SEAGATE FireCuda 120 SSD Perfect for Gaming Use and Video Editing Owner’s Manual

June 9, 2024
Seagate

SEAGATE FireCuda 120 SSD Perfect for Gaming Use and Video Editing Owner’s Manual
SEAGATE FireCuda 120 SSD Perfect for Gaming Use and Video
Editing

Introduction

Feature Description
Capacity (User) 500 GB, 1000 GB, 2000 GB, 4000 GB
Certifications, Eco-Compliance CE, UL, FCC, BSMI, KCC, Microsoft WHCK,

VCCI, CBn  RoHS
Dimensions| (69.85±0.25) x (100±0.25) x (Max. 7) mm| SSD outer case can support suitable Z-height for various host situations.
Endurance|

  • 500 GB 700 Total Bytes Written (TBW)
  • 1000 GB 1400 TBW
  • 2000 GB 2800 TBW
  • 4000 GB 5600TBW

| Endurance rating valid for SSD Life Remaining > 1% (SMART E7h>1).See Section 2.5, Reliability/Endurance.
Form Factor| 2.5-inch Standard SSD
Interface Compliance|

  • Fully compliant with ATA-8/ACS-3 Standard
  • Compliant with SATA Revision 3.2
  • Supported protocol AHCI and ASC2 command set
  • Compatible with SATA 1.5 Gbps, 3 Gbps, and 6Gbps interfacesn  PIO, DMA, UDMA (up to 6 modes, dependent on host) supported
  • Native Command Queuing (NCQ): up to 32 commands
  • Data Set Management Command Trim support

NAND| 3D TLC
Operating Systems|

  • Windows® 7 (64 bit), 8.1 (64 bit), and Windows 10 (64 bit)
  • Ubuntu 16.10

Performance Random|

  • Read: Up to 100,000 IOPS
  • Write: Up to 90,000 IOPS

| Actual performance might vary depending on use conditions and environment.See Section 2.2, P e r f o r m a n c e.
Performance Sequential|

  • Read: Up to 560MB/s
  • Write: Up to 540MB/s

| Actual performance might vary depending on the capacity, use conditions and environment.See Section 2.2, P e r f o r m a n c e.
Power Consumption|

  • Active mode: < 2800 mW
  • Idle mode: < 150 mW
  • DEVSLP: 5 mW

| Based on 4000 GB SSD. Results vary with capacity and mode.
Power Loss Data Protection|

  • To protect your data, you must send a Standby Immediate command (0xE1h) before you remove power. The FireCuda 120 SSD does not provide data protection for a sudden power loss.

Power Management|

  • 2.5 inch: 5 V SATA Supply
  • Host-initiated power managementn  Device-initiated power managementn  HIPM/DEVSLP Mode

Reliability| End-to-end data path protectionn  MTBF: 1.8 million hoursn UBER: 1 error in 1016 bits read
Shock and Vibration| Shockn  Non-Operating: 1,500 G, at 0.5 ms| See Section 2.4, Environmental Conditions .
Vibrationn  Non-Operating: 1.52 GRMS, (20 to 80 Hz, Frequency)
Temperature Range (Operating)| 0°C to 70°Cn  Temperature Sensor (SMART Attribute ID C2h)
Voltage| 5V±5%
Warranty| Five years, or when the device reaches Host TBW, whichever happens first. Endurance rating valid for SSD Life Remaining > 1% (SMART E7h>1).
Weight| 50 g, 1.76 Oz ±5%

Specifications

Models and Capacity

Table 2 Models and Capacity

Model Names User Capacity
ZA500GM10001 500 GB
ZA1000GM10001 1000 GB
ZA2000GM10001 2000 GB
ZA4000GM10001 4000 GB

NOTE: About capacity:

  • Sector Size: 512 Bytes
  • User-addressable LBA count = ((97696368) + (1953504 x (Desired Capacity in Gb-50.0)) From International Disk Drive Equipment and Materials Association (IDEMA) (LBA1-03_standard.doc)
Performance

Table 3 Random and Sequential Read and Write Performance

Parameter 500 GB 1000 GB 2000 GB 4000 GB
Sequential Read MB/s 560 MB/s 560 MB/s 560 MB/s 560 MB/s
Sequential Write MB/s 540 MB/s 540 MB/s 540 MB/s 540 MB/s
Random Read (IOPS) 100,000 100,000 100,000 100,000
Random Write (IOPS) 90,000 90,000 90,000 90,000

NOTE: About performance:

  • Fresh out of box (FOB) performance obtained on newly formatted  drive. Performance may vary based on the SSD’s firmware version, system hardware, and configuration.
  • Performance is based on CrystalDiskMark v.6.0.0 ×64 on Windows 10 host.

Power Consumption

Table 4 Power Consumption

| 500 GB| 1000 GB| 2000 GB| 4000 GB
---|---|---|---|---
Read (mW)| 2300| 2400| 2600| 2800
Write (mW)| 2300| 2400| 2600| 2800
Idle (mW)| 120| 135| 140| 150
Slumber (mW)| 35| 55| 60| 65
DEVSLP (mW)| 5| 5| 5| 5

NOTE: About power consumption:

  • The average value of power consumption is based on 100% conversion efficiency.
  • The measured power voltage is 5 V.
  • Measured under ambient temperature.
  • Sequential Read/Write is measured while testing 4000 MB five times by CrystalDiskMark.
  • Power Consumption can differ according to flash configuration and platform.
Environmental Conditions

Table 5 Temperature, Humidity, Shock

Specification Value

Temperature
Operating (case temperature at specific airflow) Non-operating| 0°C to 70°C
-40°C to 85°C
Humidity
Operating
Non-operating (storage)| 90%
93%
Shock Non-operating| 1,500 G, duration 0.5 ms
Vibration Non-operating| 1.52 GRMS, (20Hz to 80Hz, Frequency)

NOTE: Temperature is measured without condensation. Operating mode temperature is measured by temperature sensor, SMART Attribute C2h.

NOTE: Shock and vibration results assume that the SSD is mounted securely with the input vibration applied to the SSD mounting. These specifications do not cover connection issues that may result from testing at this level. The measured specification is in root mean square (RMS) form.

  • Non-operating Shock. The limits of non-operating shock applies to all conditions of handling and transportation. This includes both isolated SSD and integrated SSDs. Shock may be applied in the X, Y, or Z-axis.
  • Non-Operating Vibration. The limits of non-operating vibration shall apply to all conditions of handling and transportation. This includes both isolated SSD and integrated SSDs. Vibration may be applied in the X, Y, or Z-axis.

Reliability/Endurance

Table 6 Reliability/Endurance

Specification Value
Mean time between failures (MTBF) 1.8 million hours
Bit Error Rate 1 error in 1016 bits read
Endurance
  • 700 GB TBW
  • 1400 GB TBW
  • 2800 GB TBW
  • 5600 GB TBW

NOTE: About endurance

  • The SSD achieves the specified MTBF in an operational environment that complies with the operational temperature range specified in this manual. Operating temperatures are measured by temperature sensor, SMART Attribute ID C2h.
  • Endurance rating valid for SSD Life Remaining > 1% (SMART E7h>1).
  • Endurance is characterized while running Client JESD219A workload (per JESD218A specification).

Mechanical Information

Dimensions and Weight

  • Weight: 50 g, 1.76 Oz +/- 5%
  • Height: Maximum, 7 mm+0.10/-0.30
  • Width: 69.85 mm±0.25 mm
  • Length: 100.10 mm±0.25 mm

Figure 1 FireCuda 120 SSD Enclosure
Dimensions

_ Figure 2 FireCuda 120 SSD
Dimensions
_

Pin and Signal Descriptions

Signal Pin Definitions

Table 7 Serial ATA Connector Pin Signal Definitions

Pin Name Definition
S1 Ground Ground
S2 A+ Differential signal pair A+ and A-
S3 A-
S4 Ground Ground
S5 B- Differential signal pair B- and B+
S6 B+
S7 Ground Ground

NOTE Key and spacing separate the signal and power segments.

Power Pin Definitions

Table 8 Power Pin Definitions

Pin Function Definition
P1 not used Not Used (3.3 V)
P2 V33 Not Used (3.3 V)
P3 DEVSLP SATA PHY Power Control
P4 GND Ground
P5 GND Ground
P6 GND Ground
P7 V5 5 V Power, Precharge
P8 V5 5 V Power
P9 V5 5 V Power
P10 GND Ground
P11 Reserved Reserved
P12 GND Ground
P13 not used Not Used (12 V pre-charge)
P14 V12 Not Used (12 V)
P15 V12 Not Used (12 V)

NOTE: About Power Pin Signal Definitions:

  • Key and spacing separate the signal and power segments.
  • Uses 5 V power only; 3.3 V (P1-P2) and 12 V (P13-P15) power are not used.

Supported ATA Command List

The FireCuda 120 SSD complies with ATA-8/ACS-3. All mandatory and many optional commands and features are supported.

ATA Feature Set

The following table summarizes the ATA feature set and commands that the FireCuda 120 SSD supports.

Table 9 ATA Feature Set

Feature Supported
48-Bit Address feature set Yes
General feature set Yes
Native Command Queuing (NCQ) feature set Yes
Power Management feature set Yes
Security feature set Yes
SMART feature set Yes

ATA Command Description

The following table shows the ATA commands supported

Table 10 ATA Command Description

Op-Code| Support| Command Description| Op-Code| Support| Command Description
---|---|---|---|---|---
00h| Y| NOP| B6h| 12h| —| —| NV Cache: QUERY NV CACHE PINNED SET DMA EXT
03h| —| CFA Request Extended Error| B6h| 13h| —| | NV Cache: QUERY NV CACHE MISSES DMA EXT
06h| Y| Data Set Management| B6h| 14h| —| —| NV Cache: FLUSH NV CACHE
08h| —| Device Reset| C4h| —| —| Y| Read Multiple
0Bh| —| Request Sense Data EXT| C5h| —| —| Y| Write Multiple
10h| Y| Recalibrate| C6h| —| —| Y| Set Multiple Mode
11h to 1Fh| —| Recalibrate| C7| —| —| | Read DMA Queued
20h| Y| Read Sectors| C8h| —| —| Y| Read DMA
21h| Y| Read Sectors without Retry| 9h| —| —| —| Read DMA Without Retry
22h| —| Read Long| CAh| —| —| Y| Write DMA
23h| —| Read Long Without Retry| CBh| —| —| Y| Write DMA Without Retry
24h| Y| Read Sectors EXT| CCh| —| —| —| Write DMA Code
25h| Y| Read DMA EXT| CDh| —| —| —| CFA Write Multiple Without Erase
26h| —| —| Read DMA Queued EXT| CEh| —| —| Y| Write Multiple FUA EXT
27h| —| Y| Read Native Max Address EXT| D1h| —| —| —| Check Media Card Type
29h| —| Y| Read Multiple EXT| DAh| —| —| —| Get Media Status
2Ah| —| —| Read Stream DMA EXT| DEh| —| —| —| Media Lock
2Bh| —| —| Read Stream EXT| DFh| —| —| —| Media Unlock
2Fh| —| Y| Read Log EXT| E0h| —| —| Y| Standby Immediate
30h| —| Y| Write Sectors| E1h| —| —| Y| Idle Immediate
31h| —| Y| Write Sectors without Retry| E2h| —| —| Y| Standby
32h| —| —| Write Long| E3h| —| —| Y| Idle
33h| —| —| Write Long Without Retry| E4h| —| —| Y| Read Buffer
34h| —| Y| Write Sectors EXT| E5h| —| —| Y| Check Power Mode
35h| —| Y| Write DMA EXT| E6h| —| —| Y| Sleep
36h| —| | Write DMA Queued EXT| E7h| —| —| Y| Flush Cache
37h| —| Y| Set Max Address EXT| E8h| —| —| Y| Write Buffer
38h| —| —| CFA Write Sectors Without Erase| E9h| —| —| Y| Read Buffer DMA
39h| —| Y| Write Multiple EXT| EAh| —| —| Y| Flush Cache EXT
3Ah| —| —| Write Stream DMA EXT| EBh| —| —| Y| Write Buffer DMA
3Bh| —| —| Write Stream EXT| ECh| —| —| Y| Identify Device
3Ch| —| —| Write Verify| EDh| —| —| —| Media Eject
3Dh| —| Y| Write DMA FUA EXT| EEh| —| —| —| Identify Device DMA
3Eh| —| —| Write DMA Queued FUA EXT| EFh| 01h| —| —| Set Features: Enable 8-bit PIO Transfer Mode (CFA feature set only)
3Fh| —| Y| Write Log EXT| EFh| 02h| —| Y| Set Features: Enable Write Cache
40h| —| Y| Read Verify Sectors| EFh| 03h| —| Y| Set Features: Set transfer mode based on value in Count field.
41h| —| Y| Read Verify Sectors without Retry| EFh| 05h| —| —| Set Features: Enable advanced power man- agement.
42h| —| Y| Read Verify Sector(s) EXT| EFh| 06h| —| —| Set Features: Enable Power-Up In Standby fea- ture set.
44h| —| —| Reserved| EFh| 07h| —| —| Set Features: Power-Up In Standby feature set device spin-up.
45h| —| O| Write Uncorrectable EXT| EFh| 0Ah| —| —| Set Features: Enable CFA power mode 1.
47h| —| Y| Read Log DMA EXT| EFh| 0Bh| —| —| Set Features: Enable Write-Read- Verify feature set
50h| —| —| Format Track| EFh| 10h| 01h| —| Set Features: Enable use of Serial ATA fea- ture
51h| —| —| Configure Stream| EFh| 10h| 02h| Y| Set Features: Enable DMA Setup FIS Auto-Acti- vate optimization
57h| —| Y| Write Log DMA EXT| EFh| 10h| 03h| Y| Set Features: Enable Device- initiated interface power state (DIPM) transitions.
60h| —| Y| Read FPDMA Queued| EFh| 10h| 04h| —| Set Features: Enable use of Serial ATA feature
61h| —| Y| Write FPDMA Queued| EFh| 10h| 05h| —| Set Features: Enable use of Serial ATA feature
70h| —| Y| Seek| EFh| 10h| 06h| O| Set Features: Enable Software Settings Preservation (SSP)
71-76h| —| —| Seek| EFh| 10h| 07h| Y| Set Features: Enable Device Automatic Partial to Slumber transitions
77h| —| Y| Set Date And Time Ext| EFh| 10h| 09h| O| Set Features: Enable Device Sleep
78h| —| Y| Accessible Max Address Configuration| EFh| 42h| —| —| Set Features: Enable Automatic Acoustic Management feature set.
79-7Fh| —| —| Seek| EFh| 43h| –| —| Set Features: Set Maximum Host Interface Sector Times.
87h| —| —| CFA Translate Sector| EFh| 44h| —| -—| Set Features: Vendor Specific ECC byte
90h| —| Y| Execute Device Diagnostic| EFh| 55h| —| Y| Set Features: Disable read look-ahead feature
91h| —| Y| Initialize Device Parameters| EFh| 5Dh| —| —| Set Features: Enable release interrupt
92h| —| Y| Download Microcode| EFh| 5Eh| —| —| Set Features: Enable service interrupt
93h| —| Y| Download Microcode DMA| EFh| 5Fh| —| —| Set Features: Enable NDRQ Feature
94h| —| —| Standby Immediate| EFh| 66h| —| Y| Set Features: Disable reverting to power-on defaults
95h| —| —| Idle Immediate| EFh| 81h| —| —| Set Features: Disable 8-bit PIO transfer mode (CFA feature set only)
96h| —| —| Standby| EFh| 82h| —| Y| Set Features: Disable write cache
97h| —| —| Idle| EFh| 85h| | Y| Set Features: Disable advanced power management
98h| —| —| Check Power Mode| EFh| 86h| | —| Set Features: Disable Power-Up In Standby feature set
99h| —| —| Sleep| EFh| 8Ah| | —| Set Features: Disable CFA power mode
A0h| —| —| Packet| EFh| 8Bh| | —| Set Features: Disable Write-Read-Verify feature set
A1h| | | Identify Packet Device| Efh| 90h| 01h| | Set Features: Disable use of Serial ATA feature.
A2h| —| —| Service| Efh| 90h| 02h| Y| Set Features: Disable DMA Setup FIS Auto-Acti- vate optimization.
B0h| D0h| Y| SMART: Read Data| EFh| 90h| 03h| **** Y| Set Features: Disable Device-initiated interface power state (DIPM) transitions.
B0h| D1h| Y| SMART: Read Attribute Thresholds| EFh| 90h| 04h| —| Set Features: Disable use of Serial ATA feature.
B0h| D2h| Y| SMART: Enable/disable Autosave| EFh| 90h| 05h| –| Set Features: Disable use of Serial ATA feature
B0h| D3h| Y| SMART: Save Attribute Values| EFh| 90h| 06h| Y| Set Features: Disable Software Settings Preservation (SSP)
B0h| D4h| Y| SMART: Execute Off-line Immediate| EFh| 90h| 07h| Y| Set Features: Disable Device Automatic Partial to Slumber transitions
B0h| D5h| Y| SMART: Read Log| EFh| 90h| 09h| O| Set Features: Disable Device Sleep
B0h| D6h| Y| SMART: Write Log| EFh| AAh| Y| Set Features: Enable read look- ahead feature
B0h| D8h| Y| SMART: Enable Operations| EFh| BBh| –| Set Features: Default ECC byte
B0h| D9h| Y| SMART: Disable Operations| EFh| C2h| –| Set Features: Disable Automatic Acoustic Management feature set
B0h| DAh| Y| SMART: Return Status| EFh| C3h| –| Set Features: Enable/Disable the Sense Data Reporting feature set
B0h| DBh| Y| SMART: Enable/disable Automatic Off-line| EFh| CCh| Y| Set Features: Enable reverting to power-on defaults
B0h| E0h| –| SMART: Vendor specific| EFh| DDh| –| Set Features: Disable release interrupt
B1h| C0h| Y| DEVICE CONFIGURATION: Restore| EFh| DEh| –| Set Features: Disable SERVICE interrupt
B1h| C1h| Y| DEVICE CONFIGURATION: FreezeLock| EFh| DFh| –| Set Features: Disable NDRQ Feature
B1h| C2h| Y| DEVICE CONFIGURATION: Identify| F1h| Y| Security Set Password
B1h| C3h| Y| DEVICE CONFIGURATION: Set| F2h| Y| Security Unlock
B1h| C4h| Y| DEVICE CONFIGURATION: Identify DMA| F3h| Y| Security Erase Prepare
B1h| C5h| Y| DEVICE CONFIGURATION: Set DMA| F4h| Y| Security Erase Unit
B4h| 0000h| O| SANITIZE DEVICE: Sanitize Status Ext| F5h| Y| Security Freeze Lock
B4h| 0011h| O| SANITIZE DEVICE: Crypto Scramble Ext| F6h| Y| Security Disable Password
B4h| 0012h| O| SANITIZE DEVICE: Block Erase Ext| F8h| Y| Read Native Max Address
B4h| 0014h| O| SANITIZE DEVICE: Overwrite Ext| F9h| 00h| Y| SET MAX: Set Max Address
B4h| 0020h| O| SANITIZE DEVICE: SANITIZE FREEZE LOCK EXT| F9h| 01h| Y| SET MAX: SET MAX PASSWORD
B4h| 0040h| O| SANITIZE DEVICE: SANITIZE ANTIFREEZE LOCK EXT| F9h| 02h| Y| SET MAX: SET MAX LOCK
B6h| 00h| –| NV Cache: SET NV CACHE POWER MODE EXT| F9h| 03h| Y| SET MAX: SET MAX UNLOCK
B6h| 01h| –| NV Cache: RETURN FROM NV CACHE POWER MODE EXT| F9h| 04h| Y| SET MAX: SET MAX FREEZE LOCK
B6h| 10h| –| NV Cache: ADD LBA(S) TO NV CACHE PINNED SET DMA EXT| F9h| 05h| Y| SET MAX: SET MAX SET PASSWORD DMA
B6h| 11h| –| NV Cache: REMOVE LBA(S) FROM NV CACHE PINNED SET DMA EXT| F9h| 06h| Y| SET MAX: SET MAX UNLOCK DMA

SMART Support

The FireCuda 120 SSD supports the SMART command set.

SMART ID

The following table lists SMART IDs and Descriptions.

Description| 0| 1| 2| 3| 4| 5| 6| 7| 8| 9| 10| 11| **Threshold
---|---|---|---|---|---|---|---|---|---|---|---|---|---
ID| Flag| Value| Worse| DATA|
Number of Accumula- tion ofUncorrectable Error| 01h| 0Bh| 00h| 64h| 64h| UNC error count from Host| 0| 0| 0| 0| 0| 32h
Power-On hours Count| 09h| 12h| 00h| 64h| 64h| Power on hour| 0| 0| 0| 0| 0| 00h
Drive Power Cycle Count| 0Ch| 12h| 00h| 64h| 64h| Power on/off cycles| 0| 0| 0| 00h
Spare Blocks Available| 10h| 12h| 00h| 64h| 64h| Spare Blocks Available byplane| 0| 0| 0| 0| 0| 00h
Remaining Spare Blocks| 11h| 12h| 00h| 64h| 64h| Remaining Spare Blocks byplane| 0| 0| 0| 0| 0| 00h
SATA PHY Error Count| A8h| 12h| 00h| 64h| 64h| SATA PHY error count| 0| 0| 0| 00h
Bad Block Count (Early / Later)| AAh| 03h| 00h| Notea| Early Bad Block count by allplane| 0| 0| Later Bad Block countby all plane| 0| 0Ah
Erase count (average, max, erase count)| ADh| 12h| 00h| 64h| 64h| Max Erase Count| Average EraseCount| Least Erase Count| 0| 00h
Unexpected Power Loss count| AEh| 12h| 00h| 64h| 64h| Number of accidental power loss count| 0| 0| 0| 00h
Wear Range delta| B1h| 00h| 00h| 00h| 00h| Noteb| 0| 0| 0| 0| 0| 0| 00h
Unexpected Power Loss Count| C0h| 12h| 00h| 64h| 64h| number of accidental power loss count| 0| 0| 0| 00h
Temperature(only Toshiba or thermo sensor embedded)| C2h| 23h| 00h| 127-Curre nt Temp| 127-Highest value| Current Temp| Lowest Temp| Highest Temp| 0| 39h
Number of accumula- tion CRC error(read/write data FIS CRC error)|
DAh| 0Bh| 00h| 64h| 64h| CRC Error Count| 0| 0| 0| ** 32h
SSD life remaining| E7h| 13h| 00h| 64h| 64h| Notec| 0| 0| 0| 0| Thro ttlin glevel| 0| 00h
Read Failure Block Count| E8h| 13h| 00h| 64h| 64h| Flash Read Fail Count| Raw ReadError Rate| 0| 0| 00h
Lifetime Writes to Flash (G Unit)| E9h| 0Bh| 00h| 64h| 64h| Lifetime Writes to Flash by GByte| 0| 00h
Lifetime Writes to Flash (Sector Unit)| EBh| 0Bh| 00h| 64h| 64h| Lifetime Writes to Flash by Sector| 0| 00h
NAND read (Sectors)| EAh| 0Bh| 00h| 64h| 64h| NAND read (Sectors)| 0| 00h
Host Writes (G Unit)| F1h| 12h| 00h| 64h| 64h| Lifetime Writes from Host by Gbyte| 0| 00h
Host Reads (G Unit)| F2h| 12h| 00h| 64h| 64h| Lifetime Reads from Host by Gbyte| 0| 00h

a. Bad Block Count (Early / Later) ID170. Value = (Remaining Spare Blocks by plane)/(Spare Blocks Available by plane) 100. This formula calculates percentage of spare block. Value is between 100 and 0.
b. Wear Range Delta ID 177. Value = (max erase count – least erase count) / (P-E Cycle)
100 (percentage).
c. SSD Life Remaining ID 231. Value = 100 – ((average erase count / Rated PE Cycle) * 100)

Feature Details

Flash Management

  1. Error Correction Code (ECC)
    Flash memory cells deteriorate with use, which might generate random bit errors in the stored data. The FireCuda 120 SSD applies the 340 bit/2 KB LDPC (Low Density Parity Check) of ECC algorithm, which detects and corrects errors that occur during read process, ensures data is read correctly, and protects data from corruption.

  2. Wear Leveling
    NAND flash devices can undergo only a limited number of program/erase cycles. Commonly, areas of the flash media are not used evenly. If some areas are updated more frequently than others, this reduces the lifetime of the device. Wear Leveling extends the life of the NAND Flash by evenly distributing write and erase cycles across the media. Seagate’s advanced Wear Leveling algorithm spreads the flash usage throughout the whole flash media area. Implementing dynamic and static Wear Leveling algorithms improves the life expectancy of the NAND flash.

  3. Bad Block Management
    Bad blocks do not function properly and they can contain more invalid bits. This can make stored data unstable and bad block reliability is not guaranteed. Blocks identified and marked as bad by the manufacturer are called “Early Bad Blocks”. Bad blocks that develop during the lifespan of the Flash are called “Later Bad Blocks”. Seagate’s bad block management algorithm detects the factory-produced bad blocks and manages bad blocks that appear with use. This practice prevents data from being stored in bad blocks and improves data reliability

  4. TRIM
    The TRIM feature improves the read/write performance and speed of SSDs. SSDs cannot overwrite existing data, so the available space becomes smaller with each data block use. The TRIM command tells the SSD (through the operating system) which data blocks can be removed permanently because they are no longer in use. The SSD erases these unused data blocks.

  5. SMART
    SMART, stands for Self-Monitoring, Analysis, and Reporting Technology, is an open standard that allows an SSD to automatically detect its health and report potential failures. When SMART records a failure, users can replace the drive to prevent unexpected outage or data loss. SMART can also inform users of impending failures while there is still time to copy data to another device.

Seagate Technology Support Services

For Internal SSD Support, visit: https://www.seagate.com/support/products/
For Firmware Download and Tools Download for Secure Erase, visit: https://www.seagate.com/support/downloads/
For information regarding online support and services, visit: http://www.seagate.com/contacts/
For information regarding Warranty Support, visit: http://www.seagate.com/support/warranty-and-replacements/
For information regarding data recovery services, visit:
http://www.seagate.com/services-software/seagate-recovery-services/recover/
For Seagate OEM and Distribution partner and Seagate reseller portal, visit: http://www.seagate.com/partners

References

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