SAKO SUNSEE Solar Inverter Lithium Ion Batteries Solar Panel Owner’s Manual
- June 11, 2024
- sako
Table of Contents
SAKO SUNSEE Solar Inverter Lithium Ion Batteries Solar Panel
Product Information
Inverter MOS Testing with Digital Multimeter
The product is a digital multimeter suitable for testing MOS (Metal-Oxide- Semiconductor) status quickly. It is compatible with SAKO inverters SUNSET, SUNON, SUNON PLUS, and SUNPOLO. The multimeter can be used to check if the MOS is damaged or not. The testing method provided in the user manual is for N channel MOSFET. For P channel MOSFET, the test method is the same, but the polarity of the test lead of the multimeter should be exchanged.
Product Usage
Testing MOS with Digital Multimeter
Here are the steps to test the MOS status using the digital multimeter:
- Gather the following materials/tools: MOS, digital multimeter.
- Testing method for N channel MOSFET:
- Turn the multimeter to the diode gear wheel.
- Use the diode gear wheel to test G-S poles of 5N60C forward direction. The red side of the multimeter should be connected to G and the black side to S. If the data on the multimeter is OL, it means that the MOSFET is good without damage.
- Use the diode gear wheel to test the D-S poles of 5N60C in the opposite direction. If the red side of the multimeter is connected to S and the black side to D, and the data on the multimeter is between 0.45-0.65vdcthe, it indicates that the MOSFET is good without damage. If the test data on the multimeter is close to 0, it means that the MOSFET is damaged.
Refer to the user manual for pictures of the testing results and examples. Make sure to follow the instructions carefully and exchange the polarity of the test lead of the multimeter if testing P channel MOSFET.
How to check whether the MOS is damaged or not
Suitable for SAKO inverter: SUNSEE/SUNON/SUNON PLUS/SUNPOLO The digital multimeter can check MOS status quickly. Here is one example to show how to test it as follows:
Materials/Tools
- MOS
- Multimeter
Instruction
- The testing method of N channel MOSFET:
- Turn the multimeter to the diode gear wheel.
Steps
- Use the diode gear wheel to test G-S poles of 5N60C forward direction.
- The red side of the multimeter to G, Black side to S, if the data on the multimeter is OL, the Mosfet is good without damage(See below pictures).
During the testing, the test result as follows will indicate the MOSFET is ok without any damage:
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If the red side to S, and the black side to D, the data on the multimeter is 0.45-0.65vdc
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The red side to S, the black side to G, the data on the multimeter is OL
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The red side to G, Black to D, the data on the multimeter is OL
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The red side to G, Black to S, the data on the multimeter is OL
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The red side to D, Black to G, the data on the multimeter is OL
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The red side to D, Black to S, the data on the multimeter is OL
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Use the diode gear wheel to test the D-S poles of 5N60C in the opposite direction.
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If the red side of the multimeter to S, the black side to D, and the data on the multimeter is between 0.45-0.65vdc, the Mosfet is good without damage. (See the below pictures, the testing result is 0.569v, the mosfet is good).
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If the test data on the multimeter is close to 0, it means the MOSFET get damaged.
- When charging the capacitance between poles G and S with the diode gear wheel of the multimeter, for N channel mosfet charging, the red side of the multimeter to the G pole, and the black side to G pole.
- After testing the D and S poles of 5N60C and confirming they are OK, then charge the gate-source capacitance of the MOSFET with the diode gear wheel of a multimeter.
- As the input resistance of the MOSFET is in the GΩ level ( 1GΩ =1000MΩ ), the open-circuit voltage of the diode gear wheel of the multimeter is 2.8-3V, after the gate-source capacitance is charged, the resistance between D and S pole of MOSFET becomes very small and can test if pole G and S get damaged.
Kind reminder
- The above test method is the way to test N channel Mosfet.
- For the P channel mosfet, the test method is the same, just exchange the polarity of the test lead of the multimeter.