Tonghui TH2840 Series Automatic Transformer Test System Instruction Manual
- August 6, 2024
- Tonghui
Table of Contents
TH2840 Series Automatic Transformer Test System
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Specifications
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Product Name: TH2840 Series Automatic Transformer Test
System -
Manufacturer: Changzhou Tonghui Electronic Co.,Ltd.
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Website: www.tonghui.com.cn
Product Usage Instructions
Chapter 1: Out of Box Audit
1.1 To Inspect the package:
Check the package for any visible damage or missing
components.
1.2 Power connection:
Connect the power cord to a suitable power source following
safety guidelines.
1.3 Fuse:
Ensure the fuse in the system is of the correct rating and
replace if necessary.
1.4 Environment:
Operate the system in a well-ventilated area with stable
temperature and humidity levels.
1.5 Use of Test Fixture:
Follow the provided instructions for correctly using the test
fixture with the system.
1.6 Warm-up:
Allow the system to warm up for the recommended time before
performing tests.
1.7 Other features:
Familiarize yourself with other features of the system as
described in the manual.
Chapter 2: Introduction
2.1 Introduction to front panel:
Understand the functions and controls available on the front
panel of the system.
2.2 Introduction to rear panel:
Learn about the connections and ports on the rear panel for
proper setup.
…
Frequently Asked Questions (FAQ)
Q: How do I calibrate the system?
A: Calibration instructions can be found in Chapter 4 of the
user manual.
Q: Can I use this system for testing different types of
transformers?
A: Yes, the system is designed to test various types of
transformers. Refer to Chapter 5 for details on compatibility.
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OPERATION MANUAL TH2840 Series
Automatic Transformer Test System
Changzhou Tonghui Electronic Co.,Ltd. www.tonghui.com.cn
I
Contents
Chapter 1 Out of Box Audit…………………………………………………………………………………………….1
1.1
To Inspect the package …………………………………………………………………………………….1
1.2
Power connection ……………………………………………………………………………………………1
1.3
Fuse ………………………………………………………………………………………………………………1
1.4
Environment …………………………………………………………………………………………………..1
1.5
Use of Test Fixture ………………………………………………………………………………………….2
1.6
Warm-up ……………………………………………………………………………………………………….. 2
1.7
Other features…………………………………………………………………………………………………2
Chapter 2 Introduction ……………………………………………………………………………………………………4
2.1
Introduction to front panel ……………………………………………………………………………….4
2.2
Introduction to rear panel …………………………………………………………………………………6
2.2.1 Rear panel description 1……………………………………………………………………………6
2.2.2 Rear panel description 2……………………………………………………………………………8
2.3
Introduction to display zone……………………………………………………………………………..9
2.4
Main menu keys and corresponding displayed pages …………………………………………10
2.4.1 [DISP] ………………………………………………………………………………………………….10
2.4.2 [SETUP]……………………………………………………………………………………………….10
2.4.3 [SYSTEM] …………………………………………………………………………………………… 11
2.5
Basic Operation…………………………………………………………………………………………….11
2.6
Power on and off ………………………………………………………………………………………….. 11
Chapter 3 Description of LCR Function Module ……………………………………………………………..13
3.1
3.1.1 Common test conditions………………………………………………………………………….13
3.1.2 Test function………………………………………………………………………………………….13
3.1.3 Scaling position……………………………………………………………………………………..14
3.1.4 Result display of bin sort…………………………………………………………………………15
3.1.5 Save the bridge test results on the USB flash drive……………………………………..16
3.2
- ………………………………………………………………………………………………16
- Power-supplying voltage range: 100~120Vac or 198~242Vac. Being related with the power setup on the rear panel.
- Power-supplying frequency range: 47~63Hz. 3) Power-supplying power range:
not less than 130VA. 4) Power supplying input phase line L, zero line N,
ground lead E should be as same as the power
plug of the instrument. 5) After careful design, the instrument can reduce the clutter jamming caused by AC power
terminal input, however, it should be used under the environment with low- noise. Please install power filter if being unavoidable. —————————————————————————— Warning: In order to prevent user and instrument from being hurt by leakage, it is necessary for user to guarantee the ground line of supply power being reliably grounded. ——————————————————————————
1.3 Fuse
The instrument has installed fuse, so operators should use the installed fuse of our company. —————————————————————————— Warning: Be sure that the location of fuse is consistent with power-supplying voltage range before charging. ——————————————————————————
1.4 Environment - Please do not operate the instrument in the place that is vibrative, dusty,
under direct sunlight
1 - To guarantee the accurate measurement, the warm-up time is no less than 30
minutes. 2) Please not turn on or off instrument frequently, in order to avoid
the inner data fluster.
1.7 Other features
Power: consumption power130VA. Dimensions (WHD): TH2840A, TH2840B, TH2840AX, TH2840BX: 430mm177mm265mm; TH2840NX: 430mm177mm405mm Weight: TH2840A, TH2840B, TH2840AX, TH2840BX about 11kg; TH2840NX is about 17 kg.
2 - [Display] menu Press the [Display] key to enter the corresponding test display page of the meter function (bridge, transformer measurement, transformer scan, focus scan).
- [SETUP] menu Press the [Setup] key to enter the corresponding test setting page of the meter function (bridge, transformer measurement, transformer scan).
- Knob with confirmation function Move the cursor, select and set parameters. The confirm button function in the middle is used to terminate data input, confirm and save the data input by the knob.
- Cursor keys and OK key The cursor keys are composed of up (), down (), left () and right (), which are used to move the cursor between the fields on the LCD display page. When the cursor moves to a certain field, the field will be highlighted on the LCD screen. The middle of the cursor keys is the OK key, and its function is similar to the [Enter] key.
- [SYSTEM] Press this key to enter into the system setup page.
- [ESC] key ESCAPE key.
- Numeric key The numeric keys are used to input data to the instrument. The numeric keys are composed of numeric keys [0] to [9], decimal point [./,] and [+/-] keys.
- [] key Backspace key. Press this key to delete the last digit of the entered value.
- [] key This button is only used in transformer scan, and is used for continuous input of pins.
- Magnitude key The magnitude key is used to input the magnitude of the corresponding parameter.
- PASS indicator LED indicator shows the test result has passed.
- FAIL indicator LED indicator shows the test result has failed.
- [Reset] key Press the [Reset] key to pause the scan in the list scan and trace scan of the bridge, and press the [Trigger] key again to continue the scan from the previous pause. In the automatic transformer scan, press the [Reset] key to stop the scan and the next trigger will start from the beginning.
- [Trigger] key When the trigger mode is set to Single mode, press this key to trigger the instrument.
- Test terminals (UNKNOWN) 4-teminal test pair are used to connect
4-terminal test fixture or cable to measure DUT. The 4 terminals are
respectively as follows: Hcur, Hpot, Lpot and Lcur. Transformer secondary test
terminal (TURNS) (+): Secondary (+) terminal (-): Secondary (-) terminal
5 - LAN interface LAN interface is used to realize the control and the communication of network system.
- USB Device interface The tester can communicate with PC through the USB Device interface.
- Trans Handler interface The Handler interface of the transformer scan to realize the sorting output of the transformer scan results.
- TRIGGER interface External trigger devices such as foot control can be connected.
- Trans Controller interface The Handler extension interface of transformer scanning. When the number of sorting signals of the transformer scanning Handler interface is insufficient, this interface can be used to expand the sorting signal and realize the sorting output of the transformer scanning result.
- LCR HANDLER interface The Handler interface can realize the sorting output of the test results. This interface is used for the sorting of the single- group test of the bridge and the transformer.
- Scanning cable interface Scanning cable interface uses FRC-50P horn socket.
- RS232C serial interface The serial communication interface can realize the
online communication with the computer.
2.3 Introduction to display zone
TH2840 uses a 10.1-inch capacitive touch screen, and the content displayed on the screen is divided into the following display areas, as shown in Figure 2-4.
9 -
One is to use the number keys to input directly.
-
The other one is to use the soft key area (according to the prompts to perform frequency
- Distribution impedance must be reduced to the Min. especially when testing
high impedance components. 2. Contact resistance must be reduced to Min. 3.
Short and open must be available between contact points. Open and short
correction can easily reduce the influence of distribution impedance of the
test fixture on measurement. For open correction, the clearance between test
terminals should be the same with that when they connects with DUT. For short
correction, the short plate of low impedance should be connected between test
terminals. Another way is to directly connect Hc with Lc or Hp with Lp, then
connect both. Note: When the DUT is a polarity component, before testing, the
high potential terminal should be connected to the terminal with mark “+”,
“Hc” or “Hp” and the low terminal should be connected to the terminal with
mark “-“, “Lc” or “Lp”. Warning: Before testing, please discharge the tested
polarity component so as to avoid the damage to the instrument.
55 - Due to the influence of output internal resistance (30, 100), when the primary inductance is too small, the distributed voltage signal is small and the transformer gets weak energy. As the test cable and relay will attenuate some energy, the stability and the accuracy of test will be affected.
- If the primary signal is enlarged, the secondary winding of the winding with more turns will generate higher voltage which may beyond the acceptable range thus affecting the test accuracy.
- If the winding group with more turns is put in primary class, then the
transformer can get higher energy thus the two problems above can be avoided.
6.1.3 Transformer leakage inductance test
When use the circuit discussed in last section to make automatic sweep test on the leakage inductance of primary inductance L1, the instrument will automatically use the relay to short the secondary winding of the transformer so as to test the leakage inductance. From transformer secondary winding to inner relay, the magnetic leakage is existed inevitably, so there is error of leakage inductance in this zone. If user wants to obtain an accurate leakage value, please short the secondary winding of the transformer based on the figure below.
SEC+
3.2.1 USB flash drive data save ……………………………………………………………………….17
3.3
3.3.1 Trigger………………………………………………………………………………………………….18
3.3.2 Scale …………………………………………………………………………………………………….18
3.3.3 Read …………………………………………………………………………………………………….19
3.3.4 Trace…………………………………………………………………………………………………….19
3.3.5 USB flash drive data save ……………………………………………………………………….21
3.3.6 Other test results…………………………………………………………………………………….22
3.4
3.4.1 Test function………………………………………………………………………………………….23
3.4.2 Frequency……………………………………………………………………………………………..24
3.4.3 Level…………………………………………………………………………………………………….24
3.4.4 Speed……………………………………………………………………………………………………25
3.4.5 Range …………………………………………………………………………………………………..26
II
3.4.6 DC Bias ………………………………………………………………………………………………..26
3.4.7 Level monitor function……………………………………………………………………………27
3.4.8 Trigger………………………………………………………………………………………………….28
3.4.9 Average ………………………………………………………………………………………………..29
3.4.10 Automatic level control…………………………………………………………………………..29
3.4.11 Source resistance……………………………………………………………………………………29
3.4.12 Deviation and reference ………………………………………………………………………….30
3.5
3.5.1 Compare switch……………………………………………………………………………………..31
3.5.2 Compare count switch…………………………………………………………………………….31
3.5.3 Comparison function limit mode………………………………………………………………32
3.5.4 Compare parameters……………………………………………………………………………….32
3.5.5 Deviations and references ……………………………………………………………………….32
3.5.6 BIN Switch……………………………………………………………………………………………33
3.5.7 High-low limit……………………………………………………………………………………….33
3.6
- …………………………………………………………………………………………………33
3.6.1 Total Point …………………………………………………………………………………………….34
3.6.2 Trigger mode …………………………………………………………………………………………34
3.6.3 List mode………………………………………………………………………………………………34
3.6.4 Sweep condition …………………………………………………………………………………….34
3.6.5 Parameter function …………………………………………………………………………………35
3.6.6 High/low limit ……………………………………………………………………………………….35
3.6.7 Delay ……………………………………………………………………………………………………35
3.7
Trace Setup…………………………………………………………………………………………………..35
3.7.1 Common test conditions………………………………………………………………………….36
3.7.2 4 sweep parameters ………………………………………………………………………………..36
3.7.3 Spilt ……………………………………………………………………………………………………..36
3.7.4 Sweep point…………………………………………………………………………………………..37
3.7.5 Sweep Type …………………………………………………………………………………………..37
3.7.6 Trace mode……………………………………………………………………………………………37
3.7.7 X Format ………………………………………………………………………………………………37
3.7.8 Max-Min ………………………………………………………………………………………………38
3.7.9 Ordinate range setting …………………………………………………………………………….38
3.8
User Correction …………………………………………………………………………………………….38
3.8.1 Open …………………………………………………………………………………………………….39
3.8.2 Short …………………………………………………………………………………………………….40
3.8.3 Load …………………………………………………………………………………………………….41
3.8.4 Load type………………………………………………………………………………………………42
3.8.5 Cable ……………………………………………………………………………………………………42
3.8.6 Point frequency operation ……………………………………………………………………….42
Chapter 4 System and File …………………………………………………………………………………………….44
4.1
4.1.1 Mode Setup …………………………………………………………………………………………..44
4.1.2 User Setup …………………………………………………………………………………………….45
III
4.1.3 RS232…………………………………………………………………………………………………..46
4.1.4 LAN …………………………………………………………………………………………………….47
4.1.5 Tools…………………………………………………………………………………………………….48
4.2
4.2.1 U-disk manage performance ……………………………………………………………………50
4.2.2 Introduction to Store/Recall Function ……………………………………………………….50
4.2.3 Basic menu operation of file management …………………………………………………51
4.2.4 Operation steps for file management ………………………………………………………..52
Chapter 5 Execute LCR measurement operation and some examples………………………………….54
5.1
Correction operation………………………………………………………………………………………54
5.1.1 Sweep correction……………………………………………………………………………………54
5.1.2 Point-frequency correction………………………………………………………………………54
5.2
Correct connection of DUT…………………………………………………………………………….55
5.3
Eliminate the influence of stray impedance ………………………………………………………56
5.4
Operation example for testing inductance…………………………………………………………57
5.4.1 Test Condition ……………………………………………………………………………………….57
5.4.2 Operation steps………………………………………………………………………………………57
5.5
Operation example of testing capacitance by multi-frequency list sweep ……………..58
5.5.1 Test condition ………………………………………………………………………………………..58
5.5.2 Operation steps………………………………………………………………………………………58
5.6
Operation example of load correction ………………………………………………………………60
5.6.1 Operation steps………………………………………………………………………………………60
5.6.2 Note……………………………………………………………………………………………………..60
Chapter 6 Transformer Single-machine Test ……………………………………………………………………61
6.1
Circuit for transformer single-machine test……………………………………………………….61
6.1.1 Some parameters of transformer ………………………………………………………………61
6.1.2 Transformer single test circuit and TURN test……………………………………………61
6.1.3 Transformer leakage inductance test …………………………………………………………62
6.1.4 Capacitance test between windings of transformer ……………………………………..62
6.2
6.2.1 Trigger………………………………………………………………………………………………….63
6.2.2 Speed……………………………………………………………………………………………………63
6.2.3 Test Mode……………………………………………………………………………………………..63
6.2.4 Rsou …………………………………………………………………………………………………….64
6.2.5 Bias Source……………………………………………………………………………………………64
6.2.6 Comp……………………………………………………………………………………………………64
6.2.7 Parameter Setup …………………………………………………………………………………….64
6.3
6.3.1 Save the test results of a single set of transformers on the USB flash drive ……66
Chapter 7 Transformer Auto Scanning Test……………………………………………………………………..67
7.1
Introduction to scan test function …………………………………………………………………….67
7.2
Install and connect the scanning test system ……………………………………………………..67
7.3
Front panel of scanning box……………………………………………………………………………68
7.4
Rear panel of scanning box …………………………………………………………………………….70
IV
7.5
HANDLER interface……………………………………………………………………………………..70
7.5.1 Timing diagram of HANDLER signal ………………………………………………………70
7.5.2 Distribution and connection diagram for HANDLER………………………………….70
7.6
Example of transformer………………………………………………………………………………….71
7.7
Clear Settings ……………………………………………………………………………………………….72
7.8
7.8.1 Transformer ID………………………………………………………………………………………73
7.8.2 Primary Nums ……………………………………………………………………………………….73
7.8.3 Secondary Nums ……………………………………………………………………………………73
7.8.4 Rescan Interval………………………………………………………………………………………73
7.8.5 Scan Disp Mode …………………………………………………………………………………….73
7.8.6 Fail Rescan ……………………………………………………………………………………………74
7.8.7 Bias On Delay ……………………………………………………………………………………….74
7.8.8 Ignore Nom …………………………………………………………………………………………..74
7.8.9 Trigger Delay ………………………………………………………………………………………..74
7.8.10 Cylinder Ctrl………………………………………………………………………………………….75
7.8.11 Scan Box Mode ……………………………………………………………………………………..75
7.8.12 Resistance Source…………………………………………………………………………………..75
7.8.13 Bias Source……………………………………………………………………………………………75
7.9
Trans Pin To Fixture………………………………………………………………………………………76
7.9.1 Pin To Fixture Setup……………………………………………………………………………….76
7.9.2 Pin Label Setup ……………………………………………………………………………………..77
7.10 Pin Setup ……………………………………………………………………………………………………..77
7.10.1 Trans Pin Setup ……………………………………………………………………………………..78
7.10.2 Series Pins Setup ……………………………………………………………………………………79
7.10.3 Parallel Pins Setup………………………………………………………………………………….79
7.11
7.11.1 Frequency, voltage, switch and scanning sequence……………………………………..81
7.11.2 TURN Test Conditions Setup…………………………………………………………………..81
7.11.3 Lx Test Conditions Setup ………………………………………………………………………..84
7.11.4 Lk Test Conditions Setup ………………………………………………………………………..87
7.11.5 Cx Test Conditions Setup ………………………………………………………………………..90
7.11.6 Zx Test Conditions Setup ………………………………………………………………………..93
7.11.7 ACR Test Conditions Setup …………………………………………………………………….96
7.11.8 DCR Test Conditions Setup …………………………………………………………………….98
7.11.9 PS Test Conditions Setup ………………………………………………………………………..99
7.11.10 BL Test Conditions Setup………………………………………………………………………101
7.11.11 Handler Mode Function ………………………………………………………………………..103
7.11.12 Parameter copy function………………………………………………………………………..103
7.11.13 Statistics Page………………………………………………………………………………………103
7.12
7.12.1 Each Display Zone under this page…………………………………………………………105
7.12.2 Function Keys under this page ……………………………………………………………….105
7.12.3 PRI page-turning function……………………………………………………………………..106
V
7.12.4 Pin Display Function for Stray Capacitance …………………………………………….107
7.12.5 BAL Balance parameter display……………………………………………………………..107
7.13
7.13.1 Transformer scan setup file (*.t40) …………………………………………………………108
7.13.2 Operation steps for file manage ……………………………………………………………..109
7.13.3 Transformer deviation-deduction ……………………………………………………………109
7.14 Focus ………………………………………………………………………………………………………… 110
7.15 Split ………………………………………………………………………………………………………….. 111
7.16 Frequently asked questions and answers in transformer scan test………………………. 112
7.16.1 High and low limits ……………………………………………………………………………… 112
7.16.2 Measurement item loss………………………………………………………………………….112
7.16.3 Measurement interruption …………………………………………………………………….. 113
7.16.4 Poor DCR accuracy………………………………………………………………………………113
7.16.5 Poor Lk accuracy………………………………………………………………………………….113
7.16.6 Inaccurate TURN ………………………………………………………………………………… 113
7.16.7 Unstable TURN……………………………………………………………………………………114
7.16.8 Difference between the first and the second Lx ……………………………………….. 114
7.16.9 Poor stability of Cx and Zx open test data ………………………………………………. 114
7.16.10 DCR and PS open cannot reach infinite large ………………………………………….. 114
7.17 User-made test fixture …………………………………………………………………………………. 114
7.17.1 Use TH1801-EXT2A-OUT to make test fixture ………………………………………. 115
7.17.2 Example of using TH1801-EXT11A(5.0)-B pin signal …………………………….. 115
Chapter 8 Performance and Test ………………………………………………………………………………….. 117
8.1
Test function……………………………………………………………………………………………….117
8.1.1 Parameter and symbol ………………………………………………………………………….. 117
8.1.2 Test combination …………………………………………………………………………………. 118
8.1.3 Mathematical operation…………………………………………………………………………118
8.1.4 Equivalent mode…………………………………………………………………………………..118
8.1.5 Range ………………………………………………………………………………………………… 118
8.1.6 Trigger………………………………………………………………………………………………..118
8.1.7 Delay time ………………………………………………………………………………………….. 118
8.1.8 Connection modes of test terminals ……………………………………………………….. 119
8.1.9 Test speed (Frequency>=10kHz) …………………………………………………………… 119
8.1.10 Average ……………………………………………………………………………………………… 119
8.1.11 Display digit ……………………………………………………………………………………….. 119
8.2
Test signal………………………………………………………………………………………………….. 119
8.2.1 Test signal frequency…………………………………………………………………………….119
8.2.2 Signal mode…………………………………………………………………………………………119
8.2.3 Test signal level……………………………………………………………………………………120
8.2.4 Output impedance ………………………………………………………………………………..120
8.2.5 Monitor for test signal level …………………………………………………………………..120
8.2.6 Maximum measurement display range…………………………………………………….120
8.2.7 DC bias voltage source………………………………………………………………………….120
8.2.8 2A Bias Current Source…………………………………………………………………………121
VI
8.3
Measurement accuracy…………………………………………………………………………………121
8.3.1 Accuracy ofZ,Y, L, C, R, X, G, B…………………………………………………121
8.3.2 D accuracy…………………………………………………………………………………………..121
8.3.3 Q accuracy…………………………………………………………………………………………..122
8.3.4 accuracy…………………………………………………………………………………………..122
8.3.5 G accuracy…………………………………………………………………………………………..122
8.3.6 Rp accuracy…………………………………………………………………………………………122
8.3.7 Rs accuracy …………………………………………………………………………………………123
8.3.8 DCR accuracy ……………………………………………………………………………………..123
8.3.9 Lk accuracy …………………………………………………………………………………………123
8.3.10 Turns Ratio accuracy…………………………………………………………………………….123
8.3.11 Accuracy factor ……………………………………………………………………………………124
8.4
Safety requirement ………………………………………………………………………………………127
8.4.1 Insulation resistance ……………………………………………………………………………..127
8.4.2 Insulation intensity ……………………………………………………………………………….128
8.4.3 Leakage current……………………………………………………………………………………128
8.5
Electromagnetic compatibility ………………………………………………………………………128
8.6
Performance test………………………………………………………………………………………….128
8.6.1 Working condition………………………………………………………………………………..128
8.6.2 The used instruments and devices …………………………………………………………..128
8.6.3 Function check …………………………………………………………………………………….129
8.6.4 Test signal level……………………………………………………………………………………129
8.6.5 Frequency……………………………………………………………………………………………129
8.6.6 Measurement accuracy………………………………………………………………………….129
8.6.7 Accuracy of C and D…………………………………………………………………………….129
8.6.8 Accuracy of L………………………………………………………………………………………130
8.6.9 Accuracy of Z………………………………………………………………………………………130
8.6.10 Accuracy of DCR…………………………………………………………………………………130
Chapter 9 Command Reference……………………………………………………………………………………132
9.1
GPIB Common Commands…………………………………………………………………………..132
9.2
SCPI Command…………………………………………………………………………………………..133
9.2.1 DISPlay subsystem commands ………………………………………………………………135
9.2.2 FREQuency subsystem commands …………………………………………………………136
9.2.3 VOLTage subsystem commands …………………………………………………………….136
9.2.4 CURRent subsystem commands …………………………………………………………….137
9.2.5 AMPLitude subsystem commands………………………………………………………….137
9.2.6 OUTPut subsystem commands ………………………………………………………………138
9.2.7 BIAS subsystem commands…………………………………………………………………..138
9.2.8 TRIGger subsystem commands ……………………………………………………………..140
9.2.9 AMPLitude Auto Level subsystem commands …………………………………………141
9.2.10 Output RESister Internal Resistance subsystem commands ……………………….141
9.2.11 FUNCtion subsystem commands ……………………………………………………………141
9.2.12 COMParator subsystem commands ………………………………………………………..145
9.2.13 LIST subsystem commands …………………………………………………………………..148
VII
9.2.14 TRACE subsystem commands……………………………………………………………….154
9.2.15 Handler subsystem commands ……………………………………………………………….157
9.2.16 FETCh? subsystem commands ………………………………………………………………158
9.2.17 CORRection subsystem commands ………………………………………………………..160
9.2.18 Mass MEMory subsystem commands……………………………………………………..165
9.2.19 TRAN subsystem commands …………………………………………………………………167
9.2.20 SYSTem system subsystem commands …………………………………………………..172
9.3
Modbus commands ……………………………………………………………………………………..177
9.3.1 Command format …………………………………………………………………………………177
9.3.2 CRC16 calculation method – look-up table method …………………………………..179
9.3.3 Command function comparison table………………………………………………………180
Chapter 10 Description for Handler………………………………………………………………………………..187
10.1 Bin Sorting Handler Description…………………………………………………………………………..187
10.1.1 Technology Description ………………………………………………………………………..187
10.1.2 Electrical feature ………………………………………………………………………………….191
10.1.3 Handler Wiring Operation Instructions of BIN Sorting ……………………………..194
10.1.4 Using Operations………………………………………………………………………………….196
10.2 List Sweep Handler Description ……………………………………………………………………197
10.2.1 List Sweep Sorting Logic………………………………………………………………………197
10.2.2 Technical Description……………………………………………………………………………198
10.2.3 Electrical Feature …………………………………………………………………………………201
10.2.4 List sweep sorting wiring operation instructions……………………………………….201
10.2.5 Using operation ……………………………………………………………………………………201
10.3 HANDLER description of transformer single group test…………………………………..202
10.3.1 Sorting logic ………………………………………………………………………………………..202
10.3.2 Technical description…………………………………………………………………………….202
10.3.3 Electrical Feature …………………………………………………………………………………204
10.3.4 Handler wiring operation instructions for transformer single measurement ….205
10.3.5 Using Operation …………………………………………………………………………………..205
10.4 Transformer scan HANDLER description ………………………………………………………206
10.4.1 Technical Description……………………………………………………………………………206
10.4.2 Electrical Feature …………………………………………………………………………………208
10.4.3 Handler wiring operation instructions for transformer Scan ……………………….212
10.4.4 Using operation ……………………………………………………………………………………216
10.5 Instructions for HANDLER sorting of scanning fixtures…………………………………..216
VIII
Announcement
The description of the manual may not cover all contents of the instrument,
and our company is subject to change and to improve the performance, function,
inner structure, appearance, accessory and package of the instrument without
notice. If there is puzzle caused by inconsistency of manual and instrument,
then you can contact with our company by the address on the cover.
IX
Chapter 1 Out of Box Audit
When you receive the instrument, some inspections are necessary, and the
condition must be understood and available before installing the instrument.
1.1 To Inspect the package
Inspect the shipping container for damage after unpacking it. It is not
recommended to power on the instrument in the case of a damaged container. If
the contents in the container do not conform to the packing list, notify us or
your dealer.
1.2 Power connection
or where there is corrosive air. 2) The normal working temperature is 040,
relative humidity 75%, so the instrument
should be used under above condition to guarantee the accuracy. 3) There is
heat abstractor on the rear panel to avoid the inner temperature rising. In
order to keep
good airiness, please don’t obstruct the left and right airiness holes to make
the instrument maintain the accuracy. 4) Although the instrument has been
specially designed for reducing the noise caused by ac power, a place with low
noise is still recommended. If this cannot be arranged, please make sure to
use power filter for the instrument. 5) Please store the instrument in the
place where temperature is between 5 and 40, humidity is less than 85%RH. If
the instrument will not be put in use for a time, please have it properly
packed with its original box or a similar box for storing. 6) The instrument,
especially the test cable should be far from strong electro-magnetic field, to
avoid the jamming on measurement.
1.5 Use of Test Fixture
Please use the accessory test fixture or cable, the test fixture made by user
or from other company may cause the incorrect measurement result. The test
fixture or cable should be kept clean, as well as the pin of DUT, thus to
guarantee the good connection between DUT and fixture. Connect the fixture or
cable to four test terminals Hcur, Hpot, Lcur, Lpot on the front panel. As for
the DUT with shielding shell, connect shielding layer or ground “”. Note: When
test fixture or cable has not being installed, the instrument will display an
unstable test result.
1.6 Warm-up
Chapter 2 Introduction
In this chapter, the basic operation features of TH2840 series are described. Please read the content carefully before using TH2840X series instruments.
2.1 Introduction to front panel
Figure 2-1 shows the front panel of TH2840 Series.
1 234
5
6
7 8 9 10 11
12 13 14 15 16 17 18 19 20
Preset Help PrtScn
TH2840NX Automatic Transformer Test System
20 Hz -500kHz
Display Setup System
78
9 M/p
PASS
4
5
6
k/n
FAIL
123
0 ./, +/- m
Esc
~ Enter
Reset
OK
Home
Cal
File
Trigger
POWER
28 27 26
LCUR
LPOT
HPOT
HCUR
±42 Vdc Max
25
24 23 22
Turns
(-)
(+)
21
Figure 2-1 Front panel 1) USB HOST interface
TH2840 is equipped with two USB HOST interfaces, which are used to connect U
disk storage for file saving and recall, and it can also connect to devices
such as mouse, keyboard, and scanner. Note that only one U disk storage can be
inserted at the same time. 2) [Preset] key Reset button, press [Preset] to
restore the instrument to the factory default settings. 3) [Help] key Help
key. Press the [Help] key, the [Help] key will be lit, and the display will
pop up the function meaning and operation instructions where the cursor is
located. Press the [Help] button again, the [Help] button will go out, and the
operation instruction window will disappear. 4) [PrtScn] key Screenshot
button, save the picture of the current interface to the USB storage. 5) Brand
and model Brand and model 6) LCD liquid crystal display 1280×800 color LCD
capacitive touch screen, showing the measurement results and conditions.
4
NOTE: TH2840A and TH2840B have no transformer secondary measuring terminal.
22) [File] key
This key is used to enter into FILE MANAGE interface quickly. 23) [Enter] key
[Enter] key is used to terminate data input, confirm and save the data
displayed in the input line. 24) [Cal] key User calibration execution shortcut
keys. 25) [Home] key The [Home] key is used to switch between different
functions such as electric bridge, transformer single-group test, and
transformer scan. 26) POWER Power switch. The instrument is red in the standby
state and green in the power-on state. To shut down, you need to press and
hold the power switch. 27) [DC Bias] key [DC Bias] key is used to allow or
prohibit the output of 0-100mA, ±40V, 0-2A DC bias source. Press the [DC Bias]
key, the [DC Bias] key will be lit, indicating that the DC bias output is
allowed; press the [DC Bias] key again, the [DC Bias] key will go out,
indicating that the DC bias output is prohibited. In some non-test screens
where DC Bias cannot be added, pressing this button will have no response. 28)
[LOCK] key Press the [LOCK] key, the [LOCK] key will be lit, indicating that
the key functions of the current panel are locked; press the [LOCK] key again,
the [LOCK] key will be off, indicating that the keyboard lock state is
released. If the password function is set to “ON”, the correct password must
be entered when unlocking the keyboard, otherwise the keyboard lock cannot be
unlocked. When the instrument is controlled by RS232, USB_Device, Lan port,
etc., the [LOCK] button will be lit. Press the [LOCK] key again, the [LOCK]
key will go out, indicating that it returns to the local unlocked state of the
keyboard.
2.2 Introduction to rear panel
The rear panels of different models of TH2840 series are different. The
detailed description of the rear panel layout of TH2840A, TH2840B, TH2840AX,
TH2840BX will be introduced in 2.2.1 and the detailed description of the rear
panel layout of TH2840NX will be introduced in 2.2.2.
2.2.1 Rear panel description 1
Figure 2-2 briefly describes the rear panel of TH2840A, TH2840B, TH2840AX, and
TH2840BX.
6
WARNING: This instrument contains no operator
serviceable parts inside; refer servicing to service trained personnel only.
Disconnect input power before replacing fuse for continued fire protection,
use manual specified type rating fuse only.
1
Rating 110V/60Hz 100VA
~~ 220V/50Hz 100VA
Fuse T4AL 250V T2AL 250V
RS-232C
12
LCR Handler
11
Trans Controller
Trigger
10
9
Trans Handler
Device LAN
8
76
Trans Scanner
5 4 32
Figure 2-2 Rear panel 1) Nameplate
Indicate production date, instrument number, manufacturer and other
information. 2) Fuse base
Being used to install power fuse, protect instrument, and switch 110V/220V by
changing the direction of core. 3) Power socket Input AC power. Warning:
Before powering on, pay attention to whether your fuse position is consistent
with the supply voltage range. 4) TransScanner interface To control the
transformer scanning box through the Trans Scanner interface. It is compatible
with TH1901 and TH1831 scanning boxes, but different scanning boxes require
different connection cables. Tip: TH2840A and TH2840B have no transformer scan
function, so this interface cannot be used. 5) Ground terminal This terminal
is connected to the chassis of the instrument. It can be used to protect or
shield ground connections. 6) LAN interface LAN interface is used to realize
the control and the communication of network system. 7) USB Device interface
The tester can communicate with PC through the USB Device interface. 8) Trans
Handler interface The Handler interface of the transformer scan to realize the
sorting output of the transformer scan results. 9) TRIGGER interface External
trigger devices such as foot control can be connected. 10) Trans Controller
interface
7
The Handler extension interface of transformer scanning. When the number of
sorting signals of the transformer scanning Handler interface is insufficient,
this interface can be used to expand the sorting signal and realize the
sorting output of the transformer scanning result. 11) LCR HANDLER interface
The Handler interface can realize the sorting output of the test results. This
interface is used for the sorting of the single-group test of the bridge and
the transformer. 12) RS232C serial interface The serial communication
interface can realize the online communication with the computer.
2.2.2 Rear panel description 2
Figure 2-3 briefly describes the rear panel of TH2840NX.
1
! Warning:
To avoid electric shock, the power cord protective grounding conductor must be
connected to ground. Disconnect power supply before replacing fuse.
Rating 110V/60Hz 100VA
~~ 220V/50Hz 100VA
Fuse T4AL 250V T2AL 250V
RS-232C
13
12
LCR Handler
11
Trans Controller
Trigger
10
9
Trans Handler
Device LAN
8
76
Trans Scanner
5 4 32
Figure 2-3 Rear panel 1) Nameplate
Indicate production date, instrument number, manufacturer and other
information. 2) Fuse base
Being used to install power fuse, protect instrument, and switch 110V/220V by
changing the direction of core. 3) Power socket Input AC power. Warning:
Before powering on, pay attention to whether your fuse position is consistent
with the supply voltage range. 4) TransScanner interface To control the
transformer scanning box through the Trans Scanner interface. It is compatible
with TH1901 and TH1831 scanning boxes, but different scanning boxes require
different connection cables. 5) Ground terminal This terminal is connected to
the chassis of the instrument. It can be used to protect or shield ground
connections.
8
The element composition of this page includes: title area, test condition
area, 4 parameter result display area, sorting result display area, menu area,
title area, status bar.
2.4 Main menu keys and corresponding displayed pages
2.4.1 [DISP] When the LCR function is used, press this key to enter into the
LCR measurement display page. The function pages of this part are (use the
“touch screen” to select the following page functions, the same below): <Meas
Display>
When the transformer test function is used, press this key to enter into the
transformer test display page. The function pages of this part are:
When the transformer scan function is used, press this key to enter into the
transformer scan display page. The function pages of this part are: <Pri.>
Shutdown: After using the instrument, if you need to turn off the instrument,
press and hold the power button at the lower left corner of the front panel to
turn off the instrument. After turning off the instrument, the power button
lights up in red, and the instrument is in the standby state. If you do not
use the instrument for a long time, please disconnect the power cord and store
the instrument in the environment required by 1.4. Note: The factory password
is set for this series of products. The factory password is 2840. The user can
reset the password according to his needs during the use. For details, please
refer to the password item on the
12
Chapter 3 Description of LCR Function Module
3.1
When the LCR function is applied, press [DISP], the
The element composition of this page includes: title area, test condition area, 4 parameter result display area, sorting result display area, menu area, title area, status bar.
3.1.1 Common test conditions
There are 9 cursor fields in the measurement condition area of this display page, they are:
Frequency, Speed, DC Bias,
AC level,
AC range, Vm,
DC level,
DC range, Im.
Each control function domain will be described in detail on the
3.1.2 Test function
Touch the position of the parameter name in the test result area, and you can
see the selection menu of the corresponding test function in the right menu
area. Touch the corresponding selection area of
13
the menu to complete the function setting of the specified parameter. The menu
display is shown in Figure 3-1-2:
Figure 3-1-2 Parameter function setting
3.1.3 Scaling position
Parameter setting attributes: enumerated type. The position of the decimal
point has a direct relationship with the resolution of the result display, and
the relative stability of the result can also be seen intuitively. The
principle of position movement is to ensure that the number of digits remains
unchanged, with a certain decimal point on the left and right. As shown in
Figure 3-1-3:
Figure 3-1-3 Movement of the decimal point
14
Setting options:
Menu options Function description
Auto
The default setting item, which automatically
displays the position of the decimal point
Fix
Used to fix the current decimal point position
in the automatic state
Increase+
Move the decimal point to the left
Decrease- Move the decimal point to the right
Note:
In the following cases, the decimal point position lock function will be automatically cancelled and
restored to the floating decimal point display state.
Test function changes;
The deviation mode is changed.
3.1.4 Result display of bin sort
After touching or moving the cursor to the sorting result display area, the corresponding menu will involve some sorting controls, such as comparison switch, count switch, and count reset; as shown in Figure 3-1-4:
Figure 3-1-4 Quick settings for bin sorting
3.1.4.1 Comparison switch
The built-in comparison function of this series can divide the component under
test into up to 11 bins (BIN1 to BIN10 and BIN OUT). 10 groups of upper and
lower limits can be set, and the upper and lower limits of each file
containing 4 parameters can be set independently. If one or more parameters
are not involved in the comparison, then the corresponding upper and lower
limits can be cleared. When the parameters of the DUT participating in the
comparison are all within the range of the bin limit, the corresponding bin is
found. The result of the sorting can be output to the
15
automatic test system through the HANDLER interface to realize the automatic
sorting test. These limit settings can only be set on the
3.1.4.2 Bin count function
It is used to record and display the count value of each bin. Optional setting
of counting function: on or off (ON or OFF), the default state is: OFF.
3.1.4.3 Count reset
Perform a clearing operation on the count result of the current bin, so that
the bin count is reset to 0, which is used to restart counting.
3.1.5 Save the bridge test results on the USB flash drive
Use the USB flash drive to save the test results. The test results and formats
that can be saved are as follows: Time,P1,P2,P3,P4,BIN —-Respectively
correspond to the test time, parameter 1~4 result, bin result Save the switch;
The naming rule of the file name is rx+machine number+date,
such as: rx-SN12345678-20210811.csv,
3.2
On the page, you can enter a test frequency of up to 201 points,
test level, DC Bias, trigger delay, independent functions corresponding to 4
parameters, 4 independent parameters, and upper and lower limits corresponding
to each list sweep test point. These test points will be automatically scanned
and tested, and the test results will be compared with their corresponding
limit values. The test points on this display page will be automatically
scanned and tested, and the test results are compared with the limit values.
During the list sweep test, the leftmost symbol “*” indicates the current
sweep test point. Display as shown in Figure 3-2-1:
16
Figure 3-2-1 List display The P/F on the far right (representing PASS/FAIL) is
used to indicate the comparison result of the current point: No comparison
display: “—” PASS display: PASS (green) FAIL display: FAIL (red)
3.2.1 USB flash drive data save
Use the USB flash drive to save the test results. The test results and formats
that can be saved are as follows: Time, pt, para1-4, P1,P2, P3, P4, COMP
—-Respectively correspond to test time, point index, 4 parameter function,
parameter 1~4 result, comparison result. Save path prompt, default path loc
The naming rule of the file name is list+machine number+date,
such as: list-SN12345678-20210811.csv,
3.3
Press the menu key [Display], and then press the soft key Trace Display to
enter the
17
Figure 3-3-1 Trace display In this display function page, each scan will perform automatic scan measurement of the tested component at 51, 101, 201, 401 or 801 point frequency in a linear or logarithmic manner with increasing conditions within the user preset mode range. Dynamic display of the response curve of the main and secondary parameters of the component under test with the change of the mode conditions on the LCD screen, the result of any point within the scanning range can be read on the screen. Simultaneously, the maximum and minimum measurement values and corresponding test conditions of the component under test within the scan range will be displayed. Note: After the user has set the scanning conditions, the user must press the [Trigger] key on the front panel to start scanning. Press the [Reset] key once to pause the test, and press it again to reset and rescan.
3.3.1 Trigger
It is used to quickly set the trigger mode of the curve, refer to the trigger settup on the measurement setting page.
3.3.2 Scale
It is used to automatically set the Y-axis coordinate range corresponding to the curve. In the case of
Auto, the Y-axis scale range will be dynamically adjusted with the size range of the test result to
ensure that the drawn curve is in the display range;
It is recommended that when the DUT is relatively stable, you can let the scale automatically select
a relatively suitable scale range, and then set it to be fixed, and then manually press the up and down
direction keys to fine-tune the display range according to the actual situation.
Parameter setting attributes: enumerated type.
Optional parameters:
Speed
Test times
Auto
The scale will adjust automatically
Fix
The scale is fixed, but can be adjusted manually
18
3.3.3 Read
Condition setting for cursor reading Cursor: It is a red line. You can observe
the test results of different parameters under the same scanning condition by
turning the knob or moving the left and right keys. As shown in Figure 3-3-2:
Figure 3-3-2 Read cursor display effect
Value description:
Read parameter
Meaning
options
OFF
Cursor is not displayed
Manual
Manually adjust the cursor (knob and left and right
keys)
Para1Min
Para1Max
Para2Min
Para2Max
Automatically track the minimum or maximum
Para3Min
value position of parameter 1/2/3/4
Para3Max
Para4Min
Para4Max
3.3.4 Trace
Through the submenu of the curve button, you can quickly set the sweep points
of the curve, the curve display switch of 4 parameters, the split screen
effect of the curve display and other related functions, as shown in Figure
3-3-3:
19
Figure 3-3-3 Curve button setting menu
3.3.4.1 Sweep point
This parameter controls the number of points the instrument scans. That is, the number of points to be stepped within the start and end conditions. The system sets the number of measurement points in five groups: 51, 101, 201, 401, and 801. The more scan points you select, the more precise the image will be drawn, but the scan time will be longer. The system default points is 201.
3.3.4.2 Parameter switch
It is used to open or close the drawing switch of the specified parameter;
3.3.4.3 Split
The split screen effect of the curve display, the split screen options provided are:
Split
Description
1-Split All curves are displayed in the same drawing window
2-Split 4 parameters are grouped in pairs and displayed in the
corresponding drawing window
4-Split 4 parameters are displayed independently in their
respective drawing windows
The 2-split screen display effect is shown in Figure 3-3-4:
The 4-split screen display effect is shown in Figure 3-3-5:
20
Figure 3-3-4 Display effect of 2-split screen
Figure 3-3-5 Display effectof 4-split screen
3.3.5 USB flash drive data save
Use the USB flash drive to save the test results. The test results and formats
that can be saved are as follows: Time,pt ,x,P1,P2,P3,P4,COMP —-Respectively
correspond to test time, point index, x-axis size, parameter 1~4 result The
naming rule of the file name is rx+machine number+date, such as:
trace-SN12345678-20210811.csv, it is used to save the curve data to the USB
flash drive, the function menu is shown in Figure 3-3-6:
21
Figure 3-3-6 Save setting menu
In the open state of continuous saving, the naming rule of the file name is
trace + machine number + date, such as: trace-SN12345678-
Single save, the naming rule of the file name is trace-trg + machine number +
date, such as: trace-trg-SN12345678-20210811.csv,
3.3.6 Other test results
When the user selects the scan parameters as frequency and impedance, the
instrument will automatically display some parameters of the ultrasonic
device. The specific parameters are described as follows: Static capacitance
Ct: Static capacitance value at 1kHz. Static capacitance Dt: the capacitance
loss value at 1kHz. The minimum impedance Zmin and its corresponding frequency
fs, (point m on the screen). The maximum impedance Zmax and its corresponding
frequency fp, (point M on the screen).
F = fp fs
kp
f p fs 2.51 fs
Qm
f
2 p
2f s Z min C T (
f
2 p
f
2 s
)
3.4
Press [SETUP] to enter into the
22
Figure 3-4-1 Measurement setting
3.4.1 Test function
Parameter setting attributes: enumerated type. The four parameters of the impedance element can be measured at the same time in one measurement cycle. The measurable parameters are as follows:
Parameter name Cp
Lp
Rp
Gp Z
D z° y° X
Parameter meaning Equivalent parallel capacitance Equivalent parallel
inductance Equivalent parallel resistance Conductance Absolute value of
impedance Loss factor Impedance degree Admittance degree Reactance
Parameter name Cs
Ls
Rs
Bp Y
Q z y Rd
Parameter meaning Equivalent series capacitance Equivalent series inductance Equivalent series resistance Susceptance Absolute value of admittance Quality factor Impedance radian Admittance radian DC Resistance
Measurement function parameter setting operation steps: touch (or use the
cursor keys to move the cursor to) the parameter name area corresponding to
the test result, and select the setting in the soft key area on the right
according to the displayed optional parameters. There is no restriction on the
combination of the four parameters, and the combination can be selected
arbitrarily. The four parameters can be set with independent display switches:
that is, when the display switch corresponding to the parameter is turned off,
the corresponding result area will display OFF to replace the test result
display. The display switch function can be set in the parameter setting area
of the measurement display page.
23
3.4.2 Frequency
Parameter setting attribute: numeric input.
The maximum range of the test frequency of this series is from 20 Hz to 2 MHz, and the
minimum resolution is: 0.0001 Hz.
Note: The specific models have different support range for the frequency. For details, please
refer to the instrument selection guide. Here is a simple comparison description:
Instrument series model
Support range of Frequency
TH2840A, TH2840AX, TH2840NX
20Hz~500kHz
TH2840B, TH2840BX
20Hz~2MHz
Frequency range and test frequency point
Frequency range (F)
Test frequency point
Resolution
20Hz<= F <= 99.999Hz
20.0000Hz20.0001Hz ……99.9999Hz 0.0001Hz
100Hz <= F<= 999.9Hz
100.000Hz100.001Hz ……999.999Hz 0.001Hz
1kHz <= F<= 9.999kHz
1.0000kHz
0.01Hz
1.00001kHz ……9.99999kHz
10kHz <= F<=99.99kHz
10.0000kHz
0.1Hz
10.0001kHz……99.9999kHz
100kHz<= F<=999.9kHz 100.000kHz100.001 kHz……1MHz 1Hz
1MHz<= F<=2MHz
1.00000MHz1.00001 MHz……2MHz 10Hz
Operation steps for setting test frequency:
Directly touch or use the arrow keys to move the cursor to the frequency domain;
There are two test frequency setting methods for single machine:
increase and decrease enumeration operations);
3.4.3 Level
The test level is divided into AC level and DC level; AC level is mainly used for AC LCR test; DC level is mainly used for DC resistance test;
3.4.3.1 AC Level
Parameter setting attribute: numeric input. The test level is set by the
effective value of the test sine wave signal. The frequency of the sine wave
signal is the test frequency, which is generated by the internal oscillator of
the instrument. Either the test voltage value or the test current value can be
set. Voltage level range: 5mV ~ 20V. Current level range: 50uA ~ 100mA
24
Note: There is a linear constraint relationship of internal resistance between the voltage level and
the current level. (For example, the current level corresponding to 30 internal resistance is
166.7A ~ 66.67mA, and the current level corresponding to 100 internal resistance is 50A ~
100mA).
The signal source output impedance can be selected as 30 or 100 . When the test function is
selected as DCR.
Level voltage and resolution:
Voltage level (Vrms)
Resolution
[5m,1)
1mV
[1,20]
10mVrms
Note: The set test current is the output current value when the tested terminal is short-circuited. The
set test voltage is the output voltage value when the test terminal is open.
The automatic level control function can realize constant voltage or current measurement. The
automatic level control function (automatic level domain) can be set to ON on
the
page. When the automatic level control function is turned on, a “*” sign will be displayed after the
current level value.
Operation steps for setting test level:
Touch and click the AC level corresponding area, the menu area displays the switching function of
the level type and adding smaller functions, you can modify and adjust according to the menu
prompts, or you can directly enter the number keys to modify the value.
Note: When you need to switch the test level between current and voltage, you must use the menu
area.
3.4.3.2 DC Level
Parameter setting attribute: numeric input.
As a test condition for DC resistance (RD).
DC level range:
Internal
DC Level range
resistance
30
0.1V ~ 2V
4 parameters are
0.1V ~ 20V
100
all RD
Other
0.1V ~ 2V
Level voltage and resolution:
Voltage Level (Vrms)
Resolution
[0.1,1]
1mV
(1,20]
10mV
3.4.4 Speed
Parameter setting attributes: enumerated type. The test speed is mainly determined by the following factors:
25
Integration time (A/D conversion); Average times (the number of times used to
obtain the average value of the continuous measurement results); Measurement
delay (the time from start to start of measurement); Display time of
measurement results; Generally speaking, when measuring slowly, the test
result is more stable and accurate. You can choose FAST+, FAST, MED and SLOW 4
test speeds. See the description in section 8.1.9 for details.
3.4.5 Range
The range is divided into AC range and DC range. The AC range is used to test
AC LCR parameters, and the DC range is used to test DC resistance. Parameter
setting attributes: enumerated type. The test range is selected according to
the impedance value of the LCR component under test. AC test range: 0.1, 1,
10, 20, 50, 100, 200, 500, 1k, 2k, 5k, 10k, 20k, 50k, 100k. DC test range:
0.1, 1, 10, 20, 50, 100, 200, 500, 1k, 2k, 5k, 10k, 20k, 50k, 100k. Operation
steps for setting test range: Use the cursor keys to move the cursor to the
Range field. The screen will display the following soft keys. Auto This
softkey is used to set the range to AUTO (automatic) mode. Hold This softkey
is used to switch the range from AUTO mode to HOLD mode. When the range is set
to HOLD (hold) mode, the range will be locked in the current test range. The
current test range will be displayed in the range field of the screen.
Increase + This soft key is used to increase the range in the HOLD mode.
DecreaseThis softkey is used to decrease the range in HOLD mode. Use the soft
keys to set the test range.
3.4.6 DC Bias
Parameter setting attribute: numeric input. It involves the selection of bias
source and bias type, digital size range setting and other related settings.
3.4.6.1 Bias Source
This series comes standard with two types of internal bias sources or external
biases for selection.
26
The corresponding options and input ranges are as follows:
Bias Source
Bias Type
Internal 100mA
Voltage
(Voltage, current, internal
resistance are related to Ohm’s
Current
law)
Internal 2A
Current
External TH1778
Current
Input Range -40V~40V
-100mA~100mA
0~2A 0~120A Determined by external bias current source
3.4.6.2 Bias Type
In the case of using the internal bias source of 100mA, the bias current mode or the bias voltage mode can be selected, and the maximum setting size is restricted by the relationship of the internal resistance. Parameter setting attribute: numeric input. Provides a built-in DC bias voltage ranging from -40V to +40V. Press the [DC Bias] key on the front panel to allow the set DC bias output. When the DC bias output is allowed, the [DC Bias] button will be lit.
3.4.6.3 DCI isolation
Parameter setting attributes: enumerated type. The bias current isolation function can prevent the influence of DC current on the test input circuit. The ISO domain can set the bias current isolation function ON or OFF. In the single measurement page (measurement display), the switch control of ISO is determined by the user’s settings. In the list sweep and trace sweep test functions, when the current is above a certain level, it is automatically controlled by the set current. Note: After the bias current isolation function is turned on, it will affect the test accuracy. Therefore, when testing high- impedance components under low frequency and small bias current conditions, the bias current isolation function should be set to OFF.
3.4.6.4 Bias polarity
3.4.7 Level monitor function
Parameter setting attributes: enumerated type. The level monitoring function
allows you to monitor the actual voltage across the DUT or the actual voltage
and current values flowing through the DUT. The voltage monitoring value is
displayed in the Vm monitoring field on the
27
The current monitoring value is displayed in the Im monitoring field on the
When the instrument is triggered by the HANDLER interface, the trigger delay
time can ensure reliable contact between the DUT and the test terminal.
3.4.8.3 Step delay
Parameter setting attribute: numeric input. The step delay is the delay time
from the output of the test signal to each measurement. The step delay time
setting range is: 0 s to 60 s, and the minimum resolution is 1 ms. Note: There
are two step delays in the RD measurement, because the voltage in the positive
and negative directions needs to be added, so there are two measurement
cycles. So it is actually twice the step delay time.
3.4.9 Average
Parameter setting attribute: numeric input. The average function calculates
the average of the results of 2 or more tests. The number of averages can be
set from 1 to 255, and the minimum resolution is 1.
3.4.10 Automatic level control
Parameter setting attributes: enumerated type. The automatic level control
function can adjust the actual test level (the voltage at both ends of the DUT
or the current flowing through the DUT) to the set test level value as much as
possible. Using this function can ensure that the test voltage or current at
both ends of the DUT remains constant. Note: When the constant level function
is valid, if the level setting exceeds the above range, the constant level
function will be automatically set to OFF. The currently set level value is
generally regarded as a non-constant level value. The constant level function
is set to ON or OFF, indicating that the automatic level control function is
turned on or off respectively.
3.4.11 Source resistance
When using the internal 100mA bias current, the output of the signal source
has an output resistance, and the output signals of other bias current modes
are not output through this internal resistance. Parameter setting attributes:
enumerated type. The internal resistance can be selected: 100 , 30 , and the
default is 100 . When testing inductance, in order to compare data with other
types of testers, it is necessary to ensure the same output resistance value.
Note: When using the internal 100mA bias current output, 100 internal
resistance is recommended by default.
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3.4.12 Deviation and reference
3.4.12.1 Deviation mode
Parameter setting attributes: enumerated type. The deviation test function can
make the deviation value (instead of real test value) be directly displayed on
the screen. The deviation value is equivalent to the real test value
subtracting the pre-set reference value. This function brings great
convenience to observe variations of component parameters with temperature,
frequency, bias. The instrument provides two deviation test modes as below:
(Absolute Deviation mode)
The deviation currently displayed is the difference between the test value of
the DUT and the preset reference value. The formula of calculating ABS is as
below:
Where, X is the test value of DUT
Y is the preset reference value. % (Percentage deviation mode)
The deviation currently displayed is the percentage of the difference between
the test value of DUT and the preset reference value divided by the reference
value. Its calculating formula is as below:
%(/ Y ×100 [%] Where, X is the test value of DUT.
Y is the preset reference value. If the reference value is 0, the test result
shows Inf;
3.4.12.2 Deviation reference value
Parameter setting attribute: numeric input type. It is the reference value
used to calculate the deviation of the test result; Reference value setting
method: 1) Regular numerical input; 2) Automatic recording after measurement:
Select the measurement function in the corresponding menu area of the
reference, a test will be executed, and the test result will be recorded here
as the parameter value.
3.5
Press the menu key [Setup], and then press the Limit Setup soft key to enter
the
30
Figure 3-5-1 Limit setup The comparator function of the instrument can be set on this page. 10 bin limits can be set, and the measured results can be sorted into up to 11 bins (BIN1 to BIN10 and BIN OUT). Comparison ON/OFF (comparison function switch) Count ON/OFF (comparison count switch) Mode (comparison function limit mode) Parameters (test parameters) Deviation (deviation mode) Reference (reference value in deviation mode, namely nominal value) Switches for each sorting bin Lower limit value of each BIN (Low) Upper limit value of each BIN (High)
3.5.1 Compare switch
Parameter setting attributes: enumerated type.
Setting item Meaning description
OFF
Turn off the compare function
ON
Turn on the compare function
3.5.2 Compare count switch
Parameter setting attributes: enumerated type.
Setting item Meaning description
OFF
Turn off the compare count function
ON
Turn on the compare count function
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3.5.3 Comparison function limit mode
The comparison function provides the following two parameter limit setting
modes. As shown in Figure 3-3. 1) Tolerance mode In tolerance mode, set the
deviation value from the nominal value (the nominal value is set in the
nominal field) as the comparison limit value. There are two ways of deviation:
one is the percentage deviation, and the other is the absolute deviation. 2)
Sequential mode In sequential mode, the test value range is used as the
comparison limit value. The comparison limit value must be set in ascending
order.
Figure 3-5-2 Tolerance mode and continuous mode Note: When setting the limit
value of the tolerance mode, the error range must be set from small to large.
If the error range set by BIN1 is the largest, then all the tested parts will
be sorted into BIN1 file. In tolerance mode, the lower limit does not have to
be less than the nominal value, and the upper limit does not have to be
greater than the nominal value. The limits of each BIN can be discontinuous or
overlapped.
3.5.4 Compare parameters
The comparison parameters adopt the 4 measurement parameters, which are
consistent with the 4 measurement parameters; the sorting parameters can be
modified on the measurement display page or the measurement setting page.
3.5.5 Deviations and references
Refer to the setting of the deviation and reference on the measurement setting
page, the meaning of the parameter here is exactly the same as the meaning of
the measurement setting.
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3.5.6 BIN Switch
Parameter setting attributes: enumerated type.
Set the independent comparison switch of the specific sorting BIN:
Setting Item Meaning description
OFF
Turn off the comparison function of the specified BIN
ON
Turn on the comparison function of the specified BIN
When the corresponding sorting BIN is OFF, the sorting process will skip this sorting limit
comparison.
3.5.7 High-low limit
As the main basis for parameter comparison. If the upper and lower limits of the corresponding BIN are not set, it indicates that the parameter in the corresponding BIN does not participate in the comparison, that is, the test result does not affect the comparison result; if only a lower limit or upper limit is set, the effect of unilateral comparison will be produced. Parameter setting attribute: numeric input type. Note: When the upper and lower limits only set the upper or lower limit, it is regarded as a unilateral comparison.
3.6
Press [SETUP] and then List Setup to enter into the page as shown
below.
(Figure 3-6-1 List setup) The list sweep function can perform auto sweep test
for the test frequency, test level or bias voltage of 201 points. On <LIST
SETUP> page, the following list sweep parameters can be set. Total Point
Trigger mode List mode (sweep mode)
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Sweep condition (frequency [Hz], level [V], level [I], bias [V], bias [I]) Parameter function High/low limit (HIGH, LOW) Single point delay (DELAY[s])
3.6.1 Total Point
Set the number of points to be scanned for list sweep, the value range is 1~201; Parameter setting attributes: enumerated type.
3.6.2 Trigger mode
It is the same as the trigger mode on the measurement setting page. After the list sweep is triggered normally, the user can interrupt the list sweep process by pressing the Reset button: Press Reset once to enter the pause state, and continue scanning at the current point after triggering again; Press Reset twice to enter the reset state, and scan from the first point after triggering again;
3.6.3 List mode
Set list sweep mode, sequence mode or single-step mode.
Parameter setting attributes: enumerated type.
Sequence mode When the trigger is valid, sweep sequentially from
the first point to the last point
Single-step
When the trigger is valid, only one point can be
mode
tested at a time
Note: The effect of the list mode is mainly reflected in the single trigger mode. If it is the continuous
trigger mode, the test process of the two modes will be visually different.
3.6.4 Sweep condition
Frequency, level, and bias can be set independently, and can also be quickly set to make one of the conditions remaining relatively regular. If you are only concerned about the impact of one condition change on the DUT, you can quickly set other test conditions to the same result, such as a linear change in frequency, and a fixed level and bias. Regarding the frequency, level and bias in the sweep condition, you can choose whether to display it on the test page, touch the title area corresponding to the parameter, and then select ON or OFF on the corresponding menu.
34
3.6.5 Parameter function
4 parameter functions, all of which can be set independently, and can also be
quickly set to make one of the conditions relatively consistent;
Figure 3-6-2 List parameter display menu
3.6.6 High/low limit
The upper and lower limits of the parameters can be set independently, and can
also be set quickly to make the settings have a certain relationship.
3.6.7 Delay
The delay parameter indicates the delay time from the completion of each sweep
step measurement to the next sweep measurement. It is mainly used to connect
an external bias source (such as TH1778) to adapt to the delay time setting
required by the external bias current source. (Note: The delay here can be
accumulated with the delay in the measurement setting interface.)
3.7 Trace Setup
Press [Setup] and then Trace Setup to enter into the
35
Figure 3-7-1 Trace Setup This display function page is used to complete the setting of trace sweep measurement parameters, including split, sweep point, sweep type, start condition, stop condition, trace mode, X Format, Max-Min switch, 4 parameters, and Y display range, etc.
3.7.1 Common test conditions
Frequency, level, speed, range, offset, trigger, delay, etc. are all common test conditions, and their meaning and setting method are exactly the same as the description on the measurement setting page.
3.7.2 4 sweep parameters
The 4 sweep parameters are used to specify the result parameters of the trace sweep, that is, to draw the test results under certain conditions into a curve; The 4 sweep parameters and the conventional component 4 test parameters are independent of each other and not directly related. Optional parameters can be selected except RD; The 4 sweep parameters correspond to 4 curves, each curve has independent display switch, display scale and independent ordinate scale, but share the same abscissa scale.
3.7.3 Spilt
For the curve display effect, 3 kinds of split screen display are available:
Split
Description
1 Split
All curves are displayed in the same drawing window
2 Split
4 parameters are grouped in pairs and displayed in the
corresponding drawing window
4 Split
4 parameters are displayed independently in their
respective drawing windows
36
3.7.4 Sweep point
Here is the number of points to be scanned. There are five groups of 51, 101, 201, 401, 801 to choose from.
3.7.5 Sweep Type
The sweep type is mainly used to set the conditions of the trace sweep, that is, to plot the test results
according to the selected condition parameters, so it involves the type of condition parameters, the
start size and the stop size of the condition change.
Sweep Type
Set the main conditions corresponding to the sweep curve, namely frequency [Hz], level [V], level
[A], bias [V], bias [A];
Sweep type
Description
Linear Logarithm
Freq[Hz] The condition changes within the
Level [V] specified interval (between start and
×
Level[A] stop), and record the corresponding
×
Bias[V]
parameter results after changing in a
×
Bias[A]
linear or logarithmic relationship
×
Starting conditions
After selecting the sweep type, to set the start size and stop size of the corresponding conditions;
that is, the start and stop points of the trace sweep.
3.7.6 Trace mode
Set the trace sweep mode, sequence mode or single step mode.
Parameter setting attributes: enumerated type.
Sequence When the trigger is valid, sweep sequentially from the
mode
first point to the last point
Single
When the trigger is valid, only one point can be tested at a
step mode time
Note: The effect of the trace mode is mainly reflected in the single trigger mode. If it is the
continuous trigger mode, the test process of the two modes will be visually different.
3.7.7 X Format
This area is used to change the coordinate mode of sweep, mainly for the abscissa.
Linear
The sweep condition parameters are linearly distributed in the start
and stop ranges
Logarithm The sweep condition parameters are distributed in a logarithmic
37
manner with the base 10 in the start and stop ranges Note: The log mode is only valid in the case of sweeping frequency.
3.7.8 Max-Min
Set ON or OFF: ON
OFF
Display the maximum and minimum values of the parameter curve results Do not display the maximum and minimum values of the parameter curve results
3.7.9 Ordinate range setting
The ordinate range is used to limit the drawing range of trace sweep. The
instrument defaults to automatic coordinates. Only when the user locks the
coordinates, this item needs to be set manually. Similarly, the maximum value
should be greater than the minimum value, otherwise an error message will be
displayed.
3.8 User Correction
10 user Pt are provided on the
Figure 3-8-1 User correction The open, short and load correction functions on
the
38
Two correction methods are provided:
Correction mode Full frequency correction
Point frequency correction
Description Use insertion method to execute open and short correction of all frequency points Execute open, short and load correction of the current set frequency point
The following measurement control parameter setting domains can be set on the
3.8.1 Open
The open correction function can eliminate the error caused by the stray admittance (G, B) connected in parallel with the component under test. As shown in Figure 3-8-2.
Figure 3-8-2 Stray admittance
The following two open-circuit correction data are used:
Regardless of the frequency you currently set, perform an open-circuit correction test on all the
following fixed frequency points. In addition to the following frequency points, based on the
open-circuit correction data at the following frequency points, the instrument can calculate all open
correction data of different test ranges which corresponds to all test frequencies by using the
interpolation calculation method. Move the cursor to the Open field, and use the softkey Meas Open
to execute the full frequency open correction. The fixed frequency points are as follows (some
models will be limited due to different frequency ranges).
20 Hz
25 Hz
30 Hz
40 Hz
50 Hz
60 Hz
80 Hz
100 Hz
120 Hz
150 Hz
200 Hz
250 Hz
300 Hz
400 Hz
500 Hz
600 Hz
800 Hz
1 kHz
1.2 kHz
1.5 kHz
2 kHz
2.5 kHz
3 kHz
4 kHz
5 kHz
6 kHz
8 kHz
10 kHz
12 kHz
15 kHz
20 kHz
25 kHz
30 kHz
40 kHz
50 kHz
60 kHz
80 kHz
100 kHz
120 kHz
150 kHz
200 kHz
250 kHz
300 kHz
400 kHz
500 kHz
600 kHz
800 kHz
1MHz
1.1MHz
1.2MHz
1.3MHz
1.4MHz
1.5MHz
1.6MHz
1.7MHz
1.8MHz
1.9MHz
2MHz
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Operation steps of open correction function:
Open correction includes full frequency open correction using interpolation calculation method and
single frequency open correction for the set frequency point. Carry out the following steps to
perform open correction for full frequency using the insertion calculation method. For details about
single-frequency open correction, please refer to the “Load Correction” operating instructions.
Move the cursor to the Open setting field, and the following soft keys are displayed in the soft key
area of the screen.
Function
Description
OFF
Turn off the open correction function. The calculation of open
correction will no longer be carried out in the subsequent
measurement process.
ON
Make the open correction valid and the open correction
calculation will be performed in the subsequent test process. If
the frequency settings are all OFF, the open correction
calculation uses the open correction data of the current
frequency calculated by the interpolation method. If the
frequency is set to ON, and the current test frequency is equal to
the corresponding frequency, the open correction data of the
corresponding frequency will be used for the calculation of
open correction.
Meas Open
The open admittance (capacitance and inductance) at the above
fixed frequency point will be measured. It takes about 75
seconds for open-circuit full-frequency correction. During
open-circuit full-frequency correction, the following soft keys
are displayed.
DCR Open
The open circuit resistance measurement under the DC
resistance function will be performed.
Note: Connect the test fixture to the test terminal of the instrument. The fixture is
open and not connected to any component under test.
3.8.2 Short
The short correction function of TH2829X can eliminate the error caused by spurious inductance (R, X) in serial with DUT as shown in figure 3-8-3.
Figure 3-8-3 Spurious Inductance The following two short-circuit correction
data are used: Regardless of the frequency you currently set, perform an
short-circuit correction test on all the
40
following fixed frequency points. In addition to the following frequency points, based on the
short-circuit correction data at the following frequency points, the instrument can calculate all short
correction data of different test ranges which corresponds to all test frequencies by using the
interpolation calculation method. Move the cursor to the Short field, and use the softkey MEAS
Short to execute the full frequency short correction. The fixed frequency point is the same as the
open correction.
Operation steps of short-circuit correction function:
The short-circuit correction includes the full-frequency short-circuit correction using the insertion
calculation method and the single-frequency short-circuit correction for the set frequency point.
Perform the following steps to perform short-circuit correction at full frequency using the insertion
calculation method. For details on single-frequency short-circuit correction, please refer to the
“Load Correction” operating instructions.
Move the cursor to the short-circuit setting field, and the following soft keys are displayed in the
soft key area of the screen.
Function
Description
OFF
Turn off the short correction function. The
calculation of short correction will no longer be
performed in the subsequent measurement process.
ON
Make the short correction valid and the short
correction calculation will be performed in the
subsequent test process. If the frequency settings
are all OFF, the open correction calculation uses
the short correction data of the current frequency
calculated by the interpolation method. If the
frequency is set to ON, and the current test
frequency is equal to the corresponding frequency,
the short correction data of the corresponding
frequency will be used for the calculation of short
correction.
Meas Short
Connect the test fixture to the test terminal of the
instrument. Short the test fixture with a
short-circuit strip. Press the soft key Meas short,
and the short-circuit parasitic impedance (resistance
and reactance) at the above fixed frequency point
will be measured. It takes about 75 seconds for the
short-circuit full-frequency correction. During the
short-circuit full-frequency correction process, the
following soft keys are displayed on the screen.
DCR Short
The short-circuit resistance measurement of the DC
resistance function will be performed.
3.8.3 Load
The load correction function uses the transfer coefficient between the actual
test value at the set
41
frequency point and the standard reference value to eliminate other test errors. It can be seen that
open circuit, short circuit and load correction can be performed at the set frequency point. Before
setting the standard reference value, the reference value must be set in the reference value
corresponding field. When the cursor moves to Freq or Ref, the screen displays the soft key Load.
Press the Load key to perform a load correction test on the standard.
Load correction function switch option:
Function
Description
OFF
Invalidate the load calibration test data under the
current set frequency.
ON
Make the load calibration test data valid at the
current set frequency.
3.8.4 Load type
When performing load correction, the reference value of the standard device must be input in
advance.
The test parameters of the reference value should be consistent with the set load correction test
function. The load correction function uses the transfer coefficient between the actual test value at
the set frequency point and the standard reference value to eliminate other test errors. The load
correction test function is only used to calculate the transfer coefficient.
This series categorizes the load types into 3 categories:
Load Type
Description
Ls~Rs
Ls~Q
Cp~D
3.8.5 Cable
The cable length currently available is 0 m and 1 m. The factory default is 0m calibration.
3.8.6 Point frequency operation
Follow the steps below to perform an open/short/load correction test on the set frequency point.
Move the cursor to the frequency setting area. The screen will display the following soft keys.
Function
Description
OFF
Invalidate the open/short/load calibration test data at the
current set frequency.
ON
Make the open/short/load correction test data valid under
the current set frequency, and the frequency setting field
displays the originally set open/short/load correction
frequency.
Open
Perform a open correction test on the current frequency
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Short Load
Perform a short correction test on the current frequency. Perform a load correction test on the current frequency.
3.8.6.1 Steps of load correction
1. Move the cursor to the Freq setting area, and set the frequency to be
calibrated. 2. Open the test fixture, and press the soft key Open to perform
open correction for the current set
frequency. 3. Short-circuit the test fixture and press the soft key Short to
perform short-circuit correction for
the current set frequency. 4. Prepare a measurement standard device, move the
cursor to the Load Type setting field, and set
the type of function parameters that the standard device needs to measure. 5.
Move the cursor to the corresponding frequency setting domain, connect the
standard device to
the test fixture, press the softkey Load, and the instrument will perform a
load calibration. The actual test result of the standard device is displayed
on the load.
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Chapter 4 System and File
4.1
Press the menu key [System] to enter the
4.1.1 Mode Setup
Figure 4-1-1 System Setup
4.1.1.1 Bus Mode
The bus mode is used to select the communication mode of the instrument.
The options are as follows:
AUTO
Automatically select the RS232/LAN/USB
communication mode according to the external
signal input
RS232
RS232
External 485
External GPIB
LAN
USB Device
USBCDC USBTMC
Note: The GPIB option of our company must be installed to support the GPIB mode. When using the RS485 or GPIB interface, the bus address under the RS232 setting will be used as the local address.
44
4.1.2 User Setup
4.1.2.1 Key Sound
Parameter type: enumerated Parameter option OFF ON
Description Turn off the key sound. Turn on the key sound.
4.1.2.2 Pass Sound
Parameter type: enumerated
Parameter function: This area is used to control and display the sound mode when the measurement
comparison result of the instrument is qualified.
Parameter option Description
OFF
Choose not to sound the alarm
Two short
Choose to emit two low and short alarm sounds
Low long
Choose to emit a low and long alarm sound
High short
Choose to emit a high and short alarm sound
High long
Choose to emit a high and long alarm sound
4.1.2.3 Fail Sound
Parameter type: enumerated
Parameter function: This area is used to control and display the alarm sound mode when the
measurement comparison result of the instrument is defective.
Parameter option Description
OFF
Choose not to sound the alarm
Two short
Choose to emit two low and short alarm sounds
Low long
Choose to emit a low and long alarm sound
High short
Choose to emit a high and short alarm sound
High long
Choose to emit a high and long alarm sound
4.1.2.4 Language
Parameter type: enumerated Parameter function: This area is used to control
and display the operating language mode of the current instrument.
Parameter option Description
45
English Chinese
Choose English operating language Choose Chinese operating language
4.1.2.5 Password
Parameter type: enumerated type + input type
Parameter function: This area shows the current password protection mode.
Parameter
Description
operation
options
OFF
Turn off the password protection
Lock system
Open the password protection, including file
protection and power-on password
Lock file
File protection for users
Lock setup
Used to restrict the tester’s modification
operations on the setting file
Modify
This soft key is used to modify the password.
Modify operation: after pressing this button,
enter the new password according to the
prompt on the screen. After inputting from the
keyboard, the screen prompts to confirm the
new password, repeat the new password, and
the password modification is completed.
Note: The factory default password is 2840.
4.1.2.6 Datetime
When moving to the datetime zone, you can modify the system time.
4.1.3 RS232
The general setting parameters of the serial port are: 8 data bits, 1 stop bit, no parity bit.
4.1.3.1 Buadrate
Parameter type: enumerated
Parameter function: used to select the baud rate of the built-in RS232 interface of the instrument.
Options 4800 19200 57600
9600 38400 115200
46
4.1.3.2 Address
Parameter type: input type Parameter function: used to control and display the RS485, GPIB interface and Modbus bus address of the current instrument. Value range: 1~32
4.1.3.3 Cmd mode
Parameter type: enumerated
Parameter function: command mode can be set with SCPI command and ModeBus command
protocol.
Parameter option SCPI ModBus
Description Adopt general ascii string command protocol Adopt ModBus command protocol
For related introduction, please refer to Chapter 11 Communication Command Reference Chapter.
4.1.4 LAN
Configure the corresponding address parameters according to the specific
attributes of the connected LAN, and plug in the network cable on the rear
panel to use the network port for communication. If you need to modify the
relevant address parameters, you can directly double-click the corresponding
address display window to pop up the numeric keyboard, enter the correct
network configuration on the numeric keyboard, and click OK to exit the
keyboard to complete the modification; If the connected networking equipment
(router or switch) supports the automatic IP allocation function, you can
directly click the automatic configuration button in the display window to try
the automatic configuration. The configuration takes a few seconds. Do not
operate the machine during the configuration process; if it does not support
it You need to manually assign the setting address; if the automatic
configuration fails, you may get the loopback IP address of the machine, that
is, 127.0.0.1; at this time, you can click the default setting button in the
display window to restore the default configuration, and then start again on
the basis of the default configuration. Just make fine adjustments, and you
can consult the company’s network technical engineer to obtain the address
parameters of the network configuration. Default port number: 45454 The host
name generally corresponds to the instrument model.
47
4.1.5 Tools
4.1.5.1 Preset
For the convenience of customers, the instrument can be initialized to a known unified initial state.
Standardize initial software operation design .
In order to solve the problem of inconsistent setting status when the instrument leaves the factory.
English menu Description
Command
Restore the following parameters to the factory
CLEAR 1 SETTING
default settings: a. Parameters set through front panel operation
*RST
b. Parameters set by SCPI commands
Restore the following parameters to the factory
default settings:
2 CLEAR SET&CORR
a. Parameters set through front panel operation b. Parameters set by SCPI commands
:SYST:PRES
c. Power-off protection parameters
d. Clear user correction data
Restore the following parameters to the factory
default settings:
FACTORY 3
DEFAULT
a. Parameters set through front panel operation b. Parameters set by SCPI commands c. Power-down protection data
:SYS:DEFT
d. Clear user reset data
e. Clear files saved by users
Note: Parameters that cannot be initialized
The initialization operation is not allowed to clear the system calibration data.
The real-time clock date and time are not allowed to be cleared or initialized.
Please refer to the appendix for the detailed recovery list of parameters later.
4.1.5.2 Update
This function is mainly used for software version upgrade and maintenance. This series of machines is designed with multiple CPUs. For user convenience, one-key upgrade operation is provided. After the one-key upgrade operation, the user only needs to wait for about 2 minutes according to the prompts. After the upgrade is completed, the instrument will automatically restart. After restarting, you can return to this menu to see whether the software version is the latest version after the upgrade. The menu display is shown in Figure 4-1-2:
48
Figure 4-1-2 Upgrade menu The dynamic prompt window of one-click upgrade is
shown in Figure 4-1-3:
Figure 4-1-3 Upgrade waiting prompt
4.2
Because this series is equipped with an embedded system, it is very convenient
to store the parameters set by the user in the form of a file in the system
internal or external U disk. When the same settings are to be used next time,
the user does not need to reset these parameters , Just load the corresponding
file, you can get the last set parameters. This greatly saves the user’s time
to repeatedly set parameters and improves production efficiency. Press the
soft key [File] to enter the
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4.2.1 U-disk manage performance
As mentioned above, this series is equipped with a USB HOST interface as standard, and an external USB flash drive can be used as a storage medium, thus breaking the limitation of the internal storage size of the instrument. You can also copy these files to an IBM PC with a USB interface or a desktop computer or Notebook computers compatible with it, so as to achieve unlimited expansion. Supports USB storage devices (USB flash drives) with the following performance: Compliant with USB 2.0 standard File format: FAT16 or FAT32 (formatted with Microsoft Windows operating system)
4.2.2 Introduction to Store/Recall Function
This section will introduce information about the store/recall function. Through the storage/recall function, the user can save the instrument configuration information to the internal Flash of the instrument or an external USB flash drive, and recall it from the internal Flash or external USB flash drive of the instrument. The test results and screenshots can only be saved in the external USB flash drive. middle.
usb: external file
The storage methods and uses are introduced. The following table 4-1 explains the available storage
methods and their uses:
Store method
Can be
Usage
Type
file format recalled or
not
LCR Setting files *.sta
Yes
Save the LCR test
configuration status of
50
the instrument
Transformer single *.trt
Yes
Save the instrument’s
group setting file
transformer single-group
test configuration status
Transformer sweep *.t40
Yes
Save the instrument’s
setting file
transformer sweep test
configuration status
Screenshot save *.png
No
Save a screenshot of the
instrument
Test data
*.csv
No
Save test data
Table 4-1 Storage methods and uses
4.2.3 Basic menu operation of file management
The various operations on the file are as follows: The up and down keys and
the knob of the arrow keys are used to move the file cursor up and down, and
the left and right keys of the arrow keys are used to operate the expanded
state of the current path; Click to select the file name to be operated, and
the operation can be performed as follows according to the toolbar on the
right side of the Save .sta/.trt/.t40 According to the main mode of the
current test, it mainly corresponds to the LCR mode, the transformer single
group mode, and the transformer sweep mode. The default menu is the
corresponding file save menu. When the focus of the file list is under the
files path, the measurement will be performed after inputting the file name.
The setting file is saved in the root
Copy to E: When the cursor is under the path corresponding to files, copy the
file or folder corresponding to the cursor to the USB root directory; Note: If
the file to be copied is a file, it will overwrite the file in the usb path
when there is a file with the same name in the usb; if the file to be copied
is a folder, please make sure that there is no folder with the same name in
the USB root directory, otherwise it will cause Copy failed. Copy to I:
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When the cursor is under the path corresponding to usb, copy the file or
folder corresponding to the
Delete
Load Load the setting file specified by the file index to reconfigure the
parameter settings of the
Rename Rename the name of the file or folder at the cursor position;
New folder Create a new folder directory at the current cursor location; you
can save a new test file in the newly created folder directory.
4.2.4 Operation steps for file management
Move the cursor: the arrow keys up and down and the knob can move the cursor;
Expand and contract: the left and right keys of the arrow keys can realize the
expansion and zooming function of the folder.
4.2.4.1 File save
Move the cursor to the folder or any file in the folder where you want to save
the setting file, and the corresponding menu area will display the file menu.
Load (If it is a loadable file type, this menu will be displayed) Save Copy to
E: Rename Delete New folder Press the Save soft key, the screen will display a
numeric keyboard to input the file name, the file
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name suffix is automatically generated, and there is no need to input the
suffix; After the input is confirmed, a named setting file will be generated
in the current directory. 4.2.4.2 File load When the cursor moves to the file
type that can be loaded, the menu is displayed as above. Move the cursor to
the location of the file to be loaded in the file list. Or directly enter the
file serial number. Press the Load soft key, and the following confirmation
dialog box will be displayed on the screen. Load Cancel Pressing the soft key
No will cancel the current loading operation and return to step 1. After
confirming by pressing Load, the currently selected file is loaded. After
loading, it will intelligently return to the corresponding measurement display
page. 4.2.4.3 File Copy Move the cursor to the folder or file to be copied,
the menu area will display Copy to E: Copy to I: Press the key to copy to E:,
copy the file to the root directory of the external storage USB disk of the
instrument. Press the key to copy to I:, and copy the file to the internal
root directory of the instrument. Note: Please make sure that your USB flash
drive meets the standards described in this section and is not write-
protected.
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Chapter 5 Execute LCR measurement operation and some
examples
5.1 Correction operation
To execute correction operation (in order to prevent the stray impedance from
affecting the test accuracy, it is necessary to make open/short correction),
users can select one of the two correction modes.
5.1.1 Sweep correction
Press the menu key [Cal] and the instrument will display the < Correction>
page. Move the cursor to the OPEN zone. ON, OFF, MEAS OPEN and DCR OPEN will
be
displayed in the soft key zone. Keep the test fixture be in the open status,
then press MEAS OPEN to execute open correction till the prompt information
zone displays that open correction is finished. Press ON to turn on the open
correction function. Insert the short plate (TH26010) to the test fixture.
Move the cursor to the SHORT zone. ON, OFF, MEAS SHORT and DCR SHORT will be
displayed in the soft key zone. Press MEAS SHORT to execute the short
correction till the prompt information zone displays that the short correction
is finished. Press ON to turn the short correction function. Move the cursor
to the LOAD zone. ON, OFF will be displayed in the soft key zone. Press OFF to
turn off the load correction function. Move the cursor to the FREQ zone, ON,
OFF, MEAS OPEN, MEAS SHORT and MEAS LOAD will be displayed in the soft key
zone. Press OFF to turn off the point-frequency correction function of FREQ.
5.1.2 Point-frequency correction
This function will gain better results in single-frequency test. If the test
frequency is 5.5kHz, Press the menu key [Cal] and the instrument will display
the < Correction> page. Move the cursor to the FREQ zone, ON, OFF, MEAS OPEN,
MEAS SHORT and MEAS LOAD will be displayed in the soft key zone. Press ON to
turn on the point-frequency correction function of FREQ. Press the key to
input the specified frequency size of 5.5k. The frequency area will be changed
to 5.5000kHz (the same as the test frequency). Keep the test fixture be in
open status and press MEAS OPEN to execute open correction.
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Insert the short plate (TH26010) to the test fixture. Press MEAS SHORT to
execute short correction.
5.2 Correct connection of DUT
The instrument has HCUR (current sampling high end Hc), LCUR (current sampling
low end Lc), HPOT (voltage sampling high end Hp), LPOT (voltage sampling low
end Lp) and a total of four pairs of test terminals corresponding to the
shielding end of each test terminal. Each terminal contains shielding layer
whose function is to reduce the influence of the ground stray capacitance and
the interference of the electromagnetic field. In the process of testing,
Hcur, Hpot and Lpot, Lcur should be connected with DUT lead to form a complete
4-terminal measurement, thus reducing the effect of the lead and the
connection points on the test results (especially the dissipation
measurement). When testing low-ohm components, Hpot, Lpot should be connected
to the lead terminal so as to avoid the impedance being added to the lead
impedance and the connection principle is that the Hpot and Lpot test should
be the actual existed voltage on DUT. In other words, before connecting to
DUT, it is not recommended to connect Hcur, Hpot with Lpot, Lcur, for doing
this will increase test error. If the connection point and the lead resistance
R lead are far weaker than the tested impedance (for example: Rlead<Zx/1000,
the accuracy error is required to be less than 0.1%), before connecting to
DUT, it is recommended to connect Hcur, Hpot and Lpot, Lcur (Two terminal
test). In the test with high accuracy requirement, using Kelvin test fixture
(standard accessory) will gain better results than using test leads. When
Kelvin test lead is used under 10kHz, a better measurement result can be
obtained. However, when the frequency is higher than 10kHz, it cannot meet the
measurement demand. In high frequency, the change of the clearance between
test leads will directly change stray capacitance and inductance on test
terminals and this problem is unavoidable, because the test leads cannot be
fixed in a position. So, the use of the test fixture should be used as
possible in high frequency. If the test fixture is unavailable or cannot be
used, the status of test leads should be the same in the processes of
correction and test. No matter the standard Kelvin test fixture or Kelvin test
leads or user-made fixture is used, the following requirements should be met.
5.3 Eliminate the influence of stray impedance
Hc
Hp
Lp
Lc
Shielding ground
Cd
Test terminal
Metal conductor
Cx
Ch
Cl
Figure 5-1 Influence of stray capacitance
Hc
Hp
Lp
Lc
Shielding ground
Shielding plate
Test terminal
Cx
Metal conductor
Figure 5-2 Eliminate the influence of stray capacitance When the DUT has high
impedance(such as small capacitance), the influence of stray capacitance
cannot be ignored. Figure 5-1 is an example of the use of 4 terminal pair
measurement. In this figure, Cd is connected with Cx in a parallel way and
when a conductance plate is positioned under DUT, capacitance Ch will connect
with Cx in parallel after connecting with Cl in series and by this way the
measurement result will have errors. If a ground conductor is installed
between high and low terminals, Cd can be reduced to Min. Meanwhile if the
ground terminal is connected to the conductance plate, the influence of Ch and
Cl will be eliminated. When the DUT is low impedance (such as small
inductance, large capacitance), a large current will flow through test leads
Hc and Lc. In this case, electromagnetic coupling between test leads becomes
the main source of test errors except the influence of the contact resistance
on test terminals. If this coupling cannot be eliminated, it will bring
unexpected influence on test results. Generally, contact resistance affects
the resistance of impedance and electromagnetic affects the reactance of
impedance. Test terminals can adopt 4TP connection method. For 4 terminal-pair
(4TP) connection, the currents flow though Hc and Lc are equal in value and
opposite in direction with those flowing through each shielding terminals (the
current reflow from Hc to shielding layer). By
56
this way, the magnetic fields produced by these currents can be mutually
offset and further eliminate the influence of mutual inductance coupling on
test results.
5.4 Operation example for testing inductance
5.4.1 Test Condition
Function: Ls-Q Frequency: 5.5kHz Level: 1.5Vrms Internal impedance: 100
5.4.2 Operation steps
Turn on the instrument. Set basic parameters. Press [Display] to enter into
the
If the test result is obviously incorrect, please check the following items.
a) Check the tested inductance is in good connection with the test fixture or
not. b) Check the test fixture is in good connection with the test terminals
of the instrument or not. c) Redo the open/short correction. NOTE: When the
sweep open/short correction is used, the point-frequency correction function
should be set as OFF. Refer to Correction operation in this chapter.
5.5 Operation example of testing capacitance by multi-frequency list
sweep
5.5.1 Test condition
Function: Cp, D
Level: 1Vrms
Other parameters
Frequency Compare parameter
1kHz
Cp (capacitance)
10kHz 100kHz
DDissipation DDissipation
Sound: HIGH LONG
Alarm mode: OUT
Low limit 325.0nF 0.0001 0.0060
5.5.2 Operation steps
Turn on the instrument.
High limit 333.0nF 0.0003 0.0100
58
5.5.2.1 Set basic parameters
Press [Display] to enter into the page.
Press the knob to move the cursor to the parameter area of sweep point 1,
modify the test conditions of the current point, including Frequency, Level,
Bias, Limit, Delay, etc.
5.5.2.2 Sound setup
Press [System] to enter into the
page. The instrument will test continuously and then display the test and the
compare results on page. If the compare result is Pass or Fail, there is a
sound alarm. As shown below:
If the test result is obviously incorrect, please check the following items.
Check the tested inductance is in good connection with the test fixture or
not. Check the test fixture is in good connection with the test terminals of
the instrument or not. Redo the open/short correction. NOTE: When the sweep
open/short correction is used, the point-frequency correction function should
be set as OFF. Refer to Correction operation in this chapter.
59
5.6 Operation example of load correction
5.6.1 Operation steps
Assume that the test conditions used by the user are as follows:
Frequency: 100kHz. Cp standard value: 11nF
D standard value: 0.0005
Press [Cal], the instrument will display the
Move the cursor to Load, the following soft keys will be displayed in the soft key zone: ON and
OFF.
Press ON to turn on the load correction function.
Move the cursor to Load Type, Ls-Rs, Ls-Q, Cp-D, will be displayed in the soft key area on the
right side of the screen.
Press Cp-D to select the Cp-D function.
Move the cursor to Freq zone, the following soft keys will be displayed in the soft key zone: ON,
OFF, OPEN, SHORT and LOAD.
Press ON to turn on the point-frequency correction function of the corresponding FREQ in current
correction point.
Input the correction frequency (100k), reference A (11nF), reference B (0.0005)
Move the cursor to FREQ. The following soft keys will be displayed: ON, OFF, OPEN, SHORT
and LOAD.
Hold the test fixture be in open status and keep user’s hands or other interference source be far away
from the test fixture. Press the soft key OPEN to execute open correction.
Insert the short plate (TH26010) into the test fixture. Please ensure that the short plate and the reeds
of the test fixture have good contact.
Press the soft key SHORT to execute short correction.
Insert a standard capacitance into the test fixture. Please ensure that the pins of the standard
capacitance have good connection with the reeds of the test fixture.
Press the soft key LOAD to execute load correction.
5.6.2 Note
a) Because of the different software editions, the soft keys and status
information may be different form this book, but it may not affect users’
understanding.
b) The load correction is only valid for the components with the same
specification. If the specification is changed, it is required to redo load
correction.
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Chapter 6 Transformer Single-machine Test
6.1 Circuit for transformer single-machine test
6.1.1 Some parameters of transformer
R C
C
R
1
1
C
2
2
6.1.2 Transformer single test circuit and TURN test
SEC+
TH2818
U
1
On TH2840X, TURN test has 4 display modes:
Ns: Np Np: Ns
=U2/U1 =U1/U2
Ns Np
= NpU2/U1 =NsU1/U2
The above U1 and U2 are the values automatically measured by the instrument, and the values of
Np and Ns need to be set by the user in advance on the corresponding turns ratio parameters on the
< Single Setup> page.It is recommended that users put the winding group with more turns in primary winding rate, the
reasons are as follows:
61
TH2818
L
1
6.1.4 Capacitance test between windings of transformer
SEC+ TH2818
L
1
62
SEC-
6.2
Press the shortcut key [Home] to enter the function selection interface, as
shown in Figure 6-1-1.
Figure 6-1-1 Single Setup Move the cursor to the Single Setup area or directly
touch the single group setting area to enter the
6.2.1 Trigger
See the trigger description in the LCR measurement setup chapter.
6.2.2 Speed
See the speed description in the LCR measurement setup chapter.
6.2.3 Test Mode
Move the cursor to Test Mode, the soft key zone will display Seq and Step.
Press Seq, the Test Mode zone will display Seq which means the instrument is
in single trigger mode, trigger once, the instrument will sweep the
transformer parameter for a circle. Press Step, the Test Mode zone will
displays Step which means the instrument is in single trigger mode, trigger
once, the instrument will sweep the transformer parameter for one time.
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6.2.4 Rsou
Move the cursor to the Rsou field, and the menu area on the right side of the
screen will display: 100 and 30 . Click the “100 ” area, the internal
resistance area will display “100 “, which means the output impedance of the
instrument is 100 , click the “30” area, the internal resistance area will
display “30 “, which means the output impedance of the instrument is 30 .
Please refer to the detailed introduction of output impedance.
6.2.5 Bias Source
Move the cursor to the bias source area, and the menu area on the right side
of the screen will display: 100mA (40V), 2A. Click on the “100mA(40V)” area,
the bias source area will display “100mA(40V)”, indicating that the 100