Silicon Power How to Implement SMART Embedded for SATA & PCIe NVMe SSD? User Manual

: June 9, 2024
: Silicon Power

Table of Contents

Support Environment
Installation
References
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How to Implement SMART Embedded for SATA & PCIe NVMe SSD?
User Manual

This application note provides instructions to use SP SMART Embedded utility program to integrate with customer’s program to get SMART information for SP Industrial SATA & PCIe NVMe SSD.

Support Environment

OS : Windows 10 and Linux
SP SMART Embedded utility program : smartwatch 7.2
Host : Intel x 86 Platform

Support List for SP Industrial SSD

SATA SSD & C fast (MLC) : SSD700/500/300, MSA500/300, MDC500/300, CFX510/310
SATA SSD & C Fast (3D TLC) : SSD550/350/3K0, MSA550/350/3K0, MDC550/350, MDB550/350, MDA550/350/3K0 series, CFX550/350
PCIe NVMe : MEC350, MEC3F0, MEC3K0 series

SMART Attribute

SATA SSD & C fast (MLC)

| SM2246EN| SM2246XT
---|---|---
Attribute| SSD700/500/300R/S series MSA500/300S
MDC500/300 R/S series| CFX510/310
01| Read error rate CRC Error count| Read error rate CRC Error count
05| Reallocated sectors count| Reallocated sectors count
09| Power-on hours| Reserved
0C| Power cycle count| Power cycle count
A0| Uncorrectable sector count when read/Write| Uncorrectable sector count when read/Write
A1| Number of valid spare block| Number of valid spare block
A2| | Number of valid spare block
A3| Number of initial invalid block| Number of initial invalid block
A4| Total erase count| Total erase count
A5| Maximum erase count| Maximum erase count
A6| Minimum erase count| Average erase count
A7| Max erase count of spec|
A8| Remain Life|
| SM2246EN| SM2246XT
---|---|---
Attribute| SSD700/500/300R/S series MSA500/300S
MDC500/300 R/S series| CFX510/310
A9| Remain Life|
AF| Program fail count in worst die|
B0| Erase fail count in worst die|
B1| Total wear level count|
B2| Runtime invalid block count|
B5| Total program fail count|
B6| Total erase fail count|
BB| Uncorrectable error count|
C0| Power-off retract count| Power-off retract count
C2| Controlled temperature| Controlled temperature
C3| Hardware ECC recovered| Hardware ECC recovered
C4| Reallocated event count| Reallocated event count
C6| Uncorrectable error count off-line|
C7| Ultra DMA CRC error count| Ultra DMA CRC error count
E1| Total LBAs written|
E8| Available reserved space|
F1| Write Sector Count
Total LBAs Written (each write unit = 32MB)| Total LBAs written
F2| Read Sector Count
Total LBAs Read (each read unit = 32MB)| Total LBAs read
| SM2258H| SM2258XT| RL5735
---|---|---|---
Attribute| SSD550/350 R/S series MSA550/350 S series MDC550/350 R/S series MDB550/350 S series MDA550/350 S series CFX550/350 S series| CFX550/350 series| SSD3K0E, MSA3K0E, MDA3K0E series
01| Tread error rate (CRC Error count)| Tread error rate (CRC Error count)| Tread error rate (CRC Error count)
05| Reallocated sectors count| Reallocated sectors count| Reallocated sectors count
09| Power-on hours| Power-On Hours Count| Power-On Hours Count
0C| Power cycle count| Power cycle count| Power cycle count
94| Total erase count (SLC) (pSLC model)| |
95| Maximum erase count (SLC) (pSLC model)| |
96| Minimum erase count (SLC) (pSLC model)| |
97| Average erase count (SLC) (pSLC model)| |
A0| Uncorrectable Sector Count On Line (Uncorrectable sector count when read/Write)| Online Uncorrected Sector Count (Uncorrectable sector count when read/Write)|
A1| Number of Pure Spare (Number of valid spare block)| Number of valid spare block| Grow defect number (Later bad block)
A2| | | Total erase count
A3| Number of initial invalid block| Number of initial invalid block| Max PE cycle Spec
A4| Total erase count (TLC)| Total Erase Count (TLC )| Average erase count
A5| Maximum erase count (TLC)| Maximum erase count (TLC)|
A6| Minimum erase count (TLC)| Minimum erase count (TLC)| Total bad block count
A7| Average erase count (TLC)| Average erase count (TLC)| SSD protect mode
A8| Max Erase Count in Spec (Max erase count of spec)| Max Erase Count in Spec| SATA Phy error count
A9| Remaining Life Percentage| Remaining Life Percentage| Remaining Life Percentage
AB| | | Program fail count
AC| | | Erase fail count
AE| | | Unexpected power loss count
AF| | | ECC fail count (host read fail)
| SM2258H| SM2258XT| RL5735
---|---|---|---
Attribute| SSD550/350 R/S series MSA550/350 S series MDC550/350 R/S series MDB550/350 S series MDA550/350 S series CFX550/350 S series| CFX550/350 series| SSD3K0E, MSA3K0E, MDA3K0E series
B1| Total wear level count| Wear leveling Count|
B2| Used Reserved Block Count (Runtime invalid block count)| Grown Bad Block Count|
B5| Total program fail count| Program Fail Count| Unaligned access count
B6| Total erase fail count| Erase Fail Count|
BB| Uncorrectable error count| | Reported un correctable error
C0| Power-off retract count| Sudden Power Count (Power-off retract count)|
C2| Temperature_Celsius (T junction)| Enclosure Temperature (T junction)| Enclosure temperature (T junction)
C3| Hardware ECC recovered| Hardware ECC recovered| Cumulative corrected ecc
C4| Reallocated event count| Reallocated event count| Reallocation event count
C5| Current pending sector count:| Current Pending Sector Count|
C6| Uncorrectable error count off-line| Reported Uncorrectable Errors|
C7| UDMA CRC Error
(Ultra DMA CRC error count)| CRC Error Count
(Ultra DMA CRC error count)| Ultra DMA CRC error count
CE| | | Min. erase count
CF| | | Max erase count
E1| Host Writes
(Total LBAs written)| |
E8| Available reserved space| Max Erase Count in Spec| Available reserved space
E9| Total write to flash| | Spare block
EA| Total Read from flash| |
F1| Write Sector Count
(Total Host Writes , each unit 32MB)| Host 32MB/unit Written (TLC)| Write life time
F2| Read Sector Count

(Total Host Read , each unit 32MB)

| Host 32MB/unit Read (TLC)| Read life time
F5| Flash Write count| NAND 32MB/unit Written (TLC)| Unexpected power loss count
F9| | | Total GB written to NAND (TLC)
FA| | | Total GB written to NAND (SLC)
# of Bytes| Byte Index| Attributes| Description
---|---|---|---
1| 0| Critical Warning:
Bit Definition
00: If set to ‘1’, then the available spare space has fallen below the threshold.
01: If set to ‘1’, then a temperature is above an over temperature threshold or below an under temperature threshold.
02: If set to ‘1’, then the NVM subsystem reliability has been degraded due to significant media related errors or any internal error that degrades NVM subsystem reliability. 03: If set to ‘1’, then the media has been placed in read only mode.
04: If set to ‘1’, then the volatile memory backup device has failed. This field is only valid if the controller has a volatile memory backup solution.
07:05: Reserved| This field indicates critical warnings for the state of the controller. Each bit corresponds to a critical warning type; multiple bits may be set. If a bit is cleared to ‘0’, then that critical warning does not apply. Critical warnings may result in an asynchronous event notification to the host. Bits in this field represent the current associated state and are not persistent When the Available Spare falls below the threshold indicated in this field, an asynchronous event completion may occur. The value is indicated as a normalized percentage (0 to 100%).
2| 2:1| Composite Temperature:| Contains a value corresponding to a temperature in degrees Kelvin that represents the current composite temperature of the controller and namespace(s) associated with that controller. The manner in which this value is computed is implementation specific and may not represent the actual temperature of any physical point in the NVM subsystem. The value of this field may be used to trigger an asynchronous event.
Warning and critical overheating composite temperature threshold values are reported by the WCTEMP and CCTEMP fields in the Identify Controller data structure.
1| 3| Available Spare:| Contains a normalized percentage (0 to 100%) of the remaining spare capacity available
1| 4| Available Spare Threshold:| When the Available Spare falls below the threshold indicated in this field, an asynchronous event completion may occur. The value is indicated as a normalized percentage (0 to 100%).
1| 5| Percentage Used:| Contains a vendor specific estimate of the percentage of NVM subsystem life used based on the actual usage and the manufacturer’s prediction of NVM life. A value of 100 indicates that the estimated endurance of the NVM in the NVM subsystem has been consumed, but may not indicate an NVM subsystem failure. The value is allowed to exceed 100. Percentages greater than 254 shall be represented as 255. This value shall be updated once per power-on hour (when the controller is not in a sleep state).
Refer to the JEDEC JESD218A standard for SSD device life and endurance measurement techniques
| 31:6| Data Units Written:|
16| 47:32| Data Units Read:| Contains the number of 512 byte data units the host has read from the controller; this value does not include metadata. This value is reported in thousands (i.e., a value of 1 corresponds to 1000 units of 512 bytes read) and is rounded up. When the LBA size is a value other than 512 bytes, the controller shall convert the amount of data read to 512 byte units.
For the NVM command set, logical blocks read as part of Compare and Read operations shall be included in this value.
# of Bytes| Byte Index| Attributes| Description
---|---|---|---
16| 63:48| Data Units Written:| Contains the number of 512 byte data units the host has written to the controller; this value does not include metadata. This value is reported in thousands (i.e., a value of 1 corresponds to 1000 units of 512 bytes written) and is rounded up. When the LBA size is a value other than 512 bytes, the controller shall convert the amount of data written to 512 byte units.For the NVM command set, logical blocks written as part of Write operations shall be included in this value. Write Uncorrectable commands shall not impact this value.
16| 79:64| Host Read Commands:| Contains the number of read commands completed by the controller.
For the NVM command set, this is the number of Compare and Read commands.
16| 95:80| Host Write Commands:| Contains the number of write commands completed by the controller. For the NVM command set, this is the number of Write commands.
16| 111:96| Controller Busy Time:| Contains the amount of time the controller is busy with I/O commands. The controller is busy when there is a command outstanding to an I/O Queue (specifically, a command was issued via an I/O Submission Queue Tail doorbell write and the corresponding completion queue entry has not been posted yet to the associated I/O Completion Queue). This value is reported in minutes.
16| 127:112| Power Cycles:Contains the number of power cycles.|
16| 143:128| Power On Hours:| Contains the number of power-on hours. Power on hours is always logging, even when in low power mode.
16| 159:144| Unsafe Shutdowns:| Contains the number of unsafe shutdowns. This count is incremented when a shutdown notification (CC.SHN) is not received prior to loss of power.
16| 175:160| Media and Data Integrity Errors:| Contains the number of occurrences where the controller detected an un-recovered data integrity error. Errors such as un-correctable ECC, CRC checksum failure, or LBA tag mismatch are included in this field.
16| 191:176| Number of Error Information Log Entries:| Contains the number of Error Information log entries over the life of the controller.
4| 195:192| Warning Composite Temperature Time:| Contains the amount of time in minutes that the controller is operational and the Composite Temperature is greater than or equal to the Warning Composite Temperature Threshold (WCTEMP) field and less than the Critical Composite Temperature Threshold (CCTEMP) field in the Identify Controller data structure.
If the value of the WCTEMP or CCTEMP field is 0h, then this field is always cleared to 0h regardless of the Composite Temperature value.
4| 199:196| Critical Composite Temperature Time:| Contains the amount of time in minutes that the controller is operational and the Composite Temperature is greater the Critical Composite Temperature Threshold (CCTEMP) field in the Identify Controller data structure.
If the value of the CCTEMP field is 0h, then this field is always cleared to 0h regardless of the Composite Temperature value.
2| 201:200| Reserved|
2| 203:202| Reserved|
2| 205:204| Reserved|
2| 207:206| Reserved|
2| 209:208| Reserved|
2| 211:210| Reserved|
2| 213:212| Reserved|
2| 215:214| Reserved|
296| 511:216| Reserved|

Installation

Please download the latest version of SMART Embedded utility program. (Download link by request)
Unzip (In this case, unzip to E:\smartmontools-7.2.win32 folder)
Run Command Prompt
Run as Administrator
C:\WINDOWS\system32> E:\smartmontools-7.2.win32\bin\smartctl.exe -h
To get a usage summary

Command line tool to get SMART information (sdb : disk on PhysicalDrive 1)

C:\WINDOWS\system32> E:\smartmontools-7.2.win32\bin\smartct.exe -a /dev/sdb
Check the attached file SMART.TXT : https://www.silicon-power.com/support/lang/utf8/smart.txt

Output SMART information into JSON format. (sdb : disk on PhysicalDrive 1)

C:\WINDOWS\system32> E:\smartmontools-7.2.win32\bin\smartctl.exe -a -j /dev/sdb
Check the attached file JSON.TXT : https://www.silicon-power.com/support/lang/utf8/json.txt

Used Case 1: Remote monitoring SMART Dashboard via IBM Node-Red

Install IBM Node Red, Node Red is a flow-based programming tool developed by IBM. We use Node Red to integrate SP SMART Embedded utility program to develop a remote monitoring tool ” SP SMART Dashboard”.
Develop Script for Node Red and using ” smartctl.exe”
Script file as the attached SMARTDASHBOARD.TXT : https://www.silicon-power.com/support/lang/utf8/SMARTDASHBOARD.txt
Open Browser, input “ip:1880/ui”
ip is the IP address of machine which is running Node Red script. Defaulip of local machine is 127.0.0.1

Figure 1 SMART Dashboard