when connecting the printer. · Always turn off the instrument and the printer before connecting.
7 · A serious hazard can occur if a wire becomes dislocated and contacts another conductor during operation. Make certain connections are secure.
· As much as possible, avoid printing in hot and humid environments. Otherwise, printer life may be severely shortened.
· Use only compatible recording paper in the printer. Using non-specified paper may not only result in faulty printing, but printing may become impossible.
· If the recording paper is skewed on the roller, paper jams may result.
Compatible printer
The requirements for a printer to be connected to the instrument are as follows. Confirm compatibility and make the appropriate settings on the printer before connecting it to the instrument. See: “7.2 Instrument Settings” (p. 81)
· Interface ………………………….. RS-232C · Characters per line ……………. At least 45 · Communication speed……….. 9600 bps · Data bits ………………………….. 8 · Parity ………………………………. none · Stop bits…………………………… 1 · Flow control ……………………… none

80
7.1 Connecting the Printer

Connecting the Printer to the Instrument

Connection Methods
Printer (Example)
2 3
AC adapter RS-232C Cable

1 Confirm that the instrument and the printer
are turned off.
2 Connect the AC adapter to the printer, and
insert the power plug into an outlet.
3 Connect the RS-232C cable to the RS-232C
connectors on the instrument and printer.
4 Turn the instrument and printer on.

Connector Pinouts
1 2 3 4 5

6 7 8 9
RM3542 (9-pin) Connector

Function

Signal Name

Pin

Receive Data

RxD

2

Transmit Data

TxD

3

Signal or Common Ground GND

5

13 ………………….. 1

25 ………………….. 14
9670 Printer (25-pin) Connector (Example)

Pin

Signal Name

2

TxD

3

RxD

7

GND

4

RTS

5

CTS

Function
Transmit Data Receive Data Signal or Common Ground Request to Send Clear to Send

7.2 Instrument Settings
1 Open the Basic Settings screen.

81
7.2 Instrument Settings
The Basic Settings screen appears.

2 Open the System screen.

1 Selection

2
The System screen appears. [SYSTEM]

3 Select PRINT as the interface type.
2

1
Selection
4 Return to the Measurement screen.
The confirmation screen appears.

To use the printer
7
Return to the setting screen. Save setting and return to previous screen. Discard setting and return to previous screen.

82
7.3 Printing
7.3 Printing
Before Printing
Verify that the instrument and printer settings (p. 81) are correct.
Printing Measured Values and Comparator Decisions Printing by key operation
Press the PRINT key to print the measured value currently displayed on the Measurement screen.
Printing by external control
Measured values and comparator decisions print when the (active-low) PRINT signal (EXT. I/O connector) is connected to ISO_GND. ISO_GND is a pin in the instrument’s EXT. I/O connector.
When statistical calculation is enabled [STATISTIC: ON] and internal triggering [TRG: INT] is selected, statistical calculations are performed and measured values are printed. When external (EXT) triggering is selected, only measured values are printed. Use the TRIG signal to perform statistical calculations with external triggering.
Printing Statistical Calculation Results
Statistical calculation results can be printed when auto-memory or statistical calculation is enabled (ON). To print, select PRINT on the screen or connect the (active-low) PRINT signal on the EXT. I/O connector to ISO_GND.
To enable auto-memory: See: “6.2 Store as soon as Measurement is Stable (Auto- Memory Function)” (p. 71) To enable statistical calculation: See: “6.3 Performing Statistical Calculations on Measured Values” (p. 74) (When statistical calculation is enabled)
If no valid data exists, only the data count is printed. When only one valid data sample exists, standard deviation of sample and process capability indices cannot be printed.

Example Printouts

Resistance measurements

1 0.8725mOhm Lo

2

0.484mOhm Lo

3 10.99998 Ohm IN

4 -10.0026 Ohm Lo

27 9.9986 Ohm Hi

28

9.996 Ohm Hi

29 0.01003kOhm Hi

30 0.00012MOhm Hi

Measurement fault values

1 OvrRng

Hi

2 -OvrRng

Lo

3 C.E.Hi

—

4 C.E.Lo

—

5 C.E.Volt

—

6 ——–

—

83
7.3 Printing

Auto-memory data and statistical calculation results

Date: 09-02-01 Time: 06:18:00

Ref: 1000.000 Ohm Upp: +1.000% Low: -1.500%

1 999.885 Ohm -0.011% IN

2 1001.885 Ohm +0.189% IN

3 1002.394 Ohm +0.239% IN

4 1002.892 Ohm +0.289% IN

5 1012.894 Ohm +1.289% Hi

6 1000.897 Ohm +0.090% IN

7 998.902 Ohm -0.110% IN

8 994.888 Ohm -0.511% IN

9 1000.391 Ohm +0.039% IN

10 979.892 Ohm -2.011% Lo

Hi: 1 IN: 8 Lo: 1 OR: 0

Number: 10 Valid: 10

Max 1012.894 Ohm +1.289% ( 5)

Min 979.892 Ohm -2.011% ( 10)

Avg 999.492 Ohm -0.051%

Sn

7.83568 Ohm

Sn-1 8.25953 Ohm

Cp

0.50

CpK

0.42

· The “Valid” statistical calculation result indicates the number (count) of data samples not subject to errors such as measurement faults.
· Among the comparator decision result counts (Hi, IN, Lo, and OR), “OR” indicates the number (count) of out-of-range measurements.
7

84
7.3 Printing

85
8.1 External Input/Output Connector and Signals
External Control Chapter 8

The EXT. I/O connector on the rear of the instrument supports external control by providing output of the end-of-measurement and comparator decision signals, and accepting input of measurement trigger and key-lock signals. All signals are isolated by optocouplers (inputs and outputs share a common signal ground).
Confirm input and output ratings, understand the safety precautions for connecting a control system, and use accordingly.

Connect the instrument’s EXT. I/O connector to the signal output or input device.

Make instrument settings (p. 93)

Signal input/output

8.1 External Input/Output Connector and Signals

8 To avoid electric shock or damage to the equipment, always observe the following
precautions when connecting to the EXT. I/O terminals. · Always turn off the power to the instrument and to any devices to be connected
before making connections.
· During operation, a wire becoming dislocated and contacting another conductive object can be serious hazard. Make sure that connections are secure and use screws to secure the external connectors.
· Ensure that devices and systems to be connected to the EXT. I/O terminals are properly isolated.

To avoid damage to the instrument, observe the following cautions: · Do not apply voltage or current to the EXT. I/O terminals that exceeds their ratings. · When driving relays, be sure to install diodes to absorb counter- electromotive force.
· Be careful not to short-circuit ISO_5V to ISO_COM. · Be careful not to short-circuit ISO_12V to ISO_COM.
See: “Connector Type and Signal Pinouts” (p. 86)

86
8.1 External Input/Output Connector and Signals
Connector Type and Signal Pinouts

TRIG (Reserved) KEY_LOCK (Reserved) (Reserved)
0ADJ HOLD ISO_5V ISO_COM
ERR HI LO
CE_HI (Reserved) (Reserved) (Reserved) (Reserved) (Reserved) (Reserved)

Connector: (Instrument Side) 37-pin D-sub female with #4-40 screws

19 18 17 16 15 14 13 12 11 10 9 8 7 6 5 4 3 2 1 37 36 35 34 33 32 31 30 29 28 27 26 25 24 23 22 21 20

(Reserved) CAL (Reserved) (Reserved) PRB_CHECK (Reserved) PRINT ISO_COM EOM INDEX IN PRB_SHORT CE_LO (Reserved) (Reserved) (Reserved) (Reserved) ISO_12V

Mating Connectors: DC-37P-ULR (solder type) / DCSP-JB37PR (pressure weld type) Japan Aviation Electronics Industry Ltd.

EXT. I/O Connector (Instrument Side) Pos: positive, Neg: negative, -: not applicable

Pin Signal name I/O

Function

1 TRIG

IN External trigger

2 (Reserved)

—

Logic

Pos/ Neg

Edge

—

3 KEY_LOCK 4 (Reserved) 5 (Reserved)

IN Key-Lock — —

Neg Level
— —

6 0ADJ 7 HOLD 8 ISO_5V 9 ISO_COM

IN

Execute zero-adjust

Neg Edge

IN

Enable external triggering

Neg Level

–

Isolated 5 V power output

–

–

–

Isolated common signal ground

–

–

10 ERR

OUT Measurement fault Neg Level

11 HI
12 LO
13 CE_HI 14 (Reserved) 15 (Reserved) 16 (Reserved) 17 (Reserved) 18 (Reserved) 19 (Reserved)

OUT

HI comparator decision

OUT

LO comparator decision

OUT

Probe (HI side) contact error

—

—

—

—

—

—

Neg Level
Neg Level
Neg Level
— — — — — —

Pin Signal name 20 (Reserved)

I/O —

Function

Logic —

21 CAL 22 (Reserved) 23 (Reserved)

IN

Execute self-calibration

Neg

Edge

—

—

—

—

24 PRB_CHECK

IN

Execute probe shortcircuit detection

Neg

Edge

25 (Reserved)

—

—

26 PRINT 27 ISO_COM

IN

Print measured value

Neg Edge

–

Isolated common signal ground

—

28 EOM

OUT End of measurement Neg Edge

29 INDEX

OUT

Analog measurement finished

Neg Edge

30 IN

OUT

IN comparator decision

Neg Level

31

PRB_SHORT

OUT

Probe short-circuit error

Neg Level

32 CE_LO
33 (Reserved) 34 (Reserved) 35 (Reserved) 36 (Reserved)

OUT

Probe (LO side) contact error

—

—

—

—

Neg Level
— — — —

37 ISO_12V

–

Isolated 12V power output

–

–

Reserved pins are not connected inside the instrument. Do not connect to reserved pins.

· The 0ADJ signal should be asserted (Low) for at least 10 ms. · The connector shell is conductively connected to the metal instrument chassis and the protective earth pin
of the power plug. Be aware that it is not isolated from ground.

87
8.1 External Input/Output Connector and Signals

Signal Descriptions

Input Signals

TRIG

When external triggering (EXT) is enabled, one measurement is performed at the falling (ON) or rising (OFF) edge of the TRIG signal. Falling (ON) or rising (OFF) edge triggering can be selected on the Settings screen (default: falling (ON) edge). When internal triggering (INT) is enabled, external triggering is disabled. Also, when the Settings Monitor function is enabled and an error occurs, triggering is disabled (p. 53). The TRIG signal performs the following operations in addition external triggering: · Stores statistical calculation data (when statistical calculation is enabled) · Stores measured data to internal memory (when the data memory function is enabled) (also operates with internal triggering)

(p. 94)

0ADJ

Asserting the 0ADJ signal executes zero adjustment once. To avoid malfunction, this signal should be asserted (Low) for at least 10 ms.

(p. 32)

PRINT Asserting the PRINT signal prints the current measurement value.

(p. 82)

CAL

Asserting the CAL signal executes self calibration. The time required for self calibration is as follows: Approximately 130 ms (with 60-Hz line frequency setting), or 110 ms (with 50-Hz setting) If asserted during measurement, executes after the end of measurement.

(p. 57)

HOLD

Holding the HOLD signal low enables external triggering. When the HOLD signal is high, the settings made on the Settings screen or by commands are re- enabled.

PRB_CHECK

Asserting the PRB_CHECK signal executes probe short-circuit adjustment one time. If asserted during measurement, executes after the specified time from the end of measurement.

(p. 51)

KEY_LOCK

While the KEY_LOCK signal is held low, all front panel keys (except POWER button) are disabled (key unlock and remote control cancellation operations are also disabled).

(p. 59)

Output Signals

ERR

This signal indicates that a measurement fault has occurred (except out-of- range detection). It is updated simultaneously with the EOM signal. At this time, comparator decision outputs are all de-asserted (high).

8
(p. 38)

CE_HI

This signal indicates that a contact check error has occurred between HCUR and HPOT contacts. It is updated simultaneously with the EOM signal. At this time, comparator decision outputs are all de-asserted (high).

(p. 46)

CE_LO

This signal indicates that a contact check error has occurred between LCUR and LPOT contacts. It is updated simultaneously with the EOM signal. At this time, comparator decision outputs are all de-asserted (high).

(p. 46)

PRB_SHORT

This signal indicates that a foreign object is shorting the POT and CUR contacts in a four-terminal probe tip. At this time, comparator decision outputs are all de-asserted (high).

(p. 51)

INDEX

This signal indicates that A/D conversion in the measurement circuit is finished. When the asserted (low) state occurs, the measurement sample can be removed.

EOM

This signal indicates the end of a measurement. At this time, the states of the comparator decision outputs and ERR, CE_HI, CE_LO, and PRB_SHORT are all determined.

(p. 93)

HI, IN, LO These are the comparator decision output signals.

· Input signals are ignored when the following are displayed: Basic, Detailed, and Comparator Settings screens; Statistical Calculation Results screen (except for the print signal); and error messages (except Setting Monitor errors).
· EXT. I/O input and output signals are not usable while changing measurement settings.

88
8.2 Timing Chart
8.2 Timing Chart
Each signal level indicates a corresponding voltage level.

Contact Improver
Measurement currents
Contact check
Measurement processing

Checking

Available
· The EOM signal is operational when the trigger source setting is EXT and the EOM output setting is Pulse. · A self-calibration measurement (approximately 130 ms) is automatically performed every 10 minutes
(between measurements). TRIG signal input is accepted during that time, but the corresponding measurement is delayed until self-calibration is finished. · Do not apply a TRIG signal while measuring using external triggering (the signal is ignored). · When changing settings such as measurement range, allow about 150 ms processing time before applying a TRIG signal. · Input signals are ignored when the following are dis

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